19 results about "Echelle grating" patented technology

The utility model discloses an echelle grating spectrometer based on a digital micromirror device, which belongs to the technical field of spectrometers and comprises an echelle grating spectrometer, a digital micromirror, a reflection focusing mirror, a photomultiplier, a data acquisition card and an upper computer. The light is spatially modulated through a digital micromirror, the light is focused on a photomultiplier, and information is received by a data acquisition card; time sequence synchronization of the digital micromirror and the data acquisition card is completed by transmitting a synchronizing signal of the digital micromirror to the data acquisition card, and meanwhile, an overturning mode of the digital micromirror is designed, so that rapid scanning imaging is realized. According to the echelle grating spectrometer based on the digital micromirror device, the cost is reduced, and the time for acquiring spectral information is shortened.

The invention relates to the technical field of spectrometers, and discloses a micro-reflector control method of a DMD scanning type echelle grating spectrometer, which comprises the following steps of: firstly, initially reducing the number of micro-reflectors required to be overturned, dividing the whole DMD image surface into sub-regions consisting of a plurality of micro-reflectors, and overturning the sub-regions according to a row sequence; then, further reducing the number of the micro-reflectors required to be overturned, and for the reserved sub-regions with signals, carrying out independent analysis by taking each sub-region as a target, so as to reduce the number of the micro-reflectors; the images of the corresponding sub-regions are recovered, the images of the sub-regions are placed according to the position sequence, the operation is repeated, and the complete spectral image is recovered. According to the invention, the number of times of overturning the micro-mirror of the DMD scanning type echelle grating spectrometer can be reduced, the time of modulating the optical signal by the micro-mirror device is greatly reduced, the imaging efficiency of the DMD scanning type echelle grating spectrometer is improved, and the time required for imaging is reduced.

This invention discloses a method for processing two-dimensional spectra, such as echelle grating spectra. The spectrum comprises segments with relatively high intensity separated by boundaries with relatively low intensity. The spectrum has been digitized by a detector (61). The method includes: denoising the spectrum (62); searching (64) for at least one series of adjacent local extrema of the spectrum; fitting lines (65) to each series of adjacent local extrema, each line representing a segment; identifying (67) any peaks and their corresponding positions; and storing (68) the positions of the lines and any peaks.

The utility model relates to the technical field of spectrometers, and discloses an echelle grating spectrometer structure which comprises a box body, an optical fiber adapter, an aberration correction mirror group, a collimating mirror, an echelle grating, a reflective prism, a focusing mirror, a DMD, a PMT focusing mirror and a PMT detector, a box bottom plate is fixed at the bottom of the box body, the optical fiber adapter is fixed on a front plate of the box body, and the optical fiber adapter is fixed on a rear plate of the box body. An incidence small hole is formed in the center of the optical fiber adapter, the aberration correction lens set is fixed to the inner wall of a front plate of the box body and located at the rear end of the optical fiber adapter, a mounting table is fixed to the upper end of the right portion of the box bottom plate, the collimating mirror and the reflective prism are arranged at the upper end of the rear portion of the mounting table, and the echelle grating is arranged at the upper end of the front portion of the mounting table. And the focusing mirror and the PMT focusing mirror are respectively fixed in front of the left part of the box bottom plate. According to the utility model, the manufacturing cost of the echelle grating spectrometer can be greatly reduced, and the echelle grating spectrometer also has better imaging quality.

The present invention relates to the technical field of imaging spectrometers, and specifically provides an optical path structure and a spectrometer for an immersion echelle grating spectrometer. The optical path structure includes an entrance slit, a collimation system, a primary dispersion system, a secondary dispersion system, a focusing system, and a detector; the substance to be detected enters the entrance slit, and the generated incident light beam is incident on the collimation system. After being collimated by the collimation system, it becomes a parallel light beam; the parallel light beam undergoes a first dispersion through the primary dispersion system and then a second dispersion through the secondary dispersion system to obtain a two-dimensional spectrum; the two-dimensional spectrum is focused by the focusing system and imaged onto the detector. The optical path structure and spectrometer provided by the present invention not only greatly improve the efficiency and spectral resolution of the optical system, but also make the spectrometer more compact in space. At the same time, for a cooled infrared spectrometer, the stability of the system is improved.

