36 results about "Scanning tunnel microscopy" patented technology

The invention relates to the technical field of scanning tunneling microscopes, and discloses a scanning probe measuring device and a control method for pinpoint-to-pinpoint imaging, two pinpoints are oppositely arranged, and the pinpoints are accurately controlled and movably positioned based on a basic working mode of a scanning probe microscope. A needle tip-tunnel junction-needle tip working structure is established, after bias voltage is applied externally, electron tunneling between needle tips only relates to a small number of atoms or single atoms at the tail ends of the needle tips, the tunneling effect that the small number of atoms contribute to electrons is achieved, and therefore small number or single atom imaging is achieved. The device can be rapidly transplanted to application scenes of low temperature, strong magnetic field, optical measurement and the like, the double-needle-point structure is regulated and controlled through piezoelectric displacement or an electric field, tunnel junction width and barrier height can be optimized in real time, and research on dynamic construction and dynamic electrical characteristics of nanoscale tunnel junctions is greatly facilitated.

The invention relates to a destructive quantum interference effect regulation and control method based on dihydrophenazine molecules, and belongs to the technical field of molecular electronics. Two nitrogen atoms are introduced into a central benzene ring of a traditional diphenylanthracene molecule to prepare a dihydrophenazine molecule, and a new electron transmission path is introduced while the good electron transmission characteristic of diphenylanthracene is reserved, so that the quantum interference effect is accurately controlled. On the basis of a scanning tunneling microscope split junction technology, conductivity testing is carried out on the molecule under different testing solvents, concentrations and voltages, and it is found that the conductivity value of the nitrogen atom introduced dihydrophenazine molecule is remarkably reduced. The core of the invention lies in that the interference on the electron wave function is realized through the elaborate design of the molecular structure, and the destructive quantum interference effect is effectively adjusted. The method not only provides a new possibility for regulation and control of the quantum interference effect, but also shows a wide application prospect in the fields of molecular electronic devices, such as molecular field effect transistors and molecular circuits.

The utility model provides a pinpoint holder and a scanning tunneling microscope, the pinpoint holder comprises a fixing frame, the fixing frame comprises an exposed surface and a first mounting surface which are opposite to each other, and a fixing piece and a bearing piece which sequentially extend between the exposed surface and the first mounting surface, the periphery of the bearing part extends to the outer side of the fixing part to form a mounting part, the side face, opposite to the first mounting face, of the mounting part is a second mounting face, and a needle hole extending towards the first mounting face is formed in the exposed face; the fastening piece is connected with the fixing frame, and the fastening piece is arranged to be suitable for moving in the needle hole in the radial direction of the needle hole; and a hard insulating member. According to the needle point support and the scanning tunneling microscope, the scanning probes of different specifications are inserted into the needle holes, and the fasteners are operated to move in the radial direction of the needle holes, so that the scanning probes in the needle holes are extruded and limited, and the scanning probes of different specifications are rapidly fixed.

The invention discloses a method for growing phosphorene on a non-metal substrate, which is characterized in that a molecular beam epitaxy technology is adopted, indium phosphide is used as a precursor in a high vacuum environment, phosphorene is grown on an epitaxial growth silicon substrate, and the precise control on the phosphorene growth process is realized. The method comprises the following steps: depositing a gold layer on the surface of freshly stripped mica, and carrying out ion cleaning and annealing treatment to obtain a clean Au (111) surface; growing a silicon layer on the surface of the processed Au (111) by taking monocrystalline silicon as a silicon source under an ultrahigh vacuum condition; growing a phosphorus layer on the Au (111) substrate on which the silicon layer is deposited by taking indium phosphide crystals as a phosphorus source under an ultrahigh vacuum condition; and carrying out annealing treatment on the obtained sample, and analyzing and characterizing the sample through Auger electron spectroscopy and a scanning tunneling microscope. The method can effectively break through the limitation that phosphorene is difficult to prepare under the condition of a non-metal substrate in the existing preparation means, and is expected to promote the application of phosphorene in the field of electronic devices.

