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19 results about "Phototesting" patented technology

Special tests used to measure the reaction of the skin to ultraviolet radiation. Phototesting is being used to see if drugs taken by mouth to treat cancer make the skin more sensitive to ultraviolet radiation.

Detection equipment and detection method for CD-ROM integrated light-emitting device

The invention provides a CD-ROM integrated light-emitting device detection device and a detection method thereof.The CD-ROM integrated light-emitting device comprises a carrier plate, an LED chip, a driving chip and a plurality of pins, the detection device comprises a workbench, a visual mechanism, a probe mechanism and an integrating sphere, the workbench comprises a transparent bearing plate, and when the CD-ROM integrated light-emitting device is borne on the transparent bearing plate, the LED chip is driven by the probe mechanism to rotate; the LED chip is positioned on one side, close to the transparent bearing plate, of the carrier plate; the visual mechanism is arranged above the transparent bearing plate and is used for acquiring image information; the probe mechanism is used for electrically connecting a probe with a pin in the CD-ROM integrated light-emitting device according to the image information so as to carry out an electrical test on the CD-ROM integrated light-emitting device; the integrating sphere is arranged below the transparent bearing plate and used for receiving emergent light of the LED chip so as to carry out optical testing on the CD-ROM integrated light-emitting device, and the detection equipment and the detection method of the CD-ROM integrated light-emitting device have the advantage of being high in photoelectric testing efficiency.
Owner:HGC (WUHAN) TECH CO LTD

Preparation method and application of high-sensitivity photoelectric detector based on Cr2Ge2Te6

PendingCN120751786APhototestingTitanium electrode
The invention discloses a preparation method and an application of a high-sensitivity photoelectric detector based on Cr2Ge2Te6. The design method comprises the following steps of: obtaining single-layer or few-layer Cr2Ge2Te6 by using a silver-assisted stripping method, and transferring the single-layer or few-layer Cr2Ge2Te6 to a clean SiO2 / Si substrate by using a PDMS / PVA (Polydimethylsiloxane / Polyvinyl Alcohol) film; and finally, plating titanium at two ends of the Cr2Ge2Te6 to serve as metal electrodes. The structure of the prepared photoelectric detector is a titanium electrode / Cr2Ge2Te6 / titanium electrode. According to the test of a photoelectric test probe station, under the condition that the voltage of the electrodes at the two ends ranges from-1 V to 1 V, lasers with different wavelengths and different powers are additionally arranged on the Cr2Ge2Te6 photoelectric detector, the Cr2Ge2Te6 photoelectric detector can detect visible light (405 nm, 532 nm and 635 nm) and near-infrared light (808 nm) with the optical power density of 30-50 [mu] W / cm < 2 >, and light current is improved by one order of magnitude compared with dark current under weak laser irradiation.
Owner:GUANGDONG UNIV OF TECH

A device and method for measuring the side profile of a conical workpiece

ActiveCN115574735BUsing optical meansPhototestingLinear Scan
The present invention discloses a device and method for measuring the side profile of a conical workpiece, and belongs to the field of photoelectric testing. The device for measuring the side profile of a conical workpiece includes a cylindrical light source, a collimating lens, a reflector, a digital micromirror device, and a surface array CCD. The micromirror element array of the digital micromirror device is controlled to present a horizontal reflection slit; the surface array CCD receives parallel light that is not blocked by the side of the conical workpiece and records data. Compared with the prior art, the device for measuring the side profile of a conical workpiece provided by the present invention is not limited by the minimum change in the rotation angle of the reflector, and the displacement scanning is linear, and the scanning accuracy is effectively improved.
Owner:GUANGDONG OCEAN UNIVERSITY

Multi-light-source signal simulation system

The invention relates to the technical field of photoelectric testing, in particular to a multi-light-source signal simulation system. The embodiment of the invention provides a multi-light-source signal simulation system. The multi-light-source signal simulation system comprises a radiation unit, a pitching adjustment module and a control module, the radiation unit comprises an infrared radiation module used for providing infrared radiation, a visible light module used for providing visible light and an ultraviolet module used for providing ultraviolet radiation, and the infrared radiation module, the visible light module and the ultraviolet module are integrated on the same plane. The infrared radiation module comprises a pitching adjusting module and a control module, the pitching adjusting module is used for adjusting the pitching angle of the radiation unit, the control module is used for controlling each module in the radiation unit to emit / stop radiation and collecting the temperature of the infrared radiation module, and the control module is further used for controlling the pitching adjusting module to adjust the pitching angle of the radiation unit. The embodiment of the invention provides a multi-light-source signal simulation system which can provide and simulate multi-band signals.
Owner:BEIJING INST OF ENVIRONMENTAL FEATURES

