Defect and stress non-destructive testing system and non-destructive testing method based on pulsed eddy current and Barkhausen
A non-destructive testing, pulsed eddy current technology, applied in the direction of material magnetic variables, etc., can solve the problems of cumbersome detection, easy false detection, missed detection, low efficiency, etc., and achieve the effect of simple installation, simple circuit and reliable detection method
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[0026] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.
[0027] Such as figure 1 As shown, the nondestructive testing system of the present invention includes a signal generator single-chip microcomputer, digital-to-analog conversion, power amplifier, probe excitation coil, Hall sensor, signal amplification circuit, data acquisition card and computer; wherein the signal generator single-chip microcomputer is generated by program control Digital excitation signal. The digital excitation signal is a low-frequency mixed signal of rectangular wave and triangular wave. The frequency of the excitation signal can be changed by changing the parameters of the MCU program. Therefore, the frequency required for the excitation signal can be obtained by changing the program, and the MCU generates a digital excitation signal. Through the digital-to-analog converter, the digital signal is converted into an analo...
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