Scanning-tunnel microscope needle-tip automatic controlled etching instrument

A scanning tunnel and microscope technology, applied in the field of testing, can solve the problems of low success rate of needle tip, insufficient observation, and insufficient response, and achieve the effect of compact structure, saving manpower, and easy disassembly and assembly

Inactive Publication Date: 2003-08-27
SHANGHAI JIAO TONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

5. Corrosion current cut-off response time
However, due to subjective and objective factors such as insufficient human observation and quick response, the needle tip is often damaged due to too long cut-off time of corrosion current, so the success rate of needle tip preparation is very low.

Method used

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  • Scanning-tunnel microscope needle-tip automatic controlled etching instrument
  • Scanning-tunnel microscope needle-tip automatic controlled etching instrument
  • Scanning-tunnel microscope needle-tip automatic controlled etching instrument

Examples

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Embodiment Construction

[0019] Such as figure 1 As shown, the present invention is composed of circuit 1 and electrolytic cell device 2. Circuit 1 includes power output part circuit a, braking part circuit b, logic judgment and alarm part circuit c, and electrolytic cell change feedback part circuit d. The electrolytic cell device 2 is composed of identical left and right parts, wherein one side of the two-way pipe 3 is welded with a cantilever 4, and the other side is respectively fixed on a central shaft 5 by a nut, and the two central shafts 5 are arranged on two bases 6, The ends of the two cantilevers 4 are respectively fixed with cathode coils 7 or anode tungsten wires 8 through nuts, and the electrolytic cell 9 filled with corrosive lye is set between the two bases 6 and clamped by crocodile clips 10 connected to the positive and negative poles of the circuit 1 respectively. The anode tungsten wire 8 and the upper part of the cathode coil 7 are used as the negative and positive electrodes of t...

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Abstract

The invention comprises the circuits and the electrolytic bath equipment. The circuit comprises the circuit for outputting power, the circuit of the braking part, the circuit of logical judgement and alarm part as well as the circuit of feeding back the change of the electrolytic bath. The electrolytic bath equipment comprises the identical left and right parts. A cantilever arm is welded on the one end of the two through tubes with another ends through nuts being fixed on the central shafts set up on the bottom seats. The cathode winding or anode tungsten filament is fixed on the end part of the two cantilever arms respectively. The alligator clips connected to the cathode and anode and clamp the upper part of the cathode and anode so as to become as the positive and negative electrode of the bath.

Description

technical field [0001] The invention relates to a scanning tunneling microscope needlepoint etching instrument, in particular to a scanning tunneling microscope needlepoint automatic control etching instrument, which belongs to the field of testing technology. Background technique [0002] Scanning tunneling microscopy (STM) can obtain atomic-level resolution from the electronic state of the scanning probe tip and the interaction between the tip and the sample. Therefore, it is desirable to be able to prepare an ideal tip that is sharp enough that there is only one atom at the end of the tip. Although this problem has not been completely solved technically, two points can be learned from it: first, needle tip preparation is still one of the central issues in STM experiments; second, needle tip sharpening in needle tip preparation is still the development direction. [0003] Through literature search, it was found that the book "Scanning Tunneling Microscopy Theory" written ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/16
Inventor 余昶王晖邹志强梁齐王庆康
Owner SHANGHAI JIAO TONG UNIV
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