Image restoration method, device, electronic device and storage medium

An image and sample image technology, applied in the field of image processing, can solve the problems of boundary artifact distortion, inability to adapt to the high-density texture details and periodicity of STM images, dense and discrete images of defects, etc., and achieve the effect of good repair effect.

Active Publication Date: 2022-07-29
NANJING UNIV +1
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AI Technical Summary

Problems solved by technology

It is difficult for these algorithms to reconstruct the high-frequency details of STM images, resulting in differences in boundary artifacts, distorted patterns, and blurred textures. Repair effect is poor

Method used

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  • Image restoration method, device, electronic device and storage medium
  • Image restoration method, device, electronic device and storage medium
  • Image restoration method, device, electronic device and storage medium

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Embodiment Construction

[0049] In order to make the purposes, technical solutions and advantages of the embodiments of the present disclosure more clear, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present disclosure. Obviously, the described embodiments are only These are some, but not all, embodiments of the present disclosure. The components of the disclosed embodiments generally described and illustrated in the drawings herein may be arranged and designed in a variety of different configurations. Therefore, the following detailed description of the embodiments of the disclosure provided in the accompanying drawings is not intended to limit the scope of the disclosure as claimed, but is merely representative of selected embodiments of the disclosure. Based on the embodiments of the present disclosure, all other embodiments obtained by those skilled in the ar...

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Abstract

The present disclosure provides an image repairing method, device, electronic device and storage medium. The image repairing model is trained by constructing a sample image data set consisting of a scanning tunneling microscope differential conductance map, a scanning tunneling microscope topography map and texture image data; Configure a defect mask and the corresponding mask spectrum for the image to be repaired to indicate dense and discrete defect location areas; input the image spectrum and mask spectrum of the area image corresponding to the defect location area into the trained frequency domain convolution network to obtain the preliminary repaired image corresponding to the area image; input the preliminary repaired image to the trained detail repair network to obtain the detail repaired image corresponding to the area image; replace the image of the defect location area in the image to be repaired with the detail repaired image, A repaired scanning tunneling microscope image was obtained. For scanning tunneling microscope images with high density texture details and periodicity, dense and discrete defects can have a better repair effect.

Description

technical field [0001] The present disclosure relates to the technical field of image processing, and in particular, to an image restoration method, apparatus, electronic device and storage medium. Background technique [0002] As an imaging tool with atomic-level high resolution, Scanning Tunneling Microscope (STM) has been widely used in many fields, including energy, optoelectronics, electronics, and quantum information. Through quantitative topography or differential conductance scanning of the surface, the acquisition, analysis and evaluation of characteristic information such as material microstructure and local electronic state can be achieved. The tunneling current detected by STM is generally in the order of nanoamps (nA), so the requirements for the environment are also very strict, and slight vibration and electromagnetic interference will have a great impact on the scanned image. On the other hand, there are also some natural intrinsic defects on the surface of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00G06N3/04
CPCG06T5/005G06T2207/10061G06N3/045
Inventor 李绍春丁辉尚媛园陈念哲黄钰涵鲁嘉铖
Owner NANJING UNIV
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