The invention, which belongs to the technical field of photoelectric testing, relates to an integral time control method of a CCD photoelectric detector, particularly to an adaptive light intensity type integral time control method of a CCD photoelectric detector. The method comprises the following steps that: step one, initial integral time is set as ti, wherein the ti is larger than tmin and smaller than tmax; step two, spectral signal [s1, s2,... and Sm] are collected and a spectral signal mean value savg is calculated; step three, a spectral noise sigma dark is collected and calculated; and step four, a size relation between the savg and delta. sigma dark is determined, wherein the delta expresses a dark noise influence factor, the integral time is set to be tj if the delta. sigma darkis larger than the savg, wherein the tj is larger than the tmin and smaller than the tmax and is not equal to the ti; and the step one is performed again; and if the savg is greater than or equal tothe delta. sigma dark, spectral signal denoising is carried out and then integral time setting is carried out. According to the method, the integral time is adaptively adjusted according to the illumination intensity and the integral time is adaptively adjusted by considering the influence of dark noises on the output signal; and the speed is high, the precision is high, and the method has adaptability. The method can be applied to automatic testing, rapid testing and other occasions.