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Inspecting device including detachable probe

A detection device and probe technology, which is applied in the direction of measuring devices, climate sustainability, components of steam boilers, etc., can solve problems such as inability to perform accurate detection

Active Publication Date: 2011-03-23
KEPCO KPS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the case of a columnar object with a variable-sized circular space, it is difficult to closely attach the probe to the circular object under pressure suitable for the circular space of the columnar object, thereby impairing accurate detection

Method used

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  • Inspecting device including detachable probe
  • Inspecting device including detachable probe
  • Inspecting device including detachable probe

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Embodiment Construction

[0028] Hereinafter, the present invention will be described in detail by explaining specific embodiments with reference to the accompanying drawings. The same reference numerals in the figures denote the same parts.

[0029] figure 1 is a perspective view of a detection device 10 including a connection structure according to an embodiment of the present invention.

[0030] The detection device 10 may include: a frame 100, which has a column shape extending longitudinally thereof and includes a guide hole 101 formed on a side of the frame 100; a head unit 200, which includes a The camera assembly at the front end; the first main body unit 110, the first main body unit 110 includes a plurality of brackets 111 formed on its outer surface, the first main body unit 110 is fixed to the frame 100 and screwed to the head unit 200; The support 120 on the rear surface of the first body unit 110; the first plate 130, which is screwed to the support 120 and includes a plurality of holes...

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Abstract

An inspecting device including a detachable probe has a link structure, and thus a subject having various diameters is tested. In addition, since various probes are changeably used in a scanner housing, ultrasonic wave testing and eddy current testing are simultaneously performed.

Description

[0001] Related patent application cross-reference [0002] This application claims priority from Korean Patent Application No. 10-2009-0072254 filed in the Korean Intellectual Property Office on Aug. 6, 2009, the entire disclosure of which is incorporated herein by reference. technical field [0003] The present invention relates to an inspection device for inspecting objects having various diameters, and more particularly, the present invention relates to an inspection device including a detachable probe, which includes an attachment structure so as to be compatible with objects of various diameters Match and perform various tests. Background technique [0004] Non-destructive testing methods for detecting internal and external defects of objects can include radiographic inspection and ultrasonic flaw detection inspection. Ultrasonic flaw detection inspection can easily detect objects with a large thickness, can detect the discontinuous position and size of the object imme...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G01N21/01G01N27/90G01N29/22G01N27/9013G01N27/904G01N27/9093
CPCG21C17/017F22B37/005G01N21/954Y02E30/30
Inventor 朴珉洙禺长明金庆燮崔相勋
Owner KEPCO KPS CO LTD
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