Device for temperature test

Abstract

The invention belongs to a device for a temperature test. The device for the temperature test comprises a temperature control platform, an intelligent temperature adjuster and a constant temperature circulator, wherein the temperature control platform consists of a cold plate, a thermoelectric cooling component with an upward cold surface and a water jacket from top to bottom; a ceramic heater isadhered to the cold surface in contact with the thermoelectric cooling component; and a temperature measurer is arranged in the cold plate. The device greatly expands the working temperature range byusing a high-power thermoelectric cooler and controls the PTC ceramic heater to perform temperature compensation by using the AI-708P program type intelligent temperature adjuster to realize high-accuracy automatic temperature control; by using the HX-1050 type constant temperature circulator, the device keeps the temperature range of circulating liquid within a range of between -10 and 50 DEG C;and thus the device meets the requirement on heat dissipation, reduces the energy consumption of the test, lowers the using cost and is suitable for tests such as high temperature storage, low temperature storage, high and low temperature circulation, high temperature aging and the like of low-power photoelectric products such as passive optical fiber devices, watt-level power consumption photoelectric devices, integrated components and the like.

Description

technical field [0001] The invention belongs to the technical field of thermoelectric application, in particular to a device for temperature test. Background technique [0002] With the rapid rise and maturity of optical fiber communication technology, low-power optoelectronic products such as passive optical fiber devices, optoelectronic devices with watt-level power consumption, and integrated optical fiber optoelectronic components have been widely used in high-tech fields such as space. Usually, the above-mentioned products have to go through tests of -60°C-100°C high temperature storage, low temperature storage, high and low temperature cycle and high temperature aging for reliability screening and verification before use. [0003] At present, the reliability screening and verification of low-power optoelectronic products such as the above-mentioned passive optical fiber devices, watt-level power consumption optoelectronic devices, and integrated optical fiber optoelect...

AI Technical Summary

Problems solved by technology

[0003] At present, the reliability screening and verification of low-power optoelectronic products such as the above-mentioned passive optical fiber devices, watt-level power consumption optoelectronic devices, and integrated optical fiber optoelectronic components, mostly use high-low temperature chambers or temperature cycle test chambers for high-temperature, low-temperature storage, and high-low temperature cycles. and high-temperature aging tests, these devices not only have low temperature control accuracy, but also have a small operating temperature range, and have a large volume and power consumption

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