23 results about "Scanning tunnel microscopy" patented technology

The invention discloses a method for growing phosphorene on a non-metal substrate, which is characterized in that a molecular beam epitaxy technology is adopted, indium phosphide is used as a precursor in a high vacuum environment, phosphorene is grown on an epitaxial growth silicon substrate, and the precise control on the phosphorene growth process is realized. The method comprises the following steps: depositing a gold layer on the surface of freshly stripped mica, and carrying out ion cleaning and annealing treatment to obtain a clean Au (111) surface; growing a silicon layer on the surface of the processed Au (111) by taking monocrystalline silicon as a silicon source under an ultrahigh vacuum condition; growing a phosphorus layer on the Au (111) substrate on which the silicon layer is deposited by taking indium phosphide crystals as a phosphorus source under an ultrahigh vacuum condition; and carrying out annealing treatment on the obtained sample, and analyzing and characterizing the sample through Auger electron spectroscopy and a scanning tunneling microscope. The method can effectively break through the limitation that phosphorene is difficult to prepare under the condition of a non-metal substrate in the existing preparation means, and is expected to promote the application of phosphorene in the field of electronic devices.

The present invention discloses a terahertz (THz) near-field fluorescence signal analysis system based on a scanning tunneling microscope (STM). The system comprises a THz radiation system, a THz transmission-characterization-modulation system, a THz coupling and fluorescence collection system, and a THz fluorescence data analysis system, all connected in sequence. The present invention enhances the ability to control THz characteristics such as polarity, carrier phase, polarization direction, intensity, and operating mode, and performs autocorrelation splitting and combining of THz beams, as well as measurement of far-field THz time-domain waveforms. By adopting a structure of a symmetrical plane mirror and an off-axis parabolic mirror that moves with the needle tip, THz can be conveniently coupled to the vicinity of the STM needle tip, and the THz incident direction can be planned in a two-dimensional plane, avoiding complex analysis in three-dimensional space. The fluorescence collection efficiency is significantly increased by designing an independent fluorescence collection structure. LABVIEW software is used to achieve synchronous analysis of THz near-field fluorescence signal measurement and STM operating system, expanding the research capabilities of THz near-field fluorescence phenomena.

The first aspect of the technical scheme of the present application discloses a scanning tunneling microscope image surface species tracking method based on a visual large model. The second aspect of the present application discloses an automatic tracking system for implementing the above scanning tunneling microscope image surface species tracking method, comprising an image input module, a large model reasoning module, a data analysis module and a result output module. Compared with the prior art, the present application has the beneficial effects of high automation and intelligence, high precision and quantification, strong robustness, excellent practicability and the like.

The utility model discloses a low temperature scanning tunnel microscope separating type sample support capable of rapidly replacing samples, comprising a first mother support, a second mother support and a son support, the surface of the first mother support is provided with a boss, the boss is used for fixing a to-be-tested sample, the second mother support is provided with a heating zone, the surface of the son support is used for fixing a standard sample, and the boss is used for fixing the to-be-tested sample. The surface of the first mother support and the surface of the second mother support are each provided with a screw used for fixing the son support, the first mother support, the second mother support and the son support are each provided with an extended grabbing arm, the extended grabbing arms are provided with mechanical arms, and the mechanical arms are used for transferring the son supports on the surfaces of the first mother support and the second mother support. The utility model has the advantages of high use efficiency, effective reduction of thermal drift, and more accurate imaging.

The application discloses an in-situ transmission electron microscope sample rod integrated with a scanning tunneling microscope and a detection method, and belongs to the technical field of electron microscopes. The sample rod comprises a sample rod body, an axial STM probe assembly integrated with the sample rod head, a front-end rotatable sample support and a linear-rotation conversion driving mechanism. The linear-rotation conversion driving mechanism converts axial linear motion into angular displacement, and drives the rotatable sample support to be in-situ flipped by 90 DEG between a horizontal TEM mode and a vertical STM mode. In the STM mode, the sample surface is parallel to the electron beam and opposite to the STM probe tip, and at the same time, an automatic electrical contact assembly is closed to realize reliable grounding of the sample. The application effectively solves the problems of geometric visual angle conflict, electron beam scattering interference and unstable grounding existing in the traditional combined technology, and realizes lossless, high signal-to-noise ratio in-situ switching of transmission imaging and tunneling current analysis in a vacuum environment.