A multi-band photoelectric system tracking performance testing device and method

ActiveCN117516872BPhototestingRotational axis
The application discloses a kind of multi-band photoelectric system tracking performance testing device, including support platform, coaxial connection's multi-band simulation infinite target and precision rotary shaft system, the outlet of precision rotary shaft system is equipped with reflected light path, and the light of multi-band simulation infinite target converges to the photoelectric system to be measured after passing through precision rotary shaft system and reflected light path.The application also discloses a kind of multi-band photoelectric system tracking performance testing method, steps are as follows: one: reflected light path forms conical light path;Two: establish spherical coordinate system, define rotation axis and multiple included angles;Three: obtain the azimuth and elevation of the photoelectric system to be measured theoretically;Four: obtain the angle true value of the photoelectric system to be measured, compare the error between the azimuth and elevation of the photoelectric system to be measured theoretically.The application can make up the deficiency of existing photoelectric testing method in the range of visible light in outdoor and indoor simulation image target testing, and can be widely applied in photoelectric navigation and testing technical field.
Owner:CENT CHINA OPTOELECTRONICS TECH RES INST (CHINA STATE SHIPBUILDING CORP 717TH RES INST)

Photoelectric integrated test system and photoelectric test method

The present invention relates to the field of photoelectric testing, and in particular to an integrated photoelectric testing system and a photoelectric testing method, comprising a testing mechanism, including a frame, a darkroom fixed on the top of the frame, a photoelectric testing assembly installed on the inner wall of the darkroom, a bottom cover located on the inner side of the frame, a detection member movably embedded in a recessed portion of the bottom cover surface, and a clamping member located on the surface of the detection member; and a driving mechanism, comprising a reduction motor installed on the lower surface of the frame. The present invention cooperates between a driving member, a positioning member, and an adapter, and under the rotation of a single driving member, the motion state of the detection disk can be changed through the adapter, thereby realizing automatic switching between different photoelectric detection processes, satisfying the motion switching of the detection disk from self-rotation to ascent and then self-rotation, making the device more convenient and efficient in detecting photoelectric elements, and realizing drive through a single driving unit, which can reduce the operating fixed faults of the device.
Owner:WUXI UNIV

Equipment and method for rapidly testing optical-piezoelectric properties of coating-free field in-situ environment sample

The invention relates to equipment and a method for rapidly testing optical and piezoelectric properties of a coating-free field in-situ environment sample. The equipment comprises an electrolytic tank, an electrochemical testing electrode system, a light source, a stirrer and an electrochemical workstation. The electrolytic tank is provided with a sample injection hole, and a natural environment sample can be directly injected, so that the sample is in direct contact with the internal electrochemical test electrode system. The light source provides controllable illumination and cooperates with the electrode system for photoelectric testing. And the stirrer applies controllable mechanical shearing force to the sample so as to cooperatively complete the piezoelectric test. The electrochemical work station is responsible for applying a preset electric signal, controlling on-off of a light source and the rotating speed of a stirrer and collecting photoelectric and piezoelectric I-T curve data. According to the equipment, the sample is treated without coating, the pretreatment time consumption is reduced, the test can be quickly completed on site, and an effective tool is provided for environmental pollutant degradation mechanism research and environmental capacity evaluation.
Owner:TSINGHUA SHENZHEN INTERNATIONAL GRADUATE SCHOOL

Smoke interference equivalent diffuse reflectance evaluation method and system based on laser back scattering

