38 results about "Phototesting" patented technology

The invention relates to a railway line parameter optoelectronic test device for a tamping vehicle and detection method thereof. The invented device is characterized by comprising a solid optoelectronic receiving set and a luminous light source. The solid optoelectronic receiving set is composed of four optical imaging lens arrays, four CCD charge-coupled devices and a corresponding treatment circuit board, and an independent electro-optical system is formed of each two optical lens arrays and two CCD devices. The beneficial effects of the invention are: the invented device quickly acquires optical signals reflecting railway line parameters by using a high-precision linear array CCD photoelectric sensor and obtains line parameters by calculating using a computer software. The obtained parameters are transmitted to the tamping vehicle control system host to increase speed and accuracy of tamping vehicle surveying orbit parameters.

A photoelectric detector is the core element of a photoelectric detection system; in special occasions, a photoelectric sensor is usually cooperated with a laser light source, so that damages to the photoelectric sensors by lasers are unavoidable. The invention belongs to the field of photoelectric test, and provides a measuring method and a device of a laser damaged silicon-based detector. The damage degree of a detector by lasers is judged according to the changes of the surface appearance, the light current, the dark current and the responsiveness of the detector before and after strong laser irradiation. Previously, the research to a laser irradiation detector mainly lays particular emphasis on the damage threshold and the damage mechanism, but the changes of the dark current, the light current and the responsiveness during the procedure for quantitatively researching the detector damage are not reported. The method and the device provided by the invention can detect the changes of electric parameters and surface appearance of the detector in the damage procedure in an on-line manner, have the advantages that the detection is overall, accurate and convenient, and are suitable for the damage detection of the silicon-based unit detector and the damage mechanism research of the laser induced detector. And the method and the device provided by the invention can be used in field of laser processing, quality detection of optical elements, development of lasers and the like.

The invention provides a photoelectric measurement method for utilizing a thermocouple to monitor SSL (Secure Socket Layer) lighting products. The method comprises the following steps: setting initial measurement conditions of an integrating sphere testing system and correcting the system; placing in the SSL lighting product, and testing according to the conventional steps of photoelectric testing, monitoring the temperature of the SSL lighting product by utilizing the thermocouple in the conventional photoelectric testing process of the SSL lighting product, and conducting photoelectric measurement after the thermocouple stably monitors the temperature of the system.. The invention further provides an integrating sphere measurement device for utilizing the thermocouple to monitor the temperature, which comprises an integrating sphere for measuring luminosity and chromaticity, and a thermocouple probe for measuring temperature at a preset position in the integrating sphere is arranged inside the integrating sphere. Temperature monitoring on the preset position in the integrating sphere to the SSL lighting products can be realized by arranging the temperature control system of the thermocouple, analysis on the structure and service life of the SSL lighting product can be effectively conducted by relationship between measurement results of luminosity, chromaticity and the like and the temperature.

The invention provides a photoelectric detection and information processing experiment system which combines light, machine, electricity and computation and reflects a design concept of integration of an photoelectric experiment teaching instrument and a photoelectric testing instrument and completes measurement of photoelectric characteristics of a photoelectric sensor module under a condition that no auxiliary test device exists so that a zero-configuration design is realized. The system is used as a photoelectric testing instrument and capable of measuring voltage, current and illuminance and the like. No personal computer is needed and software in a single-chip microcomputer module realizes control and management of the whole machine. The system adopts an embedding-type structure and design of a power-supply module, a breadboard module, a bus module and a system resource module provides system flexible expandability and overcomes a disadvantage of single function of the prior photoelectric information detection and processing experiment instruments and provides brand-new experiment resources to users so that experiments in a plurality of kinds of photoelectric and electronic information majors in photoelectric detection, single-chip microcomputer technology, special-purpose integrated circuit technology and digital circuit technology and the like so that multiple purposes of one machine are realized and device sources of a laboratory are saved.

The invention discloses a manufacturing method of an electroluminescence test electrode. The method comprises the following steps: selecting indium granular with a same size; using a fixed pressure to carry out constant force pressing indium granular on an epitaxial wafer; repeatedly carrying out heating, cooling, the constant force pressing to the indium granular so that a resistance between the indium granular and the epitaxial wafer can reach stability. The invention has the following advantages that: the manufacturing method is simple; usage is convenient; through repeatedly carrying out the heating, the cooling, the constant force pressing to the indium granular, repeatability of the test can be substantially increased and a repeatability standard deviation can be controlled in 0-4% so that a reliable and stable photoelectric test result can be obtained.