The invention belongs to the technical field of scanning tunneling microscopes, and particularly relates to a scanning tunneling microscope with an imaging unit perpendicular to a driving unit and an imaging method. The microscope body comprises an outer frame, an imaging unit and a driving unit, the fixed end of the driving unit is fixedly arranged on the outer frame, and the imaging unit is arranged at the free end of the driving unit; the length direction of the imaging unit is perpendicular to the length direction of the driving unit in the initial state. A sample of which the surface is vertical to the length direction of the imaging unit is fixedly arranged on the outer frame; the sample surface is parallel to the magnetic field direction; the free end of the driving unit stretches out, draws back and bends in an XYZ three-dimensional plane, and drives the imaging unit to perform needle insertion, needle withdrawal or scanning imaging relative to a sample; the initial state means that the free end of the piezoelectric body is free of bending and displacement in any direction and contracts to the shortest length. According to the invention, the electronic state property of the sample under the condition that the magnetic field direction is parallel to the surface of the sample can be observed in a narrow superconducting magnet space.

The invention discloses an optical coupling scanning tunneling microscope with a magnetic field, which comprises an annular superconducting magnet, a mounting frame arranged in the superconducting magnet, a sample groove, a needle point groove, a scanning assembly, a first driving mechanism, a second driving mechanism and a light source assembly arranged below the mounting frame, wherein the sample groove, the needle point groove, the scanning assembly, the first driving mechanism and the second driving mechanism are arranged in the mounting frame; the light source assembly is located below the superconducting magnet, and a light path of emergent light of the light source assembly is located in a center hole of the superconducting magnet at the corresponding height. The needle point groove is provided with a first hole for light rays to penetrate upwards. The scanning assembly comprises a conical tube, a cylindrical tube and a mounting seat which are sequentially connected from top to bottom; the cylindrical tube is located on the inner side of the light path, a second hole for light rays to penetrate upwards is formed in the installation base, the conical tube expands in a conical mode from top to bottom, and a tangent plane for giving way to the light path is arranged on the outer side face of the conical tube. The optical coupling scanning tunneling microscope with the magnetic field can be compatible with an optical coupling structure and a high-intensity magnetic field structure at the same time, and is simple in structure and wide in application range.

This utility model discloses a lifting and adjusting device for a specimen in a scanning tunneling microscope, including a support frame, a pulley system, a suspension rope, a winding and unwinding mechanism, a lifting mechanism, and a guide mechanism. The winding and unwinding mechanism includes a mounting base, a rotating shaft for winding the suspension rope and rotatable about its own axis, which passes through the mounting base. The rotating shaft can also slide along its axial direction within the mounting base. The winding and unwinding mechanism also includes a first meshing tooth on the rotating shaft, a second meshing tooth in the mounting base, a first elastic element, and a driving element for engaging one end of the rotating shaft to compress the first elastic element and drive the rotating shaft to rotate. The first elastic element provides an elastic restoring force to drive the rotating shaft to move and reset along its axial direction, so that the first and second meshing teeth mesh with each other. This utility model's lifting and adjusting device for a specimen in a scanning tunneling microscope allows for a large stroke of the specimen while maintaining relatively low cost and preventing lifting and unwinding jams.

The invention relates to the field of microscopes, and discloses a dual-piezoelectric sliding table control method, a dual-piezoelectric sliding table control circuit and a dual-piezoelectric sliding table. The double-piezoelectric sliding table comprises a base, a sliding block arranged on the base, a first magnetic attraction piece, a second magnetic attraction piece, a first piezoelectric part and a second piezoelectric part. The first magnetic attraction piece and the second magnetic attraction piece are magnetically attracted to the two opposite sides of the sliding block respectively. One end of the first piezoelectric part is fixed with the first magnetic part, the other end is fixed on the substrate, one end of the second piezoelectric part is fixed with the second magnetic part, and the other end is fixed on the substrate; the first piezoelectric part and the second piezoelectric part are used for extending or contracting in the sliding direction of the sliding block along with the change of the driving voltage, and the first piezoelectric part and the second piezoelectric part drive the sliding block to move in the sliding direction when extending and / or contracting. The technical problem of low accuracy and stability of probe driving in the scanning tunneling microscope in the prior art is solved.