The present invention discloses a scanning tunneling microscope control system based on ESP32, including a main control chip ESP32, a motor stepping module for controlling the movement of a scanning lens, a lens scanning module, a scanning signal acquisition module, a pressure module for applying voltage between a probe and a sample, and a communication module for communicating with a host computer. The main control chip ESP32 has an independently working dual-core system and comes with a scanning signal acquisition module and a communication module. The PWM output function of the main control chip ESP32 outputs different waveforms by changing the duty cycle, and then completes the DAC conversion to control the slow motor through a low-pass filter circuit; IIC communication or SPI communication external high-speed DAC to control the output of the waveform to control the fast motor. The invention replaces the existing scanning tunneling microscope control system, has low cost, small size, and fully utilizes the hardware resources of ESP32. At the same time, the chips used in the main control chip ESP32 and its accompanying filter circuit and amplifier circuit are all domestic chips, avoiding the dilemma of chip dependence on imports.

The present invention discloses a terahertz (THz) near-field fluorescence signal analysis system based on a scanning tunneling microscope (STM). The system comprises a THz radiation system, a THz transmission-characterization-modulation system, a THz coupling and fluorescence collection system, and a THz fluorescence data analysis system, all connected in sequence. The present invention enhances the ability to control THz characteristics such as polarity, carrier phase, polarization direction, intensity, and operating mode, and performs autocorrelation splitting and combining of THz beams, as well as measurement of far-field THz time-domain waveforms. By adopting a structure of a symmetrical plane mirror and an off-axis parabolic mirror that moves with the needle tip, THz can be conveniently coupled to the vicinity of the STM needle tip, and the THz incident direction can be planned in a two-dimensional plane, avoiding complex analysis in three-dimensional space. The fluorescence collection efficiency is significantly increased by designing an independent fluorescence collection structure. LABVIEW software is used to achieve synchronous analysis of THz near-field fluorescence signal measurement and STM operating system, expanding the research capabilities of THz near-field fluorescence phenomena.

The invention relates to the technical field of nano needle tip preparation, and discloses a nano needle tip preparation device and method for a scanning tunneling microscope, and the preparation device comprises a needle tip automatic power-off etching device and a silver wire which is connected to the positive electrode of an output port of the needle tip automatic power-off etching device. The device comprises a platinum ring electrode, an etching container, an etching liquid lifting table and a silver wire lifting table, and the silver wire lifting table and the etching liquid lifting table are used for achieving automatic lifting of the etching container in the working process. According to the preparation method, the lowest predetermined etching current is set, and the height of the bottom of the silver wire immersed in the etching container is always a fixed value. According to the nano needle tip preparation device and the preparation method thereof, the high-precision, rapid and efficient preparation process of the tail end of the nano needle tip is successfully realized through an electrochemical etching and automatic power-off control technology, the shape of the nano needle tip can be accurately controlled, the surface quality of the nano needle tip is improved, and the preparation efficiency is remarkably improved.

The first aspect of the technical scheme of the present application discloses a scanning tunneling microscope image surface species tracking method based on a visual large model. The second aspect of the present application discloses an automatic tracking system for implementing the above scanning tunneling microscope image surface species tracking method, comprising an image input module, a large model reasoning module, a data analysis module and a result output module. Compared with the prior art, the present application has the beneficial effects of high automation and intelligence, high precision and quantification, strong robustness, excellent practicability and the like.

The utility model discloses a low temperature scanning tunnel microscope separating type sample support capable of rapidly replacing samples, comprising a first mother support, a second mother support and a son support, the surface of the first mother support is provided with a boss, the boss is used for fixing a to-be-tested sample, the second mother support is provided with a heating zone, the surface of the son support is used for fixing a standard sample, and the boss is used for fixing the to-be-tested sample. The surface of the first mother support and the surface of the second mother support are each provided with a screw used for fixing the son support, the first mother support, the second mother support and the son support are each provided with an extended grabbing arm, the extended grabbing arms are provided with mechanical arms, and the mechanical arms are used for transferring the son supports on the surfaces of the first mother support and the second mother support. The utility model has the advantages of high use efficiency, effective reduction of thermal drift, and more accurate imaging.

