Accelerated test device and method for quantum dot photodetector under vacuum and low temperature

A photodetector and accelerated test technology, applied in the field of vacuum simulation, can solve the problems of cumbersome steps, long test process, manpower and material resources, etc., and achieve a reasonable effect of the test method

Active Publication Date: 2022-07-12
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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Problems solved by technology

Due to its characteristics, the vacuum low temperature test cannot be accelerated, and the test process is long and the steps are cumbersome, requiring a lot of manpower and material resources

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  • Accelerated test device and method for quantum dot photodetector under vacuum and low temperature

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Embodiment Construction

[0032] The present invention will be described in detail below with reference to the accompanying drawings and embodiments.

[0033] Photodetectors based on quantum dots and ligand systems will accelerate aging under the long-term action of ultraviolet light, reducing the photoelectric conversion efficiency of the device. Therefore, the use of ultraviolet accelerated test technology can speed up the aging life test of this new device. Based on the above reasons, in order to meet the life test requirements of quantum dot photodetectors in a vacuum and low temperature environment, an automatic test device and test method for accelerated aging using ultraviolet rays in a vacuum and low temperature simulation device are provided, which can make the detector in space. The performance in the vacuum and low temperature environment is simulated.

[0034] The device and method for accelerated testing of quantum dot photodetectors in a vacuum and low temperature of the present invention...

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Abstract

The invention provides an accelerated test device and method for a quantum dot photodetector under vacuum and low temperature, which has simple test steps, high efficiency and low test error. The test device of the invention can simulate the vacuum and low temperature environment in space, use ultraviolet light to irradiate the photoelectric device to accelerate the aging, and automatically conduct regular tests and record data, so as to obtain the performance degradation test data of the quantum dot photodetector in the simulated vacuum and low temperature environment. In the test device of the invention, a sustainable UV lamp is placed in the quantum dot photodetector container, which can realize the function of ultraviolet accelerated aging; a vacuum gauge and a temperature sensor are placed outside the quantum dot photodetector container, which can monitor the temperature and temperature of the simulated environment in real time. The vacuum degree changes to monitor the test situation; the integrated automatic photoelectric test module can realize the automatic test of the photoelectric performance of the photodetector, and has a complete system and function. The test method based on the device of the present invention is reasonable and achievable.

Description

technical field [0001] The invention belongs to the technical field of vacuum simulation, and in particular relates to an accelerated test device and method of a quantum dot photodetector under vacuum and low temperature. Background technique [0002] Quantum dot photodetector is a new type of photodetector device developed for more than 10 years in the 21st century. Photodetectors based on quantum dot materials have a series of advantages such as high responsivity, large detection bandwidth, and low volume power consumption; they can also achieve infrared detection at room temperature, reducing the refrigeration pressure of the detector module, especially in the space load integration. Under more demanding conditions, it has great advantages; in addition, the device preparation process is simple and easy, low cost, and compatible with existing microelectronic processes, it is very suitable for large-scale industrial production, and it will be possible to completely replace ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J1/42
CPCG01J1/42Y02P70/50
Inventor 王小军龚成师杨生胜乔世英李丹明李得天
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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