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Burn-in test method of embedded equipment

A technology of an embedded device and a test method, applied in the field of testing, can solve problems such as reducing test efficiency, and achieve the effect of improving the efficiency of burn-in test

Inactive Publication Date: 2011-07-20
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the previous burn-in test, it was necessary to copy the burn-in test program of the embedded device to the embedded device through the computer, and the operator was required to regularly check the test status of the embedded device through the monitor of the computer
If the embedded device passes the test, the embedded device burn-in test program needs to be removed from the embedded device, which reduces the test efficiency

Method used

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Embodiment Construction

[0013] refer to figure 1 As shown, it is a structure diagram of a preferred embodiment of the embedded device burn-in test method of the present invention. The architecture mainly includes a testing device 1 , an embedded device 2 , a computer 3 and an external storage device 4 . The test equipment 1 , the computer 3 and the external storage device 4 are all connected to the embedded device 2 , and the embedded device 2 includes, but not limited to, a network camera, a router, a switch, and the like. In this preferred embodiment, the embedded device 2 is a network camera. Wherein, an embedded device burn-in test program 40 (hereinafter referred to as "burn-in test program") is installed in the external storage device 4 . After the burn-in test program 40 is started, it will run in the memory 10 of the embedded device 2 . At this point, if the computer 3 is disconnected from the embedded device 2, or the external storage device 4 is disconnected from the embedded device 2 at...

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Abstract

The invention discloses a burn-in test method of embedded equipment, which comprises the steps of: setting test time in a computer and initiating an embedded equipment burn-in test program in external storage equipment so that the embedded equipment burn-in test program runs in the memory of the embedded equipment; disconnecting the computer with the embedded equipment and disconnecting the external storage equipment with the embedded equipment; testing the embedded equipment within the set test time; and marking the test result and powering the embedded equipment off so that the embedded equipment burn-in test program is removed from the memory of the embedded equipment. According to the method of the invention, the embedded equipment burn-in test program in the memory of the embedded equipment can be removed automatically, thereby raising the burn-in test efficiency.

Description

technical field [0001] The invention relates to a testing method, in particular to a testing method for burning-in of an embedded device. Background technique [0002] Improving and ensuring the product quality of embedded devices is an important task for embedded device manufacturers. Before the embedded device products leave the factory, test the performance of the embedded device and find out the problem points, which can effectively guarantee the quality of the embedded device and prevent defective products from entering the market. [0003] Among the various performance tests of embedded devices, there is a burn-in test, which is to turn on the embedded device for a long time and check whether the embedded device can operate normally during the long-time boot process. However, in the previous burn-in test, it was necessary to copy the burn-in test program of the embedded device to the embedded device through the computer, and the operator was required to periodically c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG01R31/287G06F11/24
Inventor 田志海曹朝杰董华
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
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