The invention relates to the technical field of scanning tunneling microscopes, and discloses a scanning probe measuring device and a control method for pinpoint-to-pinpoint imaging, two pinpoints are oppositely arranged, and the pinpoints are accurately controlled and movably positioned based on a basic working mode of a scanning probe microscope. A needle tip-tunnel junction-needle tip working structure is established, after bias voltage is applied externally, electron tunneling between needle tips only relates to a small number of atoms or single atoms at the tail ends of the needle tips, the tunneling effect that the small number of atoms contribute to electrons is achieved, and therefore small number or single atom imaging is achieved. The device can be rapidly transplanted to application scenes of low temperature, strong magnetic field, optical measurement and the like, the double-needle-point structure is regulated and controlled through piezoelectric displacement or an electric field, tunnel junction width and barrier height can be optimized in real time, and research on dynamic construction and dynamic electrical characteristics of nanoscale tunnel junctions is greatly facilitated.

A method for autonomously applying a dangling bond pattern to a substrate for atom scale device fabrication includes inputting the pattern, initiating a patterning process, scanning the substrate using a scanning probe microscope (SPM) to generate an SPM image of the substrate, feeding the SPM image into a trained convolution neural network (CNN), analyzing the SPM image using the CNN to identify substrate defects, determining a defect free substrate area for pattern application; and applying the pattern to the substrate in that area. An atom scale electronic component includes functional patches on a substrate and wires electrically connecting the functional patches. Training a CNN includes recording a Scanning Tunneling Microscope (STM) image of the substrate, extracting images of defects from the STM image, labeling pixel-wise the defect images, and feeding the extracted and labeled images of defects into a CNN to train the CNN for semantic segmentation.

The invention provides a cavity external optical coupling system applied to an ultrahigh vacuum cavity of a scanning tunneling microscope. A femtosecond laser generates femtosecond pulse light; the first beam splitter splits the femtosecond pulse light to obtain a first light beam and a first residual light beam; the second beam splitter splits the first residual light beam into a second light beam and a second residual light beam; the third beam splitter splits the second residual light beam into a third light beam and a fourth light beam; the first light path module is used for processing the first light beam as first sampling light; the second light path module is used for processing the second light beam; the third light path module is used for processing the third light beam as second sampling light; the terahertz generation module is used for generating terahertz pulses according to the second light beam and the fourth light beam; the first parabolic mirror unit is used for focusing terahertz pulses to the electro-optical crystal; the electro-optical crystal is used for detecting THz light; the second parabolic mirror unit is used for focusing and emitting the terahertz pulse; and the gold reflector is used for guiding the terahertz pulse to the tunnel junction of the scanning tunneling microscope.

1. The name of the design product: needle tip replacement rack for scanning tunneling microscope. 2. The use of the design product: the design product is used for needle tip replacement and storage of scanning tunneling microscope. The design product is used for scanning tunneling microscope (STM), which belongs to the field of scientific instruments and is mainly used for needle tip replacement, storage and installation auxiliary operation in scientific research laboratories or teaching experimental environment. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.

The present invention relates to a sample holder for scanning tunnelling microscopes (STM), especially designed for PAN models, with a rail-based system that allows the sample holder to be quickly and easily removed without having to disassemble the microscope. The sample holder comprises a base (7) with a cut-out having a series of rails (7.1) and a panel (8) that can be removed via the rails (7.1). The panel (8) comprises a plate (11.2) having, on one face thereof, a protrusion (11.4), a through hole (8.1) on one side of the protrusion (11.4) and a tab (11.3) on the opposite side. The protrusion (11.4) comprises a frame (11.1) to hold the sample. The protrusion (11.4) may comprise a central hole (12.2) and a latch (12.1) inside the central hole (12.2). Alternatively, the protrusion (11.4) can also rotate on the plate (11.2).

