Needle tip transfer support of scanning tunneling microscope

A scanning tunneling and microscope technology, used in scanning probe microscopy, scanning probe technology, measuring devices, etc.

Pending Publication Date: 2020-07-07
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a scanning tunneling microscope tip transfer support, which is used to solve the transfer, in-situ processing and replacement of the tip in the ultra-high vacuum combined system in the prior art. The problem

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  • Needle tip transfer support of scanning tunneling microscope
  • Needle tip transfer support of scanning tunneling microscope
  • Needle tip transfer support of scanning tunneling microscope

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Embodiment Construction

[0048] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0049] see Figure 1 to Figure 7 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arb...

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Abstract

The invention provides a needle tip transfer support of a scanning tunneling microscope; the needle tip transfer support comprises: a first unit that includes a first surface and a second surface, andthe transmission mode of the first unit comprises horizontal transmission; the base that is located on the first surface and connected with the first unit, the base comprises a first through hole anda second through hole, the diameter of the first through hole is larger than that of the second through hole, the center line of the first through hole coincides with the center line of the second through hole, and therefore a limiting step face is formed between the first through hole and the second through hole; an elastic member that comprises a top, a bottom and an elastic fixing part, wherein the top makes contact with the limiting step face, the bottom makes contact with the first surface, and the horizontal section distance of the elastic fixing part is smaller than the diameter of thesecond through hole. And the scanning tunneling microscope needle tip support is fixed through the elastic fixing part. Operations such as transmission, in-situ treatment and replacement of the needle tip in an ultrahigh vacuum combined system can be realized, and impurity pollution under the atmosphere is avoided.

Description

technical field [0001] The invention belongs to the field of vacuum equipment, and relates to a scanning tunneling microscope needle point delivery support. Background technique [0002] Molecular beam epitaxy (MBE) is a newly developed new technology for preparing high-quality single crystal thin films in an ultra-high vacuum environment. Molecular beam epitaxy growth can realize single crystal growth with atomic layer-by-layer deposition, and prepare artificially modulated two-dimensional thin film materials , By precisely controlling the film composition, doping concentration and other means to obtain quantum wells, superlattices, topological superconductivity and other quantum new materials, it has been favored by more and more scientific researchers. Research on topological superconducting materials is the basis of quantum computing and quantum communication. [0003] Angle-resolved photoelectron spectroscopy (ARPES) is a method of directly observing the electronic str...

Claims

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Application Information

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IPC IPC(8): G01Q60/16
CPCG01Q60/16
Inventor 梅红萍李昂
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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