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Calibration method and related calibration apparatus for capacitor array

A correction method and a correction device technology, which are applied in the field of capacitor array correction and capacitor array correction devices, can solve problems affecting ADC sampling rate and conversion speed, and achieve the effects of reducing cost and power consumption, and reducing redundant circuits

Inactive Publication Date: 2011-06-01
MEDIATEK INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

As a result, the correction operation significantly affects the sampling rate and conversion speed of the ADC, which is obviously a shortcoming of the traditional capacitor correction technology for capacitor arrays, which needs to be solved urgently

Method used

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  • Calibration method and related calibration apparatus for capacitor array
  • Calibration method and related calibration apparatus for capacitor array
  • Calibration method and related calibration apparatus for capacitor array

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Embodiment Construction

[0014] Certain terms are used throughout the description and claims to refer to particular components. Those skilled in the art should understand that a manufacturer may use different terms to refer to the same component. The specification and claims do not use the difference in name as a way to distinguish components, but use the difference in function of components as a distinguishing criterion. "Includes" mentioned throughout the specification and claims is an open term, so it should be interpreted as "including but not limited to". In addition, the term "coupled" herein includes any direct and indirect means of electrical connection. Through the description of the following preferred embodiments and in conjunction with the full text Figure 2 to Figure 6 The present invention is illustrated, but the devices, components, methods, and steps in the following description are used to explain the present invention, and should not be used to limit the present invention.

[001...

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Abstract

The invention provides a calibration method and a related calibration apparatus for a capacitor array. The calibration method includes: coupling a first node of a calibration capacitor component to the first nodes of the capacitor components; coupling a first reference voltage to a second node of a specific capacitor component under test selected from the plurality of capacitor components, and coupling a first test voltage to a second node of the calibration capacitor component to make a voltage level at the first nodes of the capacitor components fall within a range associated with a predetermined voltage; coupling a second reference voltage different from the first reference voltage to the second node of the specific capacitor component under test, and coupling a second test voltage to the second node of the calibration capacitor component to make the voltage level at the first nodes of the capacitor components fall within a range associated with the predetermined voltage; and determining a capacitance indication value corresponding to the specific capacitor component under test according to the first test voltage and the second test voltage. Also, the present invention uses a relatively simple calculation to complete the calibration process, so less cost as well as power consumption is required.

Description

technical field [0001] The invention relates to a calibration method for a capacitor array and a calibration device for the capacitor array. Background technique [0002] In integrated circuit technology, since capacitors are easier to process than resistors, capacitors are usually used as analog-to-digital converters (analog-to-digital converters, ADCs) or digital-to-analog converters (digital-to-analog converters, DACs) Precision components, this method is called charge redistribution (charge-redistribution) technology. Typically, the linearity of the overall ADC or DAC is limited by the linearity of the capacitors. Therefore, an ADC or DAC with high resolution usually requires some form of trimming or correction to achieve the necessary linearity. It depends on the inherent component matching constraints. The accuracy of A / D or D / A conversion using charge redistribution is primarily determined by the capacitor matching of the capacitor array. To achieve high resolutio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
CPCH03M1/1047H03M1/804
Inventor 廖介伟周家骅徐哲祥张文华
Owner MEDIATEK INC