The invention relates to a preparation method of a photoelectrochemical immunosensor for detecting cardiac troponin I. Immunoassay and photoelectric test are separated by constructing a split-type photoelectrochemical sensor, so that the photoelectric test and the immune recognition process of biomolecules do not interfere with each other. Bismuth sulfide nanorod modified tungsten trioxide is usedas a substrate material to provide basic photoelectric response, the band gap structures of bismuth sulfide nanorods and tungsten trioxide are matched, and visible light can be well utilized. Then, characteristic immune recognition of an antigen and an antibody is carried out in a 96 micro-well plate, ascorbic acid-coated mesoporous silica packaged by cadmium sulfide is used to label a cardiac troponin I second antibody, and cadmium sulfide is firmly bonded with mesoporous silica through disulfide bonds. After dithiothreitol is added dropwise, the disulfide bonds between cadmium sulfide and silica are disconnected, ascorbic acid is released, so that the photocurrent is improved to different degrees, and sensitive detection of cardiac troponin I is realized. The detection limit is 0.17pg / mL.

The invention discloses a laser beam divergence angle measurement method combining a trepanning method with cross line scanning, relates to the technical field of photoelectric test measurement, and aims to realize divergence angle measurement of laser with an ultra-small divergence angle (lower than 0.4 mrad) and ensure the measurement accuracy and precision. A laser emits laser beams; an off-axis parabolic mirror is arranged in the output light path of the laser; and a small-hole diaphragm panel is arranged at the intersection point of the off-axis parabolic mirror; the small-hole diaphragmpanel is adopted to scan the laser beam; small holes arranged according to diameters from large to small are formed in the small-hole diaphragm panel; the small holes with the diameters smaller than aset diameter threshold value are taken as cross scanning small holes; and the cross scanning small holes are utilized to carry out cross line scanning on the laser beam.

According to an acceleration test device and method for a quantum dot photoelectric detector under the vacuum low temperature, the test steps are simple, the efficiency is high, and the test error islow. The test device can simulate a vacuum low-temperature environment in the space, adopts ultraviolet rays to irradiate the photoelectric device to accelerate aging, automatically carries out periodic test and records data, and can obtain performance degradation test data of the quantum dot photoelectric detector in the simulated vacuum low-temperature environment. According to the test device,an ultraviolet lamp capable of continuously working is placed in a quantum dot photoelectric detector container, so that an ultraviolet accelerated aging function can be realized; a vacuum gauge and atemperature sensor are arranged outside the quantum dot photoelectric detector container, so that the temperature and vacuum degree change of a simulation environment can be monitored in real time, and the test condition can be monitored; an integrated automatic photoelectric test module can realize the automatic test of the photoelectric performance of the photoelectric detector, and has a complete system and functions. The test method based on the device is reasonable and can be realized.

The invention provides an area array CCD imaging and photoelectric coding combined fragment group testing device and method, and belongs to the technical field of photoelectric testing and weapon target range testing. The testing device comprises a main body frame, an area array CCD target and an upper computer; a line laser and a photosensitive diode coding array are arranged in the main body of the testing device; the line laser is located at the right end of the lower portion of the main body frame of the testing device; the laser light source and the photosensitive diode coding array at the right upper end of the main body frame of the testing device form a detection light curtain; and the area array CCD target is installed in the center of the bottom of the main body frame; and the field of view of the area array CCD target intersects with the laser detection light curtain; and the main body of the testing device is arranged in a ballistic direction and is a certain distance away from the explosion position of a warhead. According to the device and method, a fragment group generated by bullet explosion can be accurately matched and identified, fragment space distribution parameters can be measured in a high-precision manner, and effective data support is provided for target damage efficiency evaluation.

The invention, which belongs to the technical field of photoelectric testing, relates to an integral time control method of a CCD photoelectric detector, particularly to an adaptive light intensity type integral time control method of a CCD photoelectric detector. The method comprises the following steps that: step one, initial integral time is set as ti, wherein the ti is larger than tmin and smaller than tmax; step two, spectral signal [s1, s2,... and Sm] are collected and a spectral signal mean value savg is calculated; step three, a spectral noise sigma dark is collected and calculated; and step four, a size relation between the savg and delta. sigma dark is determined, wherein the delta expresses a dark noise influence factor, the integral time is set to be tj if the delta. sigma darkis larger than the savg, wherein the tj is larger than the tmin and smaller than the tmax and is not equal to the ti; and the step one is performed again; and if the savg is greater than or equal tothe delta. sigma dark, spectral signal denoising is carried out and then integral time setting is carried out. According to the method, the integral time is adaptively adjusted according to the illumination intensity and the integral time is adaptively adjusted by considering the influence of dark noises on the output signal; and the speed is high, the precision is high, and the method has adaptability. The method can be applied to automatic testing, rapid testing and other occasions.

