Light path structure of echelle grating spectrometer

An echelle grating and spectrometer technology, applied in the field of spectroscopy, can solve the problems of inability to realize full-spectrum direct reading and large volume, and achieve the effects of simple and reliable structure, high resolution, and no moving parts

Inactive Publication Date: 2011-10-26
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF2 Cites 25 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, it adopts the traditional scanning and recording method. The spectroscopic optical path system is composed of an echelle grating, a detecto

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Light path structure of echelle grating spectrometer
  • Light path structure of echelle grating spectrometer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0009] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.

[0010] like figure 1 As shown, the optical path structure of the échelle grating spectrometer of the present invention includes a condenser 1, an incident pinhole 2, a parabolic collimating mirror 3, an échelle grating 4, a cross dispersive prism group 5, a parabolic focusing mirror 6 and a detector 7; At the front end of the optical path, the collected light converges to the incident pinhole 2; in the direction of the incident light formed by the condenser lens 1 and the incident pinhole 2, a parabolic collimating mirror 3 is placed, and the center is the center of the condenser lens 1 and the incident pinhole 2 The positions are at the same height; in the direction of the reflected light formed by the condenser 1 and the incident pinhole 2, an echelle grating 4 is placed, and the center height is the height of the optical axis of the reflect...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a light path structure of an echelle grating spectrometer, which belongs to the technical field of light spectrum. The invention aims to provide a light path structure applied to high-resolution wide-spectral-range and full-spectrum direct-reading spectrum analysis. According to the technical solution of the invention, the light path structure comprises a condensing mirror, an incident pinhole, a parabolic collimating lens, an echelle grating, a cross dispersion prism set, a parabolic focusing mirror and a detector; light to be measured is collected by the condensing mirror and enters the light path of a spectrometer through the incident pinhole; an incident light beam is collimated into parallel light beams by the parabolic collimating lens, then after the parallel light beams are processed by the echelle grating and the cross dispersion prism set to generate two-dimensional cross dispersion, then the two-dimensional cross dispersion is imaged to a target surface of the detector by the parabolic focusing mirror, thereby obtaining a two-dimensional dispersing spectral image. The light path structure of an echelle grating spectrometer disclosed by the invention is simple and reliable in structure, has no movable parts, and does not need to carry out multiple scanning.

Description

technical field [0001] The invention belongs to the field of spectrum technology, and relates to an optical path structure of an echelle grating spectrometer. Background technique [0002] Spectroscopic instruments are important analytical and testing instruments widely used in scientific research, industrial production and other fields. Adapting to the application requirements of higher resolution, wider spectral range, and full-spectrum direct reading is the development direction of spectral analysis instruments. The echelle grating spectrometer uses a high dispersion, high resolution, full-wave blazed echelle grating as the main spectroscopic element, and its resolution is more than 20 times higher than that of conventional spectrometers, and it has the advantages of small size and full-spectrum transient direct reading. High-end spectroscopic analysis instrument. At present, only a few developed countries have developed such instruments, and companies such as PI, LEEMA...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01J3/18
Inventor 巴音贺希格何淼崔继承陈今涌
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap