11 results about "Scanning tunnel microscopy" patented technology

The first aspect of the technical scheme of the present application discloses a scanning tunneling microscope image surface species tracking method based on a visual large model. The second aspect of the present application discloses an automatic tracking system for implementing the above scanning tunneling microscope image surface species tracking method, comprising an image input module, a large model reasoning module, a data analysis module and a result output module. Compared with the prior art, the present application has the beneficial effects of high automation and intelligence, high precision and quantification, strong robustness, excellent practicability and the like.

The application discloses an in-situ transmission electron microscope sample rod integrated with a scanning tunneling microscope and a detection method, and belongs to the technical field of electron microscopes. The sample rod comprises a sample rod body, an axial STM probe assembly integrated with the sample rod head, a front-end rotatable sample support and a linear-rotation conversion driving mechanism. The linear-rotation conversion driving mechanism converts axial linear motion into angular displacement, and drives the rotatable sample support to be in-situ flipped by 90 DEG between a horizontal TEM mode and a vertical STM mode. In the STM mode, the sample surface is parallel to the electron beam and opposite to the STM probe tip, and at the same time, an automatic electrical contact assembly is closed to realize reliable grounding of the sample. The application effectively solves the problems of geometric visual angle conflict, electron beam scattering interference and unstable grounding existing in the traditional combined technology, and realizes lossless, high signal-to-noise ratio in-situ switching of transmission imaging and tunneling current analysis in a vacuum environment.

The invention belongs to the technical field of scanning tunneling microscopes, and particularly relates to a scanning tunneling microscope with an imaging unit perpendicular to a driving unit and an imaging method. The microscope body comprises an outer frame, an imaging unit and a driving unit, the fixed end of the driving unit is fixedly arranged on the outer frame, and the imaging unit is arranged at the free end of the driving unit; the length direction of the imaging unit is perpendicular to the length direction of the driving unit in the initial state. A sample of which the surface is vertical to the length direction of the imaging unit is fixedly arranged on the outer frame; the sample surface is parallel to the magnetic field direction; the free end of the driving unit stretches out, draws back and bends in an XYZ three-dimensional plane, and drives the imaging unit to perform needle insertion, needle withdrawal or scanning imaging relative to a sample; the initial state means that the free end of the piezoelectric body is free of bending and displacement in any direction and contracts to the shortest length. According to the invention, the electronic state property of the sample under the condition that the magnetic field direction is parallel to the surface of the sample can be observed in a narrow superconducting magnet space.

This utility model discloses a lifting and adjusting device for a specimen in a scanning tunneling microscope, including a support frame, a pulley system, a suspension rope, a winding and unwinding mechanism, a lifting mechanism, and a guide mechanism. The winding and unwinding mechanism includes a mounting base, a rotating shaft for winding the suspension rope and rotatable about its own axis, which passes through the mounting base. The rotating shaft can also slide along its axial direction within the mounting base. The winding and unwinding mechanism also includes a first meshing tooth on the rotating shaft, a second meshing tooth in the mounting base, a first elastic element, and a driving element for engaging one end of the rotating shaft to compress the first elastic element and drive the rotating shaft to rotate. The first elastic element provides an elastic restoring force to drive the rotating shaft to move and reset along its axial direction, so that the first and second meshing teeth mesh with each other. This utility model's lifting and adjusting device for a specimen in a scanning tunneling microscope allows for a large stroke of the specimen while maintaining relatively low cost and preventing lifting and unwinding jams.

The invention relates to the technical field of scanning tunneling microscopes, and discloses a scanning probe measuring device and a control method for pinpoint-to-pinpoint imaging, two pinpoints are oppositely arranged, and the pinpoints are accurately controlled and movably positioned based on a basic working mode of a scanning probe microscope. A needle tip-tunnel junction-needle tip working structure is established, after bias voltage is applied externally, electron tunneling between needle tips only relates to a small number of atoms or single atoms at the tail ends of the needle tips, the tunneling effect that the small number of atoms contribute to electrons is achieved, and therefore small number or single atom imaging is achieved. The device can be rapidly transplanted to application scenes of low temperature, strong magnetic field, optical measurement and the like, the double-needle-point structure is regulated and controlled through piezoelectric displacement or an electric field, tunnel junction width and barrier height can be optimized in real time, and research on dynamic construction and dynamic electrical characteristics of nanoscale tunnel junctions is greatly facilitated.

1. The name of the design product: needle tip replacement rack for scanning tunneling microscope. 2. The use of the design product: the design product is used for needle tip replacement and storage of scanning tunneling microscope. The design product is used for scanning tunneling microscope (STM), which belongs to the field of scientific instruments and is mainly used for needle tip replacement, storage and installation auxiliary operation in scientific research laboratories or teaching experimental environment. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.