The application discloses a scanning tunnel microscope device for realizing electron spin resonance detection and relates to the technical field of microscopes. The scanning tunnel microscope device for realizing electron spin resonance detection comprises a base, a needle tip arranged on the base, the needle tip being configured to run and generate a tunneling current with a sample on the base, a microwave excitation component, the microwave excitation component comprising an antenna and a microwave signal generation and modulation structure, the antenna being arranged on the base, and the microwave signal generation and modulation structure being configured to transmit microwave signals to the antenna and / or the needle tip, and a magnet component arranged on the side of the base away from the needle tip. The microwave radiation direction of the antenna is towards the needle tip. The technical scheme of the application is characterized in that the antenna is arranged on one side of the base, and the microwave signal generation and modulation structure is configured to inject microwave signals to the antenna and / or the needle tip, so as to improve the microwave excitation efficiency and frequency coverage capability and significantly improve the stability of the spin resonance signal and the system adaptability.

The application discloses a novel single-molecule cleavage junction technology measuring device with a large-angle open space, a needle tip moving part is fixed on an optical platform through a displacement table, a transmission mechanism is arranged on the displacement table, a displacement sliding block is connected to the transmission mechanism, and a right-angle adapter structural member is fixedly installed on the front face of the displacement sliding block; a piezoelectric ceramic is arranged below the distal end of the right-angle adapter structural member, a shielding ring is sleeved with the piezoelectric ceramic, a needle cylinder is fixedly installed at the bottom of the piezoelectric ceramic, the needle cylinder is used for fixing a needle tip and leading out a needle tip signal, and a bottom disc is arranged below the front side of the displacement table. The application aims to make an architectural improvement on a cleavage junction technology based on a scanning tunneling microscope, so that the cleavage junction technology has an open space to accommodate the incidence and measurement of light and does not affect the stability of electrical measurement of the instrument itself, so that the instrument is fast in operation, convenient in sample preparation, and has the ability of optical regulation and spectroscopy measurement.

The utility model discloses a horizontal scanning tunnel microscope structure used at normal temperature and normal pressure, comprising a scanning assembly and a controller, the scanning assembly and the controller are connected through a plug-in type connecting line, the scanning assembly comprises a damping mounting seat, the surface of the damping mounting seat is provided with a positioning mounting groove, the positioning mounting groove is internally provided with a fixing seat, and the fixing seat is provided with a through hole. A scanning head is arranged on the fixing seat and fixed through a bridge connector, a front connecting plate and a rear tail supporting block are arranged at the two ends, in the axial direction of the scanning head, of the fixing seat respectively, the front connecting plate and the rear tail supporting block are matched to limit the position of the scanning head in the axial direction, a micrometer head is installed on the rear tail supporting block, and the micrometer head is connected with a moving part in the scanning head. The front connecting plate is fixedly connected with the outer shell of the scanning head through a plurality of studs; and the plurality of studs are also connected with the sample holder. The utility model has the advantages of simple structure, large integral structure rigidity after assembly, improved scanning effect, small electromagnetic interference and strong expansibility.

The invention belongs to the technical field of supramolecular structure chemistry, and provides an innovative method for regulating and controlling a molecular assembly structure on a metal surface through alkali metal salt. The method comprises the following steps: in an ultra-vacuum environment, depositing terpyridyl tricarboxylic acid (2, 2 ': 6', 2 ''-Terpyridine-4, 4 ', 4' '-tricarboxylic acid, TATP) molecules on the surface of a metal single crystal by adopting a thermal evaporation technology; and then, alkali metal salt is deposited on the surface of the metal single crystal, and through further annealing treatment, the alkali metal salt generates electrostatic interaction with the organic molecules on the metal surface, so that the controllable regulation and control of the TATP molecular assembly structure are realized. The structure realizes atomic-scale resolution characterization through a low-temperature scanning tunneling microscope (LT-STM), shows ordered arrangement and intermolecular interaction characteristics different from those when alkali metal salt is not introduced, and has good structural stability and functionalization potential.

