Adaptive light intensity type integral time control method of CCD photoelectric detector

A technology of photodetector and integration time, applied in adaptive control, spectrometry/spectrophotometry/monochromator, general control system, etc., can solve the problem of slow speed, weak environmental adaptability, and inability to eliminate dark noise Influence and other issues, to achieve the effect of high speed and high precision

Active Publication Date: 2020-02-18
CHINA ELECTRONIS TECH INSTR CO LTD
View PDF6 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the prior art, the integration time of the spectrometer is usually set manually, that is, the integration time is manually set according to the collected signals and empirical values. The disadvantage of manual setting of the integration time is slow speed and weak environmental adaptability
And the manual setting method cannot eliminate the influence of dark noise on the output signal, thus affecting the precision and accuracy of spectral measurement

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Adaptive light intensity type integral time control method of CCD photoelectric detector
  • Adaptive light intensity type integral time control method of CCD photoelectric detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] In order to facilitate the understanding of the present invention, the present invention will be described in more detail below in conjunction with the accompanying drawings and specific embodiments. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described in this specification. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0027] The CCD photodetector integration time control method of adaptive light intensity provided by this embodiment, the process is as follows figure 1 As shown, the specific steps are as follows:

[0028] Step1: Parameter initialization. According to the maximum and minimum integration time provided by the CCD when it leaves the factory, set the initial integration time as t i , where t min i max ;...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention, which belongs to the technical field of photoelectric testing, relates to an integral time control method of a CCD photoelectric detector, particularly to an adaptive light intensity type integral time control method of a CCD photoelectric detector. The method comprises the following steps that: step one, initial integral time is set as ti, wherein the ti is larger than tmin and smaller than tmax; step two, spectral signal [s1, s2,... and Sm] are collected and a spectral signal mean value savg is calculated; step three, a spectral noise sigma dark is collected and calculated; and step four, a size relation between the savg and delta. sigma dark is determined, wherein the delta expresses a dark noise influence factor, the integral time is set to be tj if the delta. sigma darkis larger than the savg, wherein the tj is larger than the tmin and smaller than the tmax and is not equal to the ti; and the step one is performed again; and if the savg is greater than or equal tothe delta. sigma dark, spectral signal denoising is carried out and then integral time setting is carried out. According to the method, the integral time is adaptively adjusted according to the illumination intensity and the integral time is adaptively adjusted by considering the influence of dark noises on the output signal; and the speed is high, the precision is high, and the method has adaptability. The method can be applied to automatic testing, rapid testing and other occasions.

Description

technical field [0001] The invention belongs to the technical field of photoelectric testing and relates to a method for controlling the integration time of a CCD photodetector. Background technique [0002] As the light-receiving device in the spectrum analyzer, the CCD photodetector can realize the photoelectric conversion of the signal, and has become the focus of research due to its advantages of low power consumption, low operating voltage, stable performance, high sensitivity, and large dynamic range. With the miniaturization and intelligent development of the spectrometer, higher requirements are put forward for the control of the integration time of the CCD photodetector. [0003] The electrical signal output by the CCD photodetector is proportional to the light intensity and the integration time. Under the condition of a certain integration time, when the light intensity is too strong, the signal overflows, which causes the measured spectrum to be distorted; when th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/02G05B13/04
CPCG01J3/02G05B13/042
Inventor 鞠军委徐桂城吴威徐玉华张一琪陈晓峰聂建华张志辉闫继送
Owner CHINA ELECTRONIS TECH INSTR CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products