Preparation method for scanning probe of scanning tunneling microscope and control circuit

A scanning tunnel and scanning probe technology, applied in the field of scanning tunneling microscope scanning probe preparation and control circuit, can solve problems such as the inability to obtain aspect ratio, achieve better experimental results, easily collect voltage signals, and prevent over-corrosion. Effect

Pending Publication Date: 2017-02-01
CENT SOUTH UNIV
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  • Abstract
  • Description
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Problems solved by technology

[0008] The purpose of the present invention is to provide a preparation method of an STM scanning probe and a control circuit used in the preparation method

Method used

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  • Preparation method for scanning probe of scanning tunneling microscope and control circuit
  • Preparation method for scanning probe of scanning tunneling microscope and control circuit
  • Preparation method for scanning probe of scanning tunneling microscope and control circuit

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Embodiment 1

[0052] Use sandpaper to remove the oxide film on the surface of the high-purity tungsten wire with a diameter of 0.5 mm, then soak it in dilute HCL for 10 minutes, and finally use acetone to ultrasonically clean it for 15 minutes.

[0053] The bottom of the tungsten wire is covered with a 2cm long apron, and the distance between the bottom of the apron and the bottom of the probe is 2mm.

[0054] Put the copper coil into 2mol / L KOH solution, insert the vertical tungsten wire into the center of the liquid surface of the beaker, and insert the bottom of the probe into the liquid surface to a depth of 1mm; then use the tungsten wire as the anode and the copper coil as the cathode , and a corrosion voltage of 5V is applied to both ends; the electrochemical corrosion reaction is carried out with the probe as the anode and the wire coil as the cathode.

[0055] figure 1 It is also a schematic diagram of each module of the needle point preparation control circuit. The control circui...

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Abstract

The invention provides a preparation method for a scanning probe of a scanning tunneling microscope and a control circuit. The method comprises: oxidation film removing processing is carried out on a probe; a rubber gasket sleeve the probe of the probe with the diameter of 0.5mm, wherein the distance between the bottom of the rubber gasket and the bottom of the probe is 2mm; a metal filament loop is placed into a KOH solution with the concentration of 2 to 3 mol/L and the bottom of the probe is inserted into the liquid surface at the depth of 1mm; the probe serves as an anode and the metal filament loop serves as a cathode and voltages of 5 to 12 V are applied to the two ends; and when a first voltage of the anode is equal to a second voltage on a fixed resistor of a control circuit, the control circuit cuts off the circuit and thus the point of a needle is formed at the bottom of the probe. Besides, the control circuit consists of a relay, a fixed resistor, a cathode, and an anode, wherein the relay and the fixed resistor are connected with a single-chip microcomputer in series and the cathode and the anode are connected by using an electrolyte. According to the invention, the aspect ratio is controlled and the gravity is increased by using the rubber gasket and the control circuit cuts off the power supply automatically and detects the voltages in real time, so that the ideal probe point with the proper aspect ratio and the clear scanning pattern can be prepared by using a one-step corrosion method.

Description

technical field [0001] The present invention relates to the field of preparation of scanning tunneling microscope (Scanning Tunneling Microscope, STM) scanning probe, in particular, relates to a preparation method of STM scanning probe and a control circuit used in the preparation method. Background technique [0002] As the part of the scanning tunneling microscope that directly detects the surface of the sample, the scanning probe is undoubtedly closely related to the quality of the STM scanning image. In fact, the size, geometry, chemical composition and purity of the probe will directly affect the tunneling current between the tip and the sample, and even the detection of the electronic density of states on the surface of the sample. Therefore, the preparation quality of the tip is very important for STM work. Performance matters. For example, if the STM probe has multiple tips, the stability of the tunneling current will be reduced; in addition, in order to increase th...

Claims

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Application Information

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IPC IPC(8): G01Q60/16
CPCG01Q60/16
Inventor 谢启梁谭智予田果黄寒
Owner CENT SOUTH UNIV
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