United measuring system and its measuring technology for scanning channel microscope and scanning micro electrode

Abstract

It relates to a scanning tunneling microscope and scanning microelectrode combined measurement system and technology, comprising a scanning tunneling microscope (STM) measurement platform, a scanning microprobe and a control / drive unit; a tunneling current signal and a micro-area potential signal measurement unit and measurement signals control and processing unit. The scanning microprobe is used to detect the surface tunnel current and the surface potential distribution simultaneously, and the scanning measurement mode is exchanged by piezoelectric microscanning and stepping motor mechanical scanning, and the tunneling current is used as an indication that the scanning microelectrode reaches the surface of the sample, and the scanning is realized. Quantitative control of the distance between the tip of the microelectrode and the surface of the sample can significantly improve the spatial resolution of the distribution measurement of the electrochemical corrosion potential of the surface micro-area. The system can simultaneously measure nanometer-resolution surface topography images and surface micro-area electrochemical activity distribution images, and realize the interrelated research on surface topography structure-chemical activity. Provide an open platform for multiple surface spatially resolved measurement technologies that combine each other, complement each other, and correlate research.

Description

Technical field [0001] The invention relates to a combined measurement technique of a scanning tunnel microscope and a scanning microelectrode. Background technique [0002] In 1982, the first scanning tunneling microscope (Scanning Tunneling Microscope, STM) was successfully developed by Binnig and others in the Zurich laboratory of International Business Machines Corporation (IBM). The basic principle is to use the tunneling effect in quantum theory to detect samples through scanning microprobes. The surface electronic state density distribution, thereby indirectly obtaining the surface morphology of the sample. The emergence of STM makes it possible to obtain the surface morphology and structure with atomic spatial resolution in situ and in real time. STM has further stimulated the continuous introduction of other new scanning microprobe microscopy (SPM) technologies. The earth has promoted the rapid development of the entire nanotechnology. So far, SPM has become one of the m...

AI Technical Summary

Problems solved by technology

[0003] However, with the deepening of research and the development of science and technology, several key drawbacks and deficiencies of scanning microprobe (SPM) technology have become more and more apparent. A single scanning microprobe technology has been difficult to meet complex comprehensive research. Due to the observation of highly oriented surface structures, it is difficult to interpret the SPM images of most polycrystalline or amorphous materials; SPM is only sensitive to the surface microscopic appearance, but lacks the sensitivity of the chemical properties of the surface micro-regions, and the surface microscopic appearance is difficult to detect. Correlates with physicochemical properties of surface domains

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