Scanning tunneling microscope and sample holder thereof

A technology for scanning tunnels and sample holders, which is applied in the field of nanoscale characterization, and can solve problems such as the inability to integrate multiple electrodes

Active Publication Date: 2020-05-29
INST OF PHYSICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Aiming at the technical problems and other problems that the scanning tunneling microscope using Beetle-type scanning head cannot integrate multi-...

Method used

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  • Scanning tunneling microscope and sample holder thereof
  • Scanning tunneling microscope and sample holder thereof
  • Scanning tunneling microscope and sample holder thereof

Examples

Experimental program
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Effect test

Embodiment 1

[0064] Embodiment 1: Common STM function.

[0065] Such as Figure 5 As shown, one of the electrodes on the sample holder is connected to the bias voltage, and the probe lead is connected to the STM preamplifier. STM can be used to characterize the surface atomic resolution morphology, electronic state and single atom or functions such as single molecule manipulation.

Embodiment 2

[0066] Example 2: Apply gate voltage to regulate the electronic state of the few-layer 2D material, and use STM to characterize it.

[0067] Such as Figure 6 As shown, terminal 1 is connected to the few-layer 2D material, and Bias voltage is applied; terminal 4 is connected to the probe, and the tunneling current is measured. It can complete basic STM functions. Terminal 2 is connected to the gate, and the gate voltage is added to regulate the electronic state. It can be used to characterize the variation of electronic states of few-layer 2D materials with gate voltage.

Embodiment 3

[0068] Example 3: STM combined with transport measurements.

[0069] Such as Figure 7 As shown, in the STM mode, the Bias voltage is applied to the 2-terminal, and the tunneling current is measured at the 4-terminal. In the transport mode of measurement, the 1 terminal and 2 terminal are respectively connected to the two ends of the material to be tested, and the voltage is applied to both ends to measure the current; the 3 terminal and 4 terminal can measure the voltage. By changing the position of the probe, the conductance information at different positions can be measured.

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Abstract

The invention discloses a scanning tunneling microscope and a sample holder thereof. According to one embodiment, the scanning tunneling microscope comprises a Beetle-type scanning head, and a sampleholder of the scanning tunneling microscope comprises a base made of an insulating material; a plurality of needle inserting clinohedrals, each needle inserting clinohedrals being made of a conductivematerial and being provided with an electrode, and the plurality of needle inserting clinohedrals being separated from one another and are fixed on the base. When a sample is arranged on the sample holder, the sample is electrically connected with at least one of the plurality of needle inserting clinohedrals through the electrode. Moreover, when the sample holder is inversely arranged on the Beetle-type scanning head, the needle inserting inclined surface of each needle inserting clinohedral is only in contact with a tungsten ball at the top of a corresponding scanning tube in a plurality ofscanning tubes of the Beetle-type scanning head. According to the embodiment of the invention, the multi-electrode design of the scanning tunneling microscope adopting the Beetle-type scanning head is realized.

Description

technical field [0001] The present application generally relates to the technical field of nanoscale characterization, and more specifically, relates to a scanning tunneling microscope and a sample holder thereof. Background technique [0002] Scanning Tunneling Microscope (STM, Scanning Tunneling Microscope) has atomic-level spatial resolution capability, and is one of the highest spatial resolution characterization tools currently available to humans. STM has extremely high resolution, and can characterize sub-nanometer systems, characterize their morphology, electronic state and other characteristics, and can also manipulate and regulate them. However, in order to integrate with mainstream electronic technology, people need to study and regulate the transport characteristics of these systems, and at the same time design them into devices with transistor functions. This is almost impossible for an STM with only two electrodes (one for the probe and one for the sample). W...

Claims

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Application Information

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IPC IPC(8): G01Q60/10
CPCG01Q60/10
Inventor 王爱伟李乔楚李更郇庆高鸿钧
Owner INST OF PHYSICS - CHINESE ACAD OF SCI
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