A method of processing two dimensional optical spectra, such as echelle spectra, is disclosed. The optical spectra comprise sections having a relatively high intensity separated by borders having a relatively low intensity. The optical spectra have been digitized (61) by a detector. The method comprises denoising (62) an optical spectrum, searching (64) for at least one series of neighboring local extrema of the optical spectrum, fitting (65) a line through each series of neighboring local extrema, each line representing a section, identifying (67) any peaks and their respective locations, and storing (68) the lines and the locations of any peaks.

The invention relates to the field of optics, in particular to a high-spectral-resolution echelle grating spectrometer, which is characterized in that a front pre-light-splitting module is used for compressing the spectral range of incident light and emitting a light beam in a set wavelength range; the echelle grating dispersion module is located on an emergent light path of the front pre-light-splitting module. The echelle grating dispersion module comprises an entrance slit, an optical transmission assembly, an echelle grating and a turning plane mirror group. The optical path transmission direction is on a meridian plane, and the dispersion direction of the echelle grating is on a sagittal plane. Light beams pass through the entrance slit and are incident to the echelle grating through the optical transmission assembly for dispersion, the dispersed light beams are incident to the echelle grating through the turning plane mirror group for multiple times for dispersion, the light beams subjected to multiple times of dispersion are incident to the spectrum detection module, and spectrum information is obtained through the spectrum detection module. Therefore, spectrum misreading can be avoided while the femtometer-level spectral resolution is guaranteed.

The invention relates to a glow discharge spectrometry apparatus (100) comprising a glow discharge lamp (1) and an optical emission spectrometer adapted to receive a light beam (20) emitted by a glow discharge plasma (2). According to the invention, the optical emission spectrometer comprises a dispersive optical component (7) and a ladder grating (8) arranged and configured to form a two-dimensional spectrum (26) of the light beam, the two-dimensional spectrum (26) being dispersed in a plurality of diffraction orders (P1, …Pj,…PT), the plurality of diffraction orders (P1, …Pj,…PT) extending along a first direction (X) and each diffraction order (P1, …Pj,…PT) extending spectrally along a second direction (Y) transverse to the first direction (X), and a pixel-matrix CMOS detector (10) arranged and configured to acquire the two-dimensional spectrum (26) as a function of time. Figure for the abbreviation: Fig. 1

The present invention discloses a multi-step periodic grating structure and a preparation method thereof, relating to the technical field of micro-displacement detection. It includes a periodic multi-step grating structure. Each period of the multi-step grating structure includes a substrate and a four-step grating structure. The four-step grating structures are all arranged on the substrate. According to the order from right to left within a single period, the four-step grating structures are respectively the first-step grating structure, the second-step grating structure, the third-step grating structure, and the fourth-step grating structure, which are layer structure arrays of three different heights. The present invention realizes the regulation and weakening of the zero-order diffracted light through structural improvement, so as to achieve the effect of improving the stability of the laser in the detection system. The multi-step periodic grating structure prepared by the corresponding preparation method has the function of weakening the zero-order light regulation, can realize a certain range of light intensity regulation, is convenient for preparation and integration, has a high diffraction efficiency, and can be applied to the field of integrated high-precision displacement detection.

An ophthalmic lens defining an optical axis may include a plurality of annular regions extending in a radial direction away from the optical axis, including a corresponding plurality of echelle gratings, where the plurality of echelle gratings form echelle grating profiles, where each echelle grating profile includes a step profile, where the plurality of echelle gratings form a plurality of annular regions extending in a radial direction away from the optical axis. Each echelette grating includes a step, where, for each step, there are M phase shift units arranged vertically, where M is an integer, where each phase shift unit has a phase height configured to shift a phase of a reference light frequency by about N2 [pi], where N is an integer, and where the step profile forms an irregular step.

