Photoelectric integrated testing system and photoelectric testing method
A test system and an integrated technology, applied in optics, nonlinear optics, instruments, etc., can solve the problems of longitudinal comparison of test results and centralized analysis of adverse effects, different test sample states and test environments, large use area, etc., to achieve Achieve intensification, achieve high efficiency, and reduce floor space
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[0031] The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments.
[0032] figure 1 It is a schematic diagram of the overall structure of an embodiment of the photoelectric integrated test system of the present invention, such as figure 1 As shown, the present embodiment provides an optoelectronic integrated test system, which may specifically include a test base 1 supporting a test sample 2, and the test base 1 is internally provided with an exchange component 3, an integrated control component 4, and a plurality of test components 5 . Each test component 5 inside the test base 1 is connected to the switch component 3 and the integrated control component 4 respectively, and the integrated control component 4 is used to centrally control the switch component 3 and multiple test components 5, and the multi-to-many test is realized by controlling the switch component 3 Control of a tes...
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