PendingCN121596257AWave based measurement systemsPhototestingRadar
The invention discloses a smoke interference equivalent diffuse reflectance evaluation method and system based on laser back scattering. The method belongs to the technical field of photoelectric test measurement, environmental optics and laser radar. The method comprises the following steps: acquiring a first echo signal in a smokeless environment through a pulse laser detection device; establishing a reflectivity-echo peak calibration relation F according to the first echo signal; acquiring a second echo signal in the smog environment through a pulse laser detection device; mapping the second echo signal into a reflectivity-echo peak value calibration relation F to obtain an equivalent diffuse reflection rate value; and the diffuse reflectance value is used as a quantitative index for evaluating the interference degree of the smoke on the pulse laser detection system. According to the invention, the backscattering interference effect of the smoke is equivalent to an echo effect generated by a standard diffuse reflection target plate with specific reflectivity at the same distance, so that an intuitive, reliable and quantifiable key index is provided for evaluating and predicting the performance of a pulse laser system in a smoke environment.
Owner:LISHUI UNIV

Test system

The utility model discloses a test system, which comprises a test device and an assembly to be tested, and is characterized in that the test device is used for testing the assembly to be tested; the test device comprises an aging test assembly and a photoelectric test assembly. The aging test assembly comprises a base and an experiment box, the base is provided with a plurality of first wire clamping slots distributed at intervals, and the size of the base is matched with that of the experiment box; the photoelectric test assembly comprises a test clamp and a detection mechanism, the test clamp comprises a first platform part and a second platform part, and the first platform part is matched with the detection mechanism in size; the to-be-tested assembly comprises a plurality of substrates and LED lamp beads welded to the substrates, connecting cables are arranged below the substrates, and the substrates are electrically connected with the first wire clamping grooves through the connecting cables; the substrate is electrically connected with the second wire clamping slot through a connecting cable; according to the utility model, the substrate is supported by the connecting cable, the heat dissipation path is single, and photoelectric data is more stable and accurate after the LED lamp beads are subjected to aging test.
Owner:JIANGXI MTC OPTOELECTRONICS CO LTD

Photoelectric test tool for multichannel intensity modulator

The utility model relates to a multichannel intensity modulator photoelectric testing tool, which belongs to the technical field of intensity modulator photoelectric testing and comprises a control case body, a testing component and a placing component are mounted on the front side of the control case body, and the testing component and the placing component are mounted on the front side of the control case body. The placing assembly comprises eight fixing cylinders fixed to the front face of the control case body, adjusting rods slidably connected to the inner sides of the fixing cylinders, a placing plate fixed between one ends of the front faces of every two corresponding adjusting rods, and a limiting frame fixed to the front face of the placing plate. The non-slip mat is bonded to the front face of the placing plate and located on the inner side of the limiting frame, the threaded rod penetrates through and is in threaded connection with the outer side of the fixing barrel, the fixing block is fixed to the side, away from the corresponding fixing barrel, of the threaded rod, and the handle is fixed to the side, away from the corresponding fixing barrel, of the fixing block. According to the photoelectric test tool for the multichannel intensity modulator, test workpieces can be conveniently and differentially placed.
Owner:CHONGQING WEI SI WO TECH CO LTD

A method for realizing reference measurement and conversion based on a single theodolite

ActiveCN118857340BSurveying instrumentsTheodolitesPhototestingTheodolite
The application discloses a method for realizing reference measurement and conversion based on a single theodolite, and is applied to the technical field of photoelectric testing. The method comprises the following steps: acquiring normal vectors of a plane mirror, reference vectors and to-be-measured vectors at first and second observation points respectively; obtaining two groups of coefficient arrays through conversion of the first reference vector and the first to-be-measured vector in a first coordinate system; similarly, obtaining another two groups of coefficient arrays through conversion of the second reference vector and the second to-be-measured vector in a second coordinate system; obtaining a conversion relationship of the to-be-measured vector in a reference coordinate system based on the four groups of coefficient arrays, and then determining a conversion relationship between a to-be-measured coordinate system and the reference coordinate system; and precise space vector measurement and coordinate system conversion are realized by using the single theodolite.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Bi2wo6 / bi2mo6 photocatalyst, preparation method thereof and photoelectrocatalytic application thereof