The invention provides an automatic calibration system and method for a photoelectric detection target, and belongs to the technical field of photoelectric testing and weapon target range testing. The automatic calibration system comprises a measurement control platform, a signal detection platform and a controller; the measurement control platform and the signal detection platform are arranged at an interval, the photoelectric detection target is arranged on the measurement control platform, the signal detection platform receives light emitted by the photoelectric detection target, and the controller is electrically connected with the measurement control platform and the signal detection platform; and a detection light curtain of the photoelectric detection target is completely overlapped with a signal receiving assembly of the signal detection platform by adjusting the measurement control platform. According to the system, the included angle parameters of light curtains in a combined structure body of the photoelectric detection target can be accurately obtained, reliable data support is provided for accurate evaluation and subsequent research and development of weapon performance, the calibration precision and the use repeatability are improved, the time spent on calibration is shortened, batch production is easy, the universality is high, and the calibration result is reliable.

The invention provides a reflection type multi-target targeting coordinate testing device and method, and relates to the field of photoelectric testing and weapon shooting range testing. The reflection type multi-target targeting coordinate testing device comprises a main body frame and an upper computer, wherein the testing device is composed of two linear lasers, two cylindrical reflectors, a four-side rectangular reflector, two L-shaped photosensitive diode coding arrays and two signal acquisition instruments; the two linear lasers are located at the two ends of the lower portion of the testing device respectively; a laser light source forms a fan-shaped light curtain at an angle of 90 degrees through the cylindrical reflectors; and the fan-shaped light curtain is subjected to mirror reflection through a rectangular reflector method to form a detection light curtain. The reflection type multi-target targeting coordinate testing device and method can be used for testing the targeting coordinates of a plurality of small-caliber bullets of a continuous firing weapon with high precision, and reliable data support is provided for research of a high-radio-frequency continuous firing weapon.

The invention relates to the technical field of photoelectric testing, in particular to a splicable collimation-like light curtain light source device and a splicing method thereof. The invention aims to solve the problems of how to form a large-size safety light curtain and poor light source collimation in detection. According to the technical scheme, the device comprises a Powell prism support, a Powell prism, a point laser, a Fresnel lens, an upper clamping plate, a lower clamping plate and a diaphragm. The diaphragm piece is arranged between the upper clamping plate and the lower clamping plate and can move left and right along the lower clamping plate, the Fresnel lens and the Powell prism are arranged on the front side and the rear side of the diaphragm piece respectively, the focus of the Fresnel lens coincides with the focus of the Powell prism, and the point laser is arranged at the front end of the Powell prism. And emergent light coincides with the optical axis of the Powell prism, and the Fresnel lens, the point laser and the Powell prism are connected into a whole through the lower clamping plate and the upper clamping plate.

The invention discloses a light curtain array outer ballistic parameter testing device which comprises a light curtain array detector, an upper computer signal processing and control device and a photoelectric signal acquisition device. According to the invention, a non-contact photoelectric test principle is applied, the outer ballistic trajectory parameters after the projectile is launched can be accurately tested in a multi-light curtain array mode, the functions of traditional test equipment are enriched, and the device has the advantages of high test precision, simplicity and convenience in operation, high real-time performance and the like.

The invention provides a photoelectric testing device of a COB LED device. The photoelectric testing device comprises the COB LED device, an integrating sphere, a photoelectric sensor, an illuminometer, a COB LED tester and a display. When the integrating sphere carries out photoelectric testing on the COB LED device, photoelectricity of different colors of the COB LED device is tested, one-time testing is carried out on the color and the brightness of the COB LED, a relative value is read to serve as a standard value, the upper limit and the lower limit of the standard value are set, then the relative values of the to-be-tested COB LEDs are read in batches and compared with the standard value, and therefore good products and defective products are judged. The testing precision is effectively guaranteed, on-line testing and function testing of the COB LED tester are combined, testing stations do not need to be added, efficiency is improved, rapidness and full automation are achieved, and man-made missed judgment is avoided.