The application discloses an in-situ transmission electron microscope sample rod integrated with a scanning tunneling microscope and a detection method, and belongs to the technical field of electron microscopes. The sample rod comprises a sample rod body, an axial STM probe assembly integrated with the sample rod head, a front-end rotatable sample support and a linear-rotation conversion driving mechanism. The linear-rotation conversion driving mechanism converts axial linear motion into angular displacement, and drives the rotatable sample support to be in-situ flipped by 90 DEG between a horizontal TEM mode and a vertical STM mode. In the STM mode, the sample surface is parallel to the electron beam and opposite to the STM probe tip, and at the same time, an automatic electrical contact assembly is closed to realize reliable grounding of the sample. The application effectively solves the problems of geometric visual angle conflict, electron beam scattering interference and unstable grounding existing in the traditional combined technology, and realizes lossless, high signal-to-noise ratio in-situ switching of transmission imaging and tunneling current analysis in a vacuum environment.

The invention belongs to the technical field of scanning tunneling microscopes, and particularly relates to a scanning tunneling microscope with an imaging unit perpendicular to a driving unit and an imaging method. The microscope body comprises an outer frame, an imaging unit and a driving unit, the fixed end of the driving unit is fixedly arranged on the outer frame, and the imaging unit is arranged at the free end of the driving unit; the length direction of the imaging unit is perpendicular to the length direction of the driving unit in the initial state. A sample of which the surface is vertical to the length direction of the imaging unit is fixedly arranged on the outer frame; the sample surface is parallel to the magnetic field direction; the free end of the driving unit stretches out, draws back and bends in an XYZ three-dimensional plane, and drives the imaging unit to perform needle insertion, needle withdrawal or scanning imaging relative to a sample; the initial state means that the free end of the piezoelectric body is free of bending and displacement in any direction and contracts to the shortest length. According to the invention, the electronic state property of the sample under the condition that the magnetic field direction is parallel to the surface of the sample can be observed in a narrow superconducting magnet space.

The invention discloses an optical coupling scanning tunneling microscope with a magnetic field, which comprises an annular superconducting magnet, a mounting frame arranged in the superconducting magnet, a sample groove, a needle point groove, a scanning assembly, a first driving mechanism, a second driving mechanism and a light source assembly arranged below the mounting frame, wherein the sample groove, the needle point groove, the scanning assembly, the first driving mechanism and the second driving mechanism are arranged in the mounting frame; the light source assembly is located below the superconducting magnet, and a light path of emergent light of the light source assembly is located in a center hole of the superconducting magnet at the corresponding height. The needle point groove is provided with a first hole for light rays to penetrate upwards. The scanning assembly comprises a conical tube, a cylindrical tube and a mounting seat which are sequentially connected from top to bottom; the cylindrical tube is located on the inner side of the light path, a second hole for light rays to penetrate upwards is formed in the installation base, the conical tube expands in a conical mode from top to bottom, and a tangent plane for giving way to the light path is arranged on the outer side face of the conical tube. The optical coupling scanning tunneling microscope with the magnetic field can be compatible with an optical coupling structure and a high-intensity magnetic field structure at the same time, and is simple in structure and wide in application range.

The invention discloses a novel single molecule cleavage technology measuring device with a wide-angle open space, a needle tip moving part is fixed on an optical platform through a displacement table, a transmission mechanism is arranged on the displacement table, a displacement sliding block is connected to the transmission mechanism, and a right-angle switching structural member is fixedly mounted on the front surface of the displacement sliding block; a piezoelectric ceramic is arranged below the far end of the right-angle switching structural member, the piezoelectric ceramic is sleeved with a shielding ring, a needle cylinder is fixedly installed at the bottom of the piezoelectric ceramic, and the needle cylinder is used for fixing a needle tip and leading out a needle tip signal; and a chassis is arranged below the front side of the displacement table. The objective of the invention is to make architecture improvement on a split junction technology based on a scanning tunneling microscope, so that the split junction technology has an open space for accommodating incidence and measurement of light rays, the stability of electrical measurement of an instrument is not affected, and the instrument has the capabilities of optical regulation and control and spectroscopic measurement while being rapid in operation and convenient in sample preparation.

