Verifying environment patterned chip verifying method and device
Patent Information
- Authority / Receiving Office
- CN ยท China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- FENGHUO COMM SCI & TECH CO LTD
- Publication Date
- 2013-01-02
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Abstract
Description
technical field
[0001] The invention relates to the field of EDA (Electronic Design Automation, electronic design automation) verification in the chip design process, in particular to a chip verification method and device with a graphical verification environment. Background technique
[0002] At present, the functional verification of integrated circuits accounts for about 60%-70% of the investment in the entire chip development process, which is one of the keys to the success of the project and a very important part of the entire chip design process. In the design of integrated circuit chips, verification is one of the most complex and time-consuming links in the chip design process, and with the rapid development of microelectronics technology, the scale of ASIC (Application Specific Integrated Circuit, application specific integrated circuit) is increasing The larger the chip, the size of a chip is usually around several million gates or even tens of millions of gates. S...