Systems and methods for generating multiple mutually variant wavelengths of coherent radiation for three-dimensional imaging of a physical object, such as a tooth, are disclosed. A single radiation source, such as a laser diode, emits coherent electromagnetic radiation. A highly dispersive optical element, such as an echelle diffraction grating, separates radiation having specific wavelengths from the emitted spectrum into distinct beams. Optical components, such as optical masks, mirrors, and lenses, select and orient desired beams to illuminate the object. Small changes in drive current or heatsink temperature of the radiation source similarly affect all wavelengths of the emitted spectrum, so the relative wavelength differences of the desired beams of radiation remain constant. This wavelength stability is useful for synthetic wavelength generation for digital holography and minimizes errors in object shape profile measurements at various scales. Use of a single radiation source also reduces system cost and complexity.

This invention discloses a mid-step grating spectrometer based on the principle of cross-dispersion and its fabrication method. The spectrometer includes a principal dispersive element, a transverse dispersive element, an area array detector, an optical fiber, and a slit. The principal dispersive element is a mid-step curved grating; the transverse dispersive element is a small-step curved grating. The mid-step curved grating and the small-step curved grating are used in combination to achieve spectral dispersion and point-to-point aberration elimination imaging. The area array detector is placed in the direction of the emitted light; the optical fiber is used to emit the light to be measured; the slit is located after the optical fiber and acts as an aperture stop. This invention uses a mid-step curved grating and a small-step curved grating to perform cross-dispersion, eliminating the need for collimating and focusing mirrors in traditional structures. The structure is compact, and high-resolution detection can be achieved, solving the problems of large number of components, high cost, and complex assembly in traditional cross-dispersion mid-step grating structures.

The application discloses a kind of high-resolution fiber spectrometer asynchronous calibration observation optimization method and system, belong to astronomical spectral observation technical field, it is applied to the high-resolution fiber echelle grating spectrometer of ThAr lamp single fiber asynchronous calibration mode.The application is deployed high-precision temperature and humidity and air pressure sensor in the spectrograph heat preservation shell, real-time acquisition optical system operating environment parameter, constructs linear correlation model of temperature and humidity, air pressure and wavelength drift based on 12 months measured data, wavelength calibration data in observation process is calculated in real time by environmental data in combination with model, optimize asynchronous calibration observation process, omit the original process frequent calibration lamp observation, mode switching and additional background observation link.It is proved by measurement, the application guarantees 0.0144mÅ wavelength calibration precision, improves the throughput of spectrometer data 28.57%, improves astronomical observation efficiency and scientific output, reduces instrument construction operation cost and equipment loss, applicable to the high-resolution fiber spectrometer of all kinds of cathode lamp asynchronous calibration.

Method and system for constructing two-dimensional spectrum reduction model of echelle grating spectrometer, belonging to the technical field of two-dimensional spectrum reduction of echelle grating spectrometer, solves the problem that the existing spectrum reduction model of echelle grating spectrometer shows large errors in the detection range of inflatable wide-band spectrum. Establish the relationship between the wavelength in the Y direction of echelle grating diffraction and the position of detector pixels; establish the relationship between the wavelength in the X direction of prism dispersion and the position of detector pixels; based on the established relationship between the wavelength in the Y direction of echelle grating diffraction and the position of detector pixels, and the established relationship between the wavelength in the X direction of prism dispersion and the position of detector pixels, construct a two-dimensional spectrum reduction model of echelle grating spectrometer; calibrate the two-dimensional spectrum reduction model of echelle grating spectrometer based on a standard light source, optimize the optical structure parameters in the two-dimensional spectrum reduction model, and obtain the optimal two-dimensional spectrum reduction model of echelle grating spectrometer.