The invention discloses an in-situ frozen soil ice water component identification and dynamic tracing photoelectric test system and method. The test system comprises a photoelectric sensing test assembly, a data demodulation analysis system and a self-contained pulse power supply control system. The photoelectric sensing test assembly comprises a plurality of photoelectric sensing test units which are connected in series; the photoelectric sensing test unit comprises a variable-temperature ultra-weak fiber bragg grating sensing optical cable and a plurality of frequency domain reflection probes, and the frequency domain reflection probes correspond to the variable-temperature ultra-weak fiber bragg grating sensing optical cable measuring points. Through ultra-weak fiber grating temperature sensing and frequency domain reflection technologies, based on the pulse temperature change and multiphase heat dissipation principle, and through the relation between the frozen soil temperature response value and the soil body heat conductivity coefficient, the moisture content and the ice content, ice water components in the in-situ frozen soil are identified, and moisture field parameters are accurately measured; the frozen soil ice and water component identification and dynamic tracing are realized, the problem that parameters are difficult to measure due to unstable frozen soil properties is solved, and the method has the advantages of small disturbance, distribution, real-time performance and automation.

The invention discloses a tera-hertz photoelectric characteristic test system capable of realizing multiple test functions on photoelectric characteristics and the like of Fourier spectra, transmittance spectra, reflection spectra and tera-hertz electronic devices by combination of various customized light sources and detectors, light path components selected by a user, and addition of peripheralauxiliary equipment. The tera-hertz photoelectric characteristic test system has the advantages of high signal-to-noise ratio, high resolution, strong expandability, low cost and the like, and can bewidely suitable for tera-hertz technical research, new material research, environmental detection and biomedical analysis. In the tera-hertz photoelectric characteristic test system, the light paths,circuits and control of the spectra and photoelectric response test system are subjected to design optimization and systematic integration; compact and reasonable optical, mechanical and vacuum cavity structures are designed; computer controlled accurate mechanical scanning and data acquisition are adopted; and finally the aim of testing and analyzing tera-hertz photoelectric characteristics of materials and core devices such as tera-hertz light sources and detectors by using combination of various light sources and detectors can be fulfilled.

The invention belongs to the technical field of photoelectric testing, and particularly relates to a variable-interval laser narrow pulse combined capturing system and method. The device has the characteristics of configurable trigger parameters, settable sampling rate and high sampling rate, is suitable for capturing narrow pulse signals which cannot predictably master the emission law, and mainly solves the problems of capturing and collecting variable-interval laser narrow pulses. According to the technology, a high-speed data acquisition module with a high-sensitivity trigger is adopted to form a laser pulse acquisition system. According to the invention, the high-sensitivity trigger is adopted to capture the laser narrow pulse, the high-sensitivity trigger has a pulse width and amplitude combined triggering function, and the high-sensitivity trigger is reasonably configured according to the characteristic parameters of the laser narrow pulse, so that the laser narrow pulse signal can be effectively captured, it is ensured that the high-speed data acquisition module can acquire effective laser pulse waveform data, and the reliability of the laser pulse acquisition system is ensured.

The invention provides an accelerated test device and method for a quantum dot photodetector under vacuum and low temperature, which has simple test steps, high efficiency and low test error. The test device of the invention can simulate the vacuum and low temperature environment in space, use ultraviolet light to irradiate the photoelectric device to accelerate the aging, and automatically conduct regular tests and record data, so as to obtain the performance degradation test data of the quantum dot photodetector in the simulated vacuum and low temperature environment. In the test device of the invention, a sustainable UV lamp is placed in the quantum dot photodetector container, which can realize the function of ultraviolet accelerated aging; a vacuum gauge and a temperature sensor are placed outside the quantum dot photodetector container, which can monitor the temperature and temperature of the simulated environment in real time. The vacuum degree changes to monitor the test situation; the integrated automatic photoelectric test module can realize the automatic test of the photoelectric performance of the photodetector, and has a complete system and function. The test method based on the device of the present invention is reasonable and achievable.

The invention discloses a Ga 2 o 3 The preparation method of the deep ultraviolet detector mainly solves the problems of high reaction temperature and complex equipment process in the prior art. The implementation plan is: 1. Prepare the precursor gallium acetylacetonate aqueous solution; 2. Clean the sapphire substrate; 3. Ultrasonic atomize the precursor gallium acetylacetonate aqueous solution through Mist-Cvd equipment, and put it on the cleaned sapphire substrate Heating grows to Ga 2 o 3 thin film; 4. Ga 2 o 3 Make electrode pattern on the sample of thin film; 5. On the Ga with electrode pattern 2 o 3 Fabricate metal electrodes on the film to complete the Ga 2 o 3 Fabrication of deep ultraviolet detectors. The process of the invention is simple and easy to realize, that is, a high-quality thin film can be obtained in a short time only at a relatively low synthesis temperature. Photoelectric tests show that the deep ultraviolet photodetector made by the invention has high responsivity and fast response time, and can be used in the preparation of detectors.

