High-vacuum pinpoint enhanced Raman device

A tip-enhanced Raman and high-vacuum technology, used in measurement devices, Raman scattering, scanning probe technology, etc.

Active Publication Date: 2012-07-25
INST OF PHYSICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the existing TERS devices are basically devices under the atmosphere, and it is difficult for such devices to take advantage of SPM, especially the scanning tunneling microscope (STM).
However, in the TERS device of a vacuum device currently available in the world, only the characterization part is in vacuum, and the sample preparation part is still carried out in the atmospheric environment.
This severely limits the functionality of this new device

Method used

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  • High-vacuum pinpoint enhanced Raman device
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Embodiment Construction

[0018] Such as figure 1 As shown, the device includes three main parts, namely the analysis chamber 1, the sample preparation chamber 2 and the sample injection chamber 3. The three are connected by the sample injection channel 4. In the working state, the entire device is in a vacuum state. The analysis room 1 is the core part of this device, and is the joint part of scanning tunneling microscope STM and Raman detection. Such as figure 2 , 3 As shown, a set of scanning tunnel microscope STM device 5 is installed in the analysis room. The STM device 5 has a horizontal resolution of 0.1 nanometers and a longitudinal resolution of 0.01 nanometers. The needle tip is on the central axis of the STM cavity. The Raman detection front stage 6 is arranged on a three-dimensional mobile platform 7 that can move three-dimensionally. The front end of the Raman detection front stage 6 is provided with a first flange 13 which is connected to the second method of the bellows 23. The flange ...

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Abstract

The invention relates to a high-vacuum pinpoint enhanced Raman device comprising an analysis room, a preparation room, a sampling room, a scanning tunnel microscope (STM) and a Raman detection preceding stage, wherein the scanning tunnel microscope is arranged in the analysis room and is connected with the Raman detection preceding stage; the analysis room, the preparation room and the sampling room are connected through sampling channels; the Raman detection preceding stage is arranged on a three-dimensional mobile platform which can move in a three-dimensional mode; an STM objective lens isarranged in an analysis cavity and is connected with a flange of a corrugated pipe connected with the Raman detection preceding stage through a collimating metal pipe; and Raman detection light pathsare focused on the point of a pinpoint by the Raman detection preceding stage, the collimating metal pipe and the STM objective lens. Because the corrugated pipe is arranged in the light path, the position relation between a Raman light path and an STM device pinpoint can be regulated in a three-dimensional space by moving the three-dimensional mobile platform in order to focus lasers on the pinpoint in a Raman detecting instrument without influencing the light paths.

Description

technical field [0001] The invention relates to a high-vacuum needle-tip enhanced Raman device. Background technique [0002] The invention of Scanning Probe Microscopy (SPM) has allowed us to characterize sample surface features at the atomic scale. Electron tunneling spectroscopy based on this can also be used to characterize the chemical structure and other characteristics of molecules, but its implementation requires strict conditions, such as low temperature. The Raman spectrum of a molecule is unique to different molecules, so it can be used to characterize the chemical structure and other characteristics of the molecule. However, due to its very small scattering cross section, it is difficult to detect Raman signals at the nanoscale and single-molecule level. Surface-enhanced Raman scattering (SERS) based on surface plasmons allows us to detect Raman signals at the single-molecule level, but traditional SERS cannot precisely locate molecules. The tip-enhanced Raman...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/65G01N21/01G01Q60/10
Inventor 方蔚瑞杨威生方胜徐红星
Owner INST OF PHYSICS - CHINESE ACAD OF SCI
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