The present invention relates to a sample holder for scanning tunnelling microscopes (STM), especially designed for PAN models, with a rail-based system that allows the sample holder to be quickly and easily removed without having to disassemble the microscope. The sample holder comprises a base (7) with a cut-out having a series of rails (7.1) and a panel (8) that can be removed via the rails (7.1). The panel (8) comprises a plate (11.2) having, on one face thereof, a protrusion (11.4), a through hole (8.1) on one side of the protrusion (11.4) and a tab (11.3) on the opposite side. The protrusion (11.4) comprises a frame (11.1) to hold the sample. The protrusion (11.4) may comprise a central hole (12.2) and a latch (12.1) inside the central hole (12.2). Alternatively, the protrusion (11.4) can also rotate on the plate (11.2).

The application discloses a scanning tunnel microscope device for realizing electron spin resonance detection and relates to the technical field of microscopes. The scanning tunnel microscope device for realizing electron spin resonance detection comprises a base, a needle tip arranged on the base, the needle tip being configured to run and generate a tunneling current with a sample on the base, a microwave excitation component, the microwave excitation component comprising an antenna and a microwave signal generation and modulation structure, the antenna being arranged on the base, and the microwave signal generation and modulation structure being configured to transmit microwave signals to the antenna and / or the needle tip, and a magnet component arranged on the side of the base away from the needle tip. The microwave radiation direction of the antenna is towards the needle tip. The technical scheme of the application is characterized in that the antenna is arranged on one side of the base, and the microwave signal generation and modulation structure is configured to inject microwave signals to the antenna and / or the needle tip, so as to improve the microwave excitation efficiency and frequency coverage capability and significantly improve the stability of the spin resonance signal and the system adaptability.

The utility model discloses a horizontal scanning tunnel microscope structure used at normal temperature and normal pressure, comprising a scanning assembly and a controller, the scanning assembly and the controller are connected through a plug-in type connecting line, the scanning assembly comprises a damping mounting seat, the surface of the damping mounting seat is provided with a positioning mounting groove, the positioning mounting groove is internally provided with a fixing seat, and the fixing seat is provided with a through hole. A scanning head is arranged on the fixing seat and fixed through a bridge connector, a front connecting plate and a rear tail supporting block are arranged at the two ends, in the axial direction of the scanning head, of the fixing seat respectively, the front connecting plate and the rear tail supporting block are matched to limit the position of the scanning head in the axial direction, a micrometer head is installed on the rear tail supporting block, and the micrometer head is connected with a moving part in the scanning head. The front connecting plate is fixedly connected with the outer shell of the scanning head through a plurality of studs; and the plurality of studs are also connected with the sample holder. The utility model has the advantages of simple structure, large integral structure rigidity after assembly, improved scanning effect, small electromagnetic interference and strong expansibility.

The invention belongs to the technical field of supramolecular structure chemistry, and provides an innovative method for regulating and controlling a molecular assembly structure on a metal surface through alkali metal salt. The method comprises the following steps: in an ultra-vacuum environment, depositing terpyridyl tricarboxylic acid (2, 2 ': 6', 2 ''-Terpyridine-4, 4 ', 4' '-tricarboxylic acid, TATP) molecules on the surface of a metal single crystal by adopting a thermal evaporation technology; and then, alkali metal salt is deposited on the surface of the metal single crystal, and through further annealing treatment, the alkali metal salt generates electrostatic interaction with the organic molecules on the metal surface, so that the controllable regulation and control of the TATP molecular assembly structure are realized. The structure realizes atomic-scale resolution characterization through a low-temperature scanning tunneling microscope (LT-STM), shows ordered arrangement and intermolecular interaction characteristics different from those when alkali metal salt is not introduced, and has good structural stability and functionalization potential.

The application discloses a kind of full same chromium atomic cluster and its self-assembly method and application, comprising the following steps: preparation Cr x NbSe2 Single crystal;Fix the single crystal to the sample holder, and fix the ceramic rod on the surface of the single crystal far from the sample holder on one side, place the assembled sample in an ultrahigh vacuum cavity, and impact the ceramic rod by external force to realize sample cleavage, then transfer the cleaved sample in situ to the scanning tunneling microscope cavity, and perform temperature reduction and surface morphology characterization. The application successfully realizes the self-assembly of large-area chromium atomic clusters by using single crystal cleavage technology, the cluster size is consistent and uniformly distributed, has extremely high chemical and structural stability, and the sample size can reach centimeter level, which lays a foundation for the application of magnetic atomic clusters in new generation semiconductor devices.