Wide-spectrum spatial heterodyne spectrometer

A spatial heterodyne and spectrometer technology, which is applied in the field of wide-band spatial heterodyne spectrometer, can solve the problem of narrow spectral band and achieve the effects of fast response speed, low power consumption and high spectral resolution

Active Publication Date: 2011-05-11
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0013] The invention provides a wide-spectrum spatial heterodyne spectrometer, which overcomes the defect that the traditional spatial heterodyne spectrometer in the prior art has a very narrow spectrum

Method used

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Embodiment Construction

[0032] The basic principle of the invention is: the telescopic system collects the spectral radiation of the observed target, and images it to the entrance pupil of the interferometer, and the target radiation passing through the entrance pupil of the interferometer becomes a parallel beam after being passed through the collimation system, and is divided into two beams by the beam splitter. Two-way transmission and reflection, at Littrow angle (θ L ) are respectively incident on two échelle gratings, and after being dispersed by the échelle gratings, beams of different wavelengths are reflected from the gratings back to the beam splitter at different diffraction angles. Then through the beam splitter, it is semi-reflective and semi-transparent, and is merged into an outgoing beam at the exit of the interferometer. In this way, for an incident wavefront, there are two outgoing wavefronts with a certain angle between them, and there is coherence between the two wavefronts. Stre...

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Abstract

The invention discloses a wide-spectrum spatial heterodyne spectrometer, which overcomes the defect that the conventional spatial heterodyne spectrometer has a narrow spectrum in the prior art. A blazed grating component consists of a first echelle grating and a second echelle grating which are respectively positioned on a reflection light path and a transmission light path formed by a beam splitting element for the first time; an angle relationship and a position relationship between the two echelle gratings are that: (1) a reflection beam and a transmission beam which are split by the beam splitting element for the first time are transmitted to the two echelle gratings at a Littrow angle; and (2) by taking the conventional position relationship between the blazed grating component and the beam splitting element as the standard, the first echelle grating rotates alpha / 4 degrees around a first rotating shaft, and the second echelle grating rotates -alpha / 4 degrees around a second rotating shaft; and a controllable optical shutter serving as a hierarchy selection mask is arranged at a superposed position of focal planes of a fringe imaging system. The wide-spectrum spatial heterodyne spectrometer has the advantages of high stability, high spectral resolution and wide-spectrum coverage, and is very suitable for satellite-borne spatial environment remote sensing and atmospheric sounding.

Description

technical field [0001] The invention relates to a wide-band spatial heterodyne spectrometer. Background technique [0002] 1. Mathematical expression of the basic principle of spatial heterodyne spectrometer [0003] The radiation passing through the entrance pupil of the interferometer is collimated and turned into a plane wave, which is split by the beam splitter at the Littrow angle θ L incident on two gratings. According to the grating equation [0004] σ(sinθ L +sinβ)=mD, (1) [0005] σ is the wave number, θ L is the beam incident angle, β is the beam exit angle, m is the diffraction order, and D is the groove density of the grating. Then light with different wave numbers σ exits the grating at different diffraction angles β, and there will be a certain wave number σ in the diffracted outgoing beam 0 The light returns according to the original incident light path, that is, corresponding to β(σ 0 ) = θ L , corresponding to the outgoing wavefronts of the two grat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45
Inventor 冯玉涛白清兰
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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