The application discloses a Bi2WO6 / Bi2MoO6 photocatalyst and a preparation method and photoelectrocatalytic application thereof, and belongs to the technical field of photoelectrocatalytic materials. The Bi2WO6 / Bi2MoO6 microspheres with high specific surface area are prepared by a solvothermal synthesis method, and the mixed photocatalyst has outstanding performance in terms of solar absorption, photoelectric conversion and photoelectrocatalysis. Photoelectric tests show that the photoelectrode of the sample has high instantaneous visible light photoelectric current and low interface impedance. The rate constants of photoelectrocatalytic degradation of rhodamine B and methylene blue are 1.65*10 ‑2 min ‑1 and 3.78*10 ‑2 min ‑1 respectively. In addition, the sample also has high reduction performance on Cr 6+ under visible light irradiation, and the photoelectrocatalytic efficiency reaches 68.57% after 160 minutes of irradiation. The excellent photoelectrochemical performance is mainly due to high photoelectron separation and transmission caused by the Z-type heterojunction structure.
Owner:CHINALAND SOLAR ENERGY

Test and sort apparatus with LEDs placed inside an integrating sphere

PendingCN122141965ASortingPhototestingLuminous flux
The application belongs to the technical field of photoelectric testing, and discloses a testing and sorting device with an LED placed inside an integrating sphere, which comprises a material moving assembly, a material feeding station, a centering station, a testing station and a material discharging station. The centering station comprises a mechanical centering assembly, which comprises a centering mold and a centering mold driving member. The centering mold is used for clamping the material to be tested, and the centering mold driving member is used for driving the centering mold to move so as to center the material to be tested on the carrier. The testing station is used for measuring the energized test data of the material to be tested, and comprises an integrating sphere, a probe base and a jacking assembly. The probe base is arranged inside the integrating sphere, and comprises a probe. The jacking assembly is used for pushing the carrier to move upwards so that the material to be tested enters the inside of the integrating sphere and abuts against the probe. The material discharging station is used for sorting the tested material from the carrier according to the energized test data. The application realizes effective collection and stable measurement of full-angle light parameters of side-emitting products, and significantly improves the testing accuracy and repeatability of key indicators such as luminous flux and light intensity distribution.
Owner:SHENZHEN HI TEST SEMICON EQUIP

In-situ tensile testing device and method for stretchable photoelectric conversion device

The invention belongs to the technical field of organic photovoltaic cell testing, and discloses an in-situ tensile testing device and method for a stretchable photoelectric conversion device. Comprising a stretching fixing and electric signal conduction device, a stretching movement conduction device, a movement control data transmission device, a telecommunication and instrument transmission device, a reverse detection electric signal transmission fixing device, a stretching distance control monitoring and movement control device and a stretching movement device. The invention develops the in-situ stretching test device for the stretchable photoelectric conversion device, and the device can achieve the function integration of stretching motion and a photoelectric test clamp, so that the stretchable photoelectric conversion device can achieve the compatibility of stretching and photoelectric test. And an accurate test scheme is provided for the in-situ stretching test of the stretchable photoelectric conversion device.
Owner:TIANJIN UNIV

Testing device for photo-thermal photoelectric integrator

The utility model relates to the field of photo-thermal photoelectric integrator testing, and provides a photo-thermal photoelectric integrator testing device. The photo-thermal photoelectric integrator testing device comprises an enthalpy difference chamber, an air processing assembly, a wind speed adjusting assembly, an illumination adjusting assembly and a to-be-tested integrator are arranged in the enthalpy difference chamber, and the wind speed adjusting assembly and the illumination adjusting assembly are arranged between the first side of the to-be-tested integrator and the air processing assembly; the photoelectric test assembly is electrically connected to the second side of the to-be-tested integrator so as to detect the photoelectric performance of the to-be-tested integrator; and the photo-thermal testing assembly is in fluid communication with the second side of the to-be-tested integrator so as to detect the photo-thermal performance of the to-be-tested integrator. According to the photo-thermal and photoelectric integrator testing device, the photo-thermal performance and the photoelectric performance of the to-be-tested integrator are synchronously and rapidly tested, the testing period is greatly shortened, the testing efficiency is improved, and the research, development and production progress of the integrator can be accelerated.
Owner:BEIJING BUILDING MATERIAL INSPECTION RES INST CO LT