An alternating current compensation circuit (36) for a Scanning Probe Microscope (SPM) device (30) such as a Scanning Tunnelling Microscope (STM) is provided. The alternating current compensation circuit (36) includes, or is coupleable to, a voltage or current source (34). This generates a compensation current to cancel or minimise a capacitive current formed by a junction capacitance during an operation of the SPM device (30) at high frequencies, also known as a parasitic capacitance or tunnelling capacitance between two surfaces (e.g. probe, tip or sample). This may use an inverter (52) such as a balun (54) with either a high-electron mobility transistor (HEMT) (68), summing circuit (70), lock-in amplifier (74) or tuneable stub (82).

This utility model discloses a lifting and adjusting device for a specimen in a scanning tunneling microscope, including a support frame, a pulley system, a suspension rope, a winding and unwinding mechanism, a lifting mechanism, and a guide mechanism. The winding and unwinding mechanism includes a mounting base, a rotating shaft for winding the suspension rope and rotatable about its own axis, which passes through the mounting base. The rotating shaft can also slide along its axial direction within the mounting base. The winding and unwinding mechanism also includes a first meshing tooth on the rotating shaft, a second meshing tooth in the mounting base, a first elastic element, and a driving element for engaging one end of the rotating shaft to compress the first elastic element and drive the rotating shaft to rotate. The first elastic element provides an elastic restoring force to drive the rotating shaft to move and reset along its axial direction, so that the first and second meshing teeth mesh with each other. This utility model's lifting and adjusting device for a specimen in a scanning tunneling microscope allows for a large stroke of the specimen while maintaining relatively low cost and preventing lifting and unwinding jams.

The invention relates to the field of microscopes, and discloses a dual-piezoelectric sliding table control method, a dual-piezoelectric sliding table control circuit and a dual-piezoelectric sliding table. The double-piezoelectric sliding table comprises a base, a sliding block arranged on the base, a first magnetic attraction piece, a second magnetic attraction piece, a first piezoelectric part and a second piezoelectric part. The first magnetic attraction piece and the second magnetic attraction piece are magnetically attracted to the two opposite sides of the sliding block respectively. One end of the first piezoelectric part is fixed with the first magnetic part, the other end is fixed on the substrate, one end of the second piezoelectric part is fixed with the second magnetic part, and the other end is fixed on the substrate; the first piezoelectric part and the second piezoelectric part are used for extending or contracting in the sliding direction of the sliding block along with the change of the driving voltage, and the first piezoelectric part and the second piezoelectric part drive the sliding block to move in the sliding direction when extending and / or contracting. The technical problem of low accuracy and stability of probe driving in the scanning tunneling microscope in the prior art is solved.

The invention belongs to the technical field of scanning tunneling microscopes, and particularly relates to a stable-imaging scanning tunneling microscope and a scanning imaging method. A scanning tunneling microscope capable of stable imaging comprises a microscope body, the microscope body comprises an outer frame, a driving unit, a sliding unit, a sample holder and a scanning unit, the outer frame is hollow, the driving unit and the sample holder are arranged at the two ends of the interior of the outer frame respectively, the sliding unit is arranged on the side wall of the interior of the outer frame, and the sample holder is arranged on the side wall of the interior of the outer frame. The scanning unit is fixedly arranged at the end, close to the sample holder, of the sliding unit, and the driving unit drives the sliding unit to push the scanning unit to conduct needle inserting or needle withdrawing in the length direction of the outer frame. The imaging quality and stability can be improved, and the situation of needle collision is avoided as much as possible.

