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JTAG (Joint Test Action Group) connection control device and veneer

A technology of connection control and single board, applied in the field of communication, can solve problems such as reducing test accuracy, and achieve the effect of improving accuracy

Inactive Publication Date: 2013-01-02
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method may affect the quality of the signal, the test clock frequency, etc., thereby reducing the accuracy of the test

Method used

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  • JTAG (Joint Test Action Group) connection control device and veneer
  • JTAG (Joint Test Action Group) connection control device and veneer
  • JTAG (Joint Test Action Group) connection control device and veneer

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Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0029] First, the JTAG connection control device of the embodiment of the present invention is described, figure 2 Shown is a schematic structural diagram of the JTAG connection control device provided by the embodiment of the present invention, which mainly includes the following three functional modules: a path selection module 210 , a master control module 220 , and a slave control module 230 .

[0030] The channel selection module 210 is configured to sel...

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Abstract

The embodiment of the invention discloses a JTAG connection control device and a veneer. The JTAG connection control device comprises a path selection module, a master control module and a slave control module, wherein the path selection module is used for selecting the working mode of the JTAG connection control device according to the configuration information of a path and connecting at least one JTAG chain in series into a big JTAG chain; under a master mode, the master control module receives JTAG data; the path selection module provides connection of the master control module and the big JTAG chain to meet the application demands of on-line programming, data updating and the like. Under a slave mode, the slave control module receives JTAG signals, and the path selection module provides connection of the slave control module and the big JTAG chain to meet the test demands of the one board. Compared with the prior art, due to the fact that an additional through connection mode is not needed, the accuracy of the test can be improved.

Description

technical field [0001] The invention relates to the field of communication technology, in particular to a JTAG connection control device and a single board. Background technique [0002] JTAG (Joint Test Action Group, Joint Test Action Group) is an international standard test protocol. JTAG technology was first proposed to solve the problem of testing highly complex and highly integrated chips or single boards. With the development of technology, JTAG It is also widely used in online programming and data upgrading of single-board devices. [0003] JTAG technology allows multiple devices to be connected in series through the JTAG interface to form a JTAG chain, so as to test or write data to each device separately. As the complexity of board design increases, there may be multiple JTAG chains on a single board, and multiple JTAG chains are connected to a device management module in parallel, such as figure 1 110 shown in is the device management module on the board. The de...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3185
Inventor 吴兴刚霍红伟
Owner HUAWEI TECH CO LTD