Testing device and testing method for photo-thermal photoelectric integrator

The invention relates to the field of photo-thermal and photoelectric integrator testing, and provides a photo-thermal and photoelectric integrator testing device and a photo-thermal and photoelectric integrator testing method. The photo-thermal photoelectric integrator testing device comprises an enthalpy difference chamber, an air processing assembly, a wind speed adjusting assembly, an illumination adjusting assembly and a to-be-tested integrator are arranged in the enthalpy difference chamber, and the wind speed adjusting assembly and the illumination adjusting assembly are arranged between the first side of the to-be-tested integrator and the air processing assembly; the photoelectric test assembly is electrically connected to the second side of the to-be-tested integrator so as to detect the photoelectric performance of the to-be-tested integrator; and the photo-thermal testing assembly is in fluid communication with the second side of the to-be-tested integrator so as to detect the photo-thermal performance of the to-be-tested integrator. According to the photo-thermal and photoelectric integrator testing device, the photo-thermal performance and the photoelectric performance of the to-be-tested integrator are synchronously and rapidly tested, the testing period is greatly shortened, the testing efficiency is improved, and the research, development and production progress of the integrator can be accelerated.
Owner:BEIJING BUILDING MATERIAL INSPECTION RES INST CO LT

Rapid in-situ field coated and uncoated environmental sample photo- piezoelectric performance testing apparatus and method

A kind of quick test equipment and method of in-situ environmental sample photo-piezoelectric performance without coating, the equipment includes electrolytic cell, electrochemical test electrode system, light source, stirrer and electrochemical workstation.Electrolytic cell is provided with sample injection hole, and natural environment sample can be directly injected, so that the sample is directly contacted with internal electrochemical test electrode system.Light source provides controllable light, and photoelectric test is carried out in cooperation with electrode system;Stirrer applies controllable mechanical shear force to sample, and completes piezoelectric test in cooperation.Electrochemical workstation is responsible for applying preset electrical signal, controlling light source opening and closing and stirrer speed, and collecting photoelectric and piezoelectric I-T curve data.The equipment is free of coating treatment sample, reduces pre-treatment time consumption, can complete test quickly on site, provides effective tool for environmental pollutant degradation mechanism research and environmental capacity assessment.
Owner:TSINGHUA SHENZHEN INTERNATIONAL GRADUATE SCHOOL

Attenuating sheet, method of making, attenuating sheet wheel assembly, test system and test method

The application relates to the fields of infrared optical film technology and precise photoelectric testing technology, and provides an attenuating piece, a preparation method, an attenuating piece wheel assembly, a testing system and a testing method. The application utilizes a first attenuating piece group and a second attenuating piece group to form an attenuating piece, each first attenuating piece in the first attenuating piece group adopts a zinc selenide base material and a nickel film and has high spectral transmittance; each second attenuating piece in the second attenuating piece group adopts a silicon base material, a gold film and a chromium adhesion layer and has high spectral transmittance; the attenuating piece is applied to an infrared detector nonlinearity testing system, different first attenuating pieces and second attenuating pieces can be combined to construct an attenuating assembly with a large dynamic range. The testing system using the attenuating piece can realize automatic scanning of incident photon flux density across more than four orders of magnitude, solves the problems of preparation and system integration of a mid-wave large dynamic range attenuating device, and improves the efficiency and reliability of infrared detector response nonlinearity testing.
Owner:SHANGHAI INSTITUTE OF TECHNICAL PHYSICS CHINESE ACADEMY OF SCIENCES

A device and method for rapid initial wavelength positioning of a tunable laser source

The application provides a tunable laser source initial wavelength fast positioning device and method, relates to the field of photoelectric testing technology, and comprises a motor, a light shield plate, a light unit and a light detector array; the output shaft tail end of the motor is connected with the light unit, drives the rotation of the internal reflector of the light unit, and the light unit outputs a wavelength monitoring value in real time; the coaxial light shield plate is arranged on the output shaft of the motor, and the light shield plate moves left and right along with the rotation of the motor; a plurality of photoelectric detectors are arranged on the light detector array, are arranged longitudinally along the output shaft of the motor, and collect photoelectric detection signals of the light detector array; the light shield plate of the application reaches the optical coupling quickly within a limited number of motor rotations, and cooperates with the light detector array to further improve the positioning speed; the wavelength monitoring function is used to monitor whether the initial wavelength is positioned accurately, and the initial wavelength position can be fine-tuned accordingly, so that the initial wavelength positioning precision is further ensured.
Owner:CHINA ELECTRONIS TECH INSTR CO LTD