The invention relates to the technical field of scanning tunneling microscopes, and discloses a scanning probe measuring device and a control method for pinpoint-to-pinpoint imaging, two pinpoints are oppositely arranged, and the pinpoints are accurately controlled and movably positioned based on a basic working mode of a scanning probe microscope. A needle tip-tunnel junction-needle tip working structure is established, after bias voltage is applied externally, electron tunneling between needle tips only relates to a small number of atoms or single atoms at the tail ends of the needle tips, the tunneling effect that the small number of atoms contribute to electrons is achieved, and therefore small number or single atom imaging is achieved. The device can be rapidly transplanted to application scenes of low temperature, strong magnetic field, optical measurement and the like, the double-needle-point structure is regulated and controlled through piezoelectric displacement or an electric field, tunnel junction width and barrier height can be optimized in real time, and research on dynamic construction and dynamic electrical characteristics of nanoscale tunnel junctions is greatly facilitated.

A method for autonomously applying a dangling bond pattern to a substrate for atom scale device fabrication includes inputting the pattern, initiating a patterning process, scanning the substrate using a scanning probe microscope (SPM) to generate an SPM image of the substrate, feeding the SPM image into a trained convolution neural network (CNN), analyzing the SPM image using the CNN to identify substrate defects, determining a defect free substrate area for pattern application; and applying the pattern to the substrate in that area. An atom scale electronic component includes functional patches on a substrate and wires electrically connecting the functional patches. Training a CNN includes recording a Scanning Tunneling Microscope (STM) image of the substrate, extracting images of defects from the STM image, labeling pixel-wise the defect images, and feeding the extracted and labeled images of defects into a CNN to train the CNN for semantic segmentation.

The invention provides a cavity external optical coupling system applied to an ultrahigh vacuum cavity of a scanning tunneling microscope. A femtosecond laser generates femtosecond pulse light; the first beam splitter splits the femtosecond pulse light to obtain a first light beam and a first residual light beam; the second beam splitter splits the first residual light beam into a second light beam and a second residual light beam; the third beam splitter splits the second residual light beam into a third light beam and a fourth light beam; the first light path module is used for processing the first light beam as first sampling light; the second light path module is used for processing the second light beam; the third light path module is used for processing the third light beam as second sampling light; the terahertz generation module is used for generating terahertz pulses according to the second light beam and the fourth light beam; the first parabolic mirror unit is used for focusing terahertz pulses to the electro-optical crystal; the electro-optical crystal is used for detecting THz light; the second parabolic mirror unit is used for focusing and emitting the terahertz pulse; and the gold reflector is used for guiding the terahertz pulse to the tunnel junction of the scanning tunneling microscope.

The invention discloses a terahertz near-field fluorescence signal analysis system based on a scanning tunneling microscope. The system comprises a THz radiation system, a THz transmission-characterization-modulation system, a THz coupling and fluorescence collection system and a THz fluorescence data analysis system which are connected in sequence. According to the invention, the capability of regulating and controlling the characteristics of THz polarity, carrier phase, polarization direction, intensity, working mode and the like is improved, and the self-correlation beam splitting and beam combining of THz beams and the measurement of far-field THz time domain waveforms are completed; by adopting a structure of a symmetrical plane mirror and an off-axis parabolic mirror which move along with a needle point, THz can be conveniently coupled to a position near the needle point of the scanning tunneling microscope, and the incident direction of the THz is planned on a two-dimensional plane, so that complex analysis in a three-dimensional space is avoided; by designing an independent fluorescence collection structure device, the fluorescence collection efficiency is remarkably improved; through LABVIEW software design, THz near-field fluorescence signal measurement and synchronous analysis of an STM operating system are realized, and the research capability of a terahertz near-field fluorescence phenomenon is expanded.

1. The name of the design product: needle tip replacement rack for scanning tunneling microscope. 2. The use of the design product: the design product is used for needle tip replacement and storage of scanning tunneling microscope. The design product is used for scanning tunneling microscope (STM), which belongs to the field of scientific instruments and is mainly used for needle tip replacement, storage and installation auxiliary operation in scientific research laboratories or teaching experimental environment. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.