The invention relates to the technical field of spectral analysis, in particular to a double-arm high-resolution wavelength meter and a light path structure, and the wavelength meter comprises a light splitting module, a plane grating spectrum module and an echelle grating spectrum module; incident laser is divided into first laser and second laser through the light splitting module. The first laser enters the plane grating spectrum module for pre-measurement; and the second laser enters the echelle grating spectrum module, the echelle grating spectrum module carries out adjustment according to a pre-measurement result, and then the second laser is measured to obtain the beam wavelength of the incident laser. According to the invention, the echelle grating spectrum module and the plane grating spectrum module are combined, accurate judgment of the echelle grating level is realized by adopting the plane grating spectrum module, and high-resolution spectrum measurement is realized by adopting the echelle grating spectrum module.

The invention relates to the technical field of spectrometers, and discloses an echelle grating spectrometer modeling method based on Gaussian process regression, which comprises the following steps: in a 275-800nm spectral range, selecting wavelength points at an interval of 1nm by adopting a layered random sampling method, constructing a two-dimensional spectral modeling data set with statistical significance, and obtaining multiple groups of training sample data; respectively constructing an Xmodel regression model between the wavelength and the prism dispersion direction coordinate (X) and a Ymodel regression model between the wavelength and the grating dispersion direction coordinate (Y) by adopting Gaussian process regression; a continuous wavelength sequence is generated with 0.001 nm as the step length, and theoretical spectrum position distribution in the whole wavelength range is obtained; a complete two-dimensional spectrum model is established by constructing a matrix, the rows and columns of the matrix respectively correspond to a Y coordinate and an X coordinate, and the element values of the matrix correspond to wavelength values. According to the method, the establishment complexity of the two-dimensional spectrum model can be simplified, the time required for establishing the model is shortened, and the precision of the two-dimensional spectrum model is improved.

The invention discloses a hyperspectral imaging method and system based on an FPGA, and belongs to the field of hyperspectral imaging, and the system comprises a data collection and preprocessing module, a compressed sensing module, a sparse reconstruction module and an output module. Various components such as a broadband light source, an imaging optical system, an Echel grating diffraction lens for wavelength separation, a CMOS detector, an ADC (analog-to-digital converter) and a calculation and control unit are integrated in the hardware design, and the components work cooperatively and are used for efficient hyperspectral data collection and processing. According to the system, diffraction imaging is enhanced by using a chirped fiber bragg grating (CFBG), and hyperspectral image reconstruction is carried out by adopting a generative adversarial network (GANs) method. According to the hyperspectral imaging method and system based on the FPGA, compressed sensing, sparse reconstruction and the enhancement technology based on the GAN are effectively combined, and original hyperspectral data are reconstructed with high precision while low hardware occupation is kept and the real-time processing capacity is ensured.

Optical assembly 20 directs light, perhaps axial light, in a first direction from plasma source 10 along a first optical path to entrance slit 60 of an optical emission spectrometer. First mirror 40 selectively switches reference light from reference light source 30 onto the first optical path and to the entrance slit for calibrating the spectrometer. Radial light from the plasma source may be directed along a second optical path to the entrance slit (Fig. 4) when selectively switched. Second mirror 50 selectively switches reference light onto the second optical path for calibrating the spectrometer. The first and second mirrors may each comprise a reflective portion and a transmissive portion. The portions may define complementary shapes on the two mirrors. The spectrometer may comprise an echelle grating to direct light onto a detector to image an echelle spectrum comprising plural orders, or may comprise a concave grating to image a linear spectrum on the detector.

The method, device and spectrometer for spectrometer structure optimization based on fluid model analysis belong to the technical field of echelle grating spectrometers, and particularly to the structural optimization of echelle grating spectrometers; the method solves the problem that the existing echelle grating spectrometer structure optimization method does not optimize the influence of internal gas filling (argon gas), and cannot analyze the influence of mechanical pressure, temperature and refractive index change of optical medium caused by gas filling turbulence on the optical path, thereby generating errors; the method includes: a step of determining the final optimal position of the gas inlet and outlet from the alternative positions of the gas inlet and outlet in the Y direction of the side wall based on the uniformity judgment method of the light transmission medium by using the optimal position selection method. The method, device and spectrometer for spectrometer structure optimization based on fluid model analysis are suitable for structural optimization of echelle grating spectrometers to detect far ultraviolet spectra.