The invention discloses a device and a method for testing a delay index of observing and aiming equipment, and belongs to the technical field of photoelectric testing. The device for testing the delayindex of the observing and aiming equipment comprises a base, a millisecond meter, a plane mirror, a combined prism and a camera. The base is used for fixing tested equipment. A millisecond meter isarranged on one side of the base. The plane mirror is movably arranged on the base. The combined prism is arranged at the front end of an eyepiece of the tested equipment. The camera is placed on oneside of the base, and the camera, the combined prism and an ocular lens of the measured equipment are located on the same straight line. According to the device and method for testing the time delay index of the observing and aiming equipment, the testing speed is high, the tested equipment does not need to specially design a testing interface, the whole machine does not need to be disassembled, testing data is in the same picture, testing is visual, and processing and storage are facilitated. The device has good universality, and positioning and installation can be carried out according to different tested equipment. Only the support needs to be improved, and infrared equipment, low-illumination CMOS equipment, head-mounted display equipment and the like can be tested.

The invention relates to the field of LED tests of LED photoelectric comprehensive testers, in particular to a calibration method of an LED photoelectric comprehensive tester. The LED photoelectric comprehensive tester comprises an integrating sphere, a photoelectric detector, an A / D circuit and a test control system. The calibration method comprises following steps of measuring wavelength errors, wavelength repeatability, color and temperature errors, luminous flux errors, light intensity errors, forward voltage errors, forward current errors, backward voltage errors and backward leakage current errors of the to-be-calibrated LED photoelectric comprehensive tester; and carrying out wavelength calibration, color and temperature calibration, luminous flux calibration, light intensity calibration, forward electrical performance calibration and backward electrical performance calibration on the to-be-calibrated LED photoelectric comprehensive tester. According to the invention, various photoelectric test parameters can be calibrated simultaneously without professional calibration tools; calibration processes are simple; calibration cost is reduced; calibration time is reduced and energy is saved; and accuracy and efficiency of the calibration are improved.

The embodiment of the invention provides an optical alignment method for machining of plate-like products. The method comprises following steps: arranging photoelectric sensors on an X axis and a Y axis of an L-shaped photoelectric testing platform; moving an object-carrying platform along an X axis of the L-shaped photoelectric testing platform and stopping till the state of any photoelectric sensor changes in an Y axis; moving the object-carrying platform along an Y axis; calculating the movement distance of the object-carrying platform along the Y axis; calculating deviation angles of an X direction of an edge of a to-be-machined substrate and an X axis; rotating the object-carrying platform at a deviation angle such that the edge of the X axis of the to-be-machined substrate runs parallel to the X axis; and ordering the object-carrying platform along the X axis and the Y axis and moving the to-be-machined substrate to the specific position and finishing alignment. The method is utilized so that alignment of the to-be-machined substrate is achieved. Compared with the conventional method of utilizing coordinate calcuactions, accuracy and easiness are obtained.

The invention discloses a rapid judgment system and method for mutual influence of filament and lampshade performance, and solves the problem that defective products in materials and semi-finished products cannot be quickly found in the early stage in the prior art. The system comprises a lamp wick column serving as a tested device and a bulb shell, wherein the bulb shell covers the lamp wick column. The system also comprises a special jig which is used for limiting the mutual position between the bulb shell and the lamp wick column; the jig comprises an outer shell, and a hole and a pluralityof groups of metal clamping rings are arranged on the outer shell; the lamp wick column is fixed in the hole, the metal clamping rings are arranged around the hole, and the outer shell covers the outer shell of the metal clamping rings. According to the invention, the special tool is used in the rapid determination system and method; the special jig limits the positions of the bulb shell and thelamp wick column to be installed on photoelectric testing equipment to be tested, a rapid judgment method is further provided for the rapid judgment system, the system and the method can rapidly verify whether parameters between the lamp filament and the bulb meet requirements or not, defective products in semi-finished products are found in the early stage, and the production efficiency is improved.

The embodiment of the invention discloses a cold trap device, which is used for a photoelectric test system and comprises a cold trap and a base assembly, the cold trap comprises a shell, the shell comprises an outer sleeve and an inner sleeve, the outer sleeve is sleeved outside the inner sleeve, the inner sleeve is provided with an accommodating cavity, and a vacuum interlayer is arranged between the outer sleeve and the inner sleeve; the base assembly comprises a sample base, a heat conduction plate and a heat insulation layer, the heat insulation layer is covered with the shell, the samplebase is arranged in the containing cavity, one end of the heat conduction plate is connected with the sample base, and the other end of the heat conduction plate is connected with external refrigeration equipment and used for adjusting the temperature in the containing cavity; wherein the cold trap further comprises a base, the base assembly is installed on the base, and the cold trap device is detachably installed on the photoelectric test system through the base.