The invention provides a method for simulating a scanning tunneling microscopy, relates to the technical field of spectroscopy analogue simulation, and is used for accurately simulating a differential conductivity spectrum measured by a scanning tunneling microscopy. The strong coupling effect between the tip of the scanning tunneling microscope and the surface magnetic impurities can be effectively described, especially under the condition that a near-rattan resonance effect occurs, the spin polarization characteristics can be accurately extracted through numerical solution of a quantum state and a hybridization function in an impurity model, and common unconventional conductivity spectrum characteristics in an experiment are simulated, so that the accuracy of the spin polarization characteristics is improved. According to the method, the interaction between the local spin state and the magnetic environment can be deeply understood, information related to spin can be extracted, and a theoretical basis is provided for the field of spintronics. Meanwhile, the method can be well compared with experimental data, the accuracy of a simulation result is ensured, and the method has a wide application prospect.

The present invention relates to a sample holder for scanning tunnelling microscopes (STM), especially designed for PAN models, with a rail-based system that allows the sample holder to be quickly and easily removed without having to disassemble the microscope. The sample holder comprises a base (7) with a cut-out having a series of rails (7.1) and a panel (8) that can be removed via the rails (7.1). The panel (8) comprises a plate (11.2) having, on one face thereof, a protrusion (11.4), a through hole (8.1) on one side of the protrusion (11.4) and a tab (11.3) on the opposite side. The protrusion (11.4) comprises a frame (11.1) to hold the sample. The protrusion (11.4) may comprise a central hole (12.2) and a latch (12.1) inside the central hole (12.2). Alternatively, the protrusion (11.4) can also rotate on the plate (11.2).

The application discloses a scanning tunnel microscope device for realizing electron spin resonance detection and relates to the technical field of microscopes. The scanning tunnel microscope device for realizing electron spin resonance detection comprises a base, a needle tip arranged on the base, the needle tip being configured to run and generate a tunneling current with a sample on the base, a microwave excitation component, the microwave excitation component comprising an antenna and a microwave signal generation and modulation structure, the antenna being arranged on the base, and the microwave signal generation and modulation structure being configured to transmit microwave signals to the antenna and / or the needle tip, and a magnet component arranged on the side of the base away from the needle tip. The microwave radiation direction of the antenna is towards the needle tip. The technical scheme of the application is characterized in that the antenna is arranged on one side of the base, and the microwave signal generation and modulation structure is configured to inject microwave signals to the antenna and / or the needle tip, so as to improve the microwave excitation efficiency and frequency coverage capability and significantly improve the stability of the spin resonance signal and the system adaptability.

The present invention discloses a mechanical series scanning tunnel microscope body of a tube-type approach and imaging unit, comprising a base, a slide bar, a sleeve and a spring sheet, characterized in that it also comprises a first piezoelectric tube, a second piezoelectric tube and a probe bracket, wherein one end of the first piezoelectric tube is fixed to the base, and the other end is fixed in series with the second piezoelectric tube along the axial direction, the sleeve is coaxially fixed to the deformed free end of the second piezoelectric tube, the spring sheet applies radial pressure along the sleeve to clamp the slide bar to the inner wall of the guide rail, the sliding direction of the slide bar is along the axial direction of the sleeve, the probe bracket is coaxially arranged with the second piezoelectric tube, and one end is fixed at the position where the first piezoelectric tube and the second piezoelectric tube are connected in series. The radial and axial structures of the mirror body of the invention are highly compact, the second piezoelectric tube is also used for approaching to achieve a low starting voltage of the needle-like approach step, and at the same time ensures the high rigidity of the scanning unit, the main body is made of insulating material, and the cross section of the structure has no conductive circuit, which is particularly suitable for extreme physical conditions such as extremely low temperature, strong / fast changing magnetic field, and strong vibration.