The present invention relates to the field of electronic science and technology, and in particular to a drive circuit for improving the displacement control accuracy of a scanning tunneling microscope, comprising a main control unit, a drive waveform generating circuit, and a drive waveform shaping circuit; the main control unit is connected to the drive waveform generating circuit to output a drive waveform to a piezoelectric ceramic block; the main control unit is connected to the drive waveform shaping circuit to shape the drive waveform output to the piezoelectric ceramic block; the drive waveform shaping circuit comprises a first drive waveform shaping circuit and a second drive waveform shaping circuit. The present invention outputs a drive waveform through the drive waveform generating circuit and shapes the output drive waveform using the drive waveform shaping circuit, wherein the first drive waveform shaping circuit is used to control the enabling of the falling edge of the drive waveform, and the second drive waveform shaping circuit is used to control the enabling of the rising edge of the drive waveform, to ensure that the output drive waveform meets the requirements of the piezoelectric ceramic block, thereby making the displacement control of the piezoelectric ceramic more precise.

The application provides a three-dimensional integrated quantum chip and a preparation method thereof, metal marks for positioning are prepared on the surface of an epitaxial growth layer of a scanning tunneling microscope hydrogen mask direct writing precision device after packaging; the metal marks are scanned by a scanning probe microscope, and three-dimensional precise positioning of the device is realized; after a gate oxide layer is grown, field overlay is written on the gate oxide layer by using the positioning effect of the metal marks, and a top electrode, a multilayer stacked electrode or a through-silicon via three-dimensional electrode is prepared. The preparation method described in the embodiment realizes high-precision three-dimensional integrated processing by using a scanning probe microscope, and provides important technical support for silicon-based semiconductor quantum computing, quantum simulation and quantum chips.

Scanning probe systems and control methods are disclosed in which probe-sample separation is dynamically regulated based on a derivative of a tunneling signal. In some cases, a modulation signal is applied to a control signal associated with an actuator configured to adjust a probe relative to a surface. A tunneling current induced between the probe and the surface is converted into a tunneling signal, from which a derivative signal is obtained based at least in part on the modulation. A feedback processor determines a control metric based on the derivative signal and adjusts the control signal to maintain the control metric substantially constant during scanning. In some implementations, the derivative signal is proportional to a natural logarithm of a transimpedance-scaled rate of change of tunneling current with respect to probe-surface separation. Multi-tip configurations and lock-in amplifier-based demodulation are also described. Some disclosed techniques facilitate enhanced probe control and topography imaging performance in scanning tunneling microscopy and related systems.

The present invention belongs to the technical field of scanning tunneling microscopes, and in particular relates to a scanning tunneling microscope with stable imaging and a scanning imaging method. A scanning tunneling microscope with stable imaging includes a mirror body, which includes an outer frame, a driving unit, a sliding unit, a sample holder, and a scanning unit. The outer frame is hollow inside, and the driving unit and the sample holder are respectively arranged at the two ends inside the outer frame. The sliding unit is arranged on the inner side wall of the outer frame. The scanning unit is fixedly arranged at one end of the sliding unit close to the sample holder. The driving unit drives the sliding unit to push the scanning unit to advance or withdraw the needle along the length direction of the outer frame. The present invention can improve the quality and stability of imaging and avoid the occurrence of needle collision as much as possible.

The application discloses a kind of full same chromium atomic cluster and its self-assembly method and application, comprising the following steps: preparation Cr x NbSe2 Single crystal;Fix the single crystal to the sample holder, and fix the ceramic rod on the surface of the single crystal far from the sample holder on one side, place the assembled sample in an ultrahigh vacuum cavity, and impact the ceramic rod by external force to realize sample cleavage, then transfer the cleaved sample in situ to the scanning tunneling microscope cavity, and perform temperature reduction and surface morphology characterization. The application successfully realizes the self-assembly of large-area chromium atomic clusters by using single crystal cleavage technology, the cluster size is consistent and uniformly distributed, has extremely high chemical and structural stability, and the sample size can reach centimeter level, which lays a foundation for the application of magnetic atomic clusters in new generation semiconductor devices.