The application discloses a novel single-molecule cleavage junction technology measuring device with a large-angle open space, a needle tip moving part is fixed on an optical platform through a displacement table, a transmission mechanism is arranged on the displacement table, a displacement sliding block is connected to the transmission mechanism, and a right-angle adapter structural member is fixedly installed on the front face of the displacement sliding block; a piezoelectric ceramic is arranged below the distal end of the right-angle adapter structural member, a shielding ring is sleeved with the piezoelectric ceramic, a needle cylinder is fixedly installed at the bottom of the piezoelectric ceramic, the needle cylinder is used for fixing a needle tip and leading out a needle tip signal, and a bottom disc is arranged below the front side of the displacement table. The application aims to make an architectural improvement on a cleavage junction technology based on a scanning tunneling microscope, so that the cleavage junction technology has an open space to accommodate the incidence and measurement of light and does not affect the stability of electrical measurement of the instrument itself, so that the instrument is fast in operation, convenient in sample preparation, and has the ability of optical regulation and spectroscopy measurement.

The invention discloses a two-dimensional atomic lattice construction method with a topological angular state, and the method comprises the steps: depositing metal atoms on the surface of an III-V group semiconductor substrate with a symmetrical vacancy surface structure, and enabling the metal atoms to be ionized and anchored through the vacancy of the surface of the substrate; the method comprises the following steps: acquiring surface topography data of a semiconductor by using a scanning tunneling microscope and a needle point thereof, carrying metal ions on the surface of an III-V group semiconductor substrate one by one, accurately controlling the distance between the metal ions, and forming single artificial quantum dots; constructing n artificial quantum dots in the same way, and forming a two-dimensional atomic lattice on the surface of the semiconductor substrate; adjusting the lattice point spacing of the two-dimensional atomic lattice, regulating and controlling t / r, removing or adding artificial quantum dots by using a needle tip, designing a boundary structure at the edge of the two-dimensional array, and constructing the two-dimensional atomic lattice with a topological angular state. According to the invention, controllable construction of the topological angular state and accurate regulation and control of lattice topological properties are realized, and a new research platform is provided for solid-state quantum calculation.

The utility model discloses a horizontal scanning tunnel microscope structure used at normal temperature and normal pressure, comprising a scanning assembly and a controller, the scanning assembly and the controller are connected through a plug-in type connecting line, the scanning assembly comprises a damping mounting seat, the surface of the damping mounting seat is provided with a positioning mounting groove, the positioning mounting groove is internally provided with a fixing seat, and the fixing seat is provided with a through hole. A scanning head is arranged on the fixing seat and fixed through a bridge connector, a front connecting plate and a rear tail supporting block are arranged at the two ends, in the axial direction of the scanning head, of the fixing seat respectively, the front connecting plate and the rear tail supporting block are matched to limit the position of the scanning head in the axial direction, a micrometer head is installed on the rear tail supporting block, and the micrometer head is connected with a moving part in the scanning head. The front connecting plate is fixedly connected with the outer shell of the scanning head through a plurality of studs; and the plurality of studs are also connected with the sample holder. The utility model has the advantages of simple structure, large integral structure rigidity after assembly, improved scanning effect, small electromagnetic interference and strong expansibility.

The invention relates to a method for preparing a single-layer and single-crystal tungsten disulfide film on a gold (111) substrate. According to the preparation method, a normal-pressure chemical vapor deposition method is adopted, a single-crystal gold (111) foil is used as a substrate, powdered sulfur and tungsten trioxide powder are used as precursor sources, growth of a single-oriented single-layer tungsten disulfide domain region is carried out, and the needed single-layer single-crystal tungsten disulfide film is prepared by regulating and controlling the growth time. According to the method disclosed by the invention, the coverage degree of the domain region can be regulated and controlled by regulating and controlling the growth time of the single-layer single-orientation tungsten disulfide domain region, and finally the fully-covered single-layer single-crystal tungsten disulfide film is obtained; the batch preparation of the high-quality and large-area single-layer and single-crystal tungsten disulfide thin film is simply and efficiently realized; the prepared single-layer single-crystal tungsten disulfide film can be directly used for characterization of an in-situ scanning tunneling microscope / tunnel spectrum, and observation of the microstructure, the electronic structure, the atomic structure, the energy band structure and the epitaxial growth behavior and exploration of future application are achieved.