Method for adjusting small echelle grating spectrometer

A step grating and adjustment method technology, applied in the field of spectroscopy, can solve the problems of limited use of auxiliary adjustment equipment, large dependence on the experience of the adjuster, cumbersome adjustment process, etc., to achieve less professional auxiliary equipment, high resolution, and easy operation easy effect

Inactive Publication Date: 2012-12-05
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

Most of the adjustment methods require the use of multiple professional auxiliary adjustment equipment, the adjustment process is cumbersome, there are many interpretation steps, and it relies heavily on the experience of the adjuster
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  • Method for adjusting small echelle grating spectrometer
  • Method for adjusting small echelle grating spectrometer
  • Method for adjusting small echelle grating spectrometer

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Embodiment

[0040] Taking the installation and adjustment of a certain small échelle spectrometer as an example, the installation and adjustment of the échelle spectrometer of the present invention will be further described in detail. However, this embodiment should not be understood as limiting the protection scope of the present invention, and the characteristic wavelength spectrum line is not limited to the 404.656nm spectrum line.

[0041] The system parameters of the echelle spectrometer are shown in Table 1. A standard mercury lamp is used as the system test light source, and a narrow-band filter with a center wavelength of 405nm can be used to accurately determine the position of the 404.656nm spectral line of the mercury lamp as (346, 288). By fine-tuning the system parameters, the theoretical calculation position of the spectral line of this wavelength can be determined. coincide with the actual adjustment position. Table 2 shows the calibration results of each characteristic wa...

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Abstract

The invention relates to a method for adjusting a small echelle grating spectrometer. The method comprises the following steps of: fixedly arranging a first incidence pinhole and enabling laser light of a first visible laser device to be incident into the first incidence pinhole; adjusting the position and the angle of a collimating lens so that the collimating lens works in the optimum state; eliminating rolling errors and pitching errors of a crossed dispersion prism; adjusting the position and the angle of a focus lens so that the focus lens works in the optimum state; arranging and adjusting echelle grating and preliminarily adjusting the incidence angle of the echelle grating; adjusting the position of an image plane of an area-array detector and rolling errors of the image plane; and precisely adjusting the incidence angle of the echelle grating and the incidence angle of the crossed dispersion prism. Required professional auxiliary devices are few, the method is an accurate adjusting method which is simple and convenient to operate and easy to apply, and is beneficial for realizing spectrum analysis, with high resolution, wide spectrum range and a transient full-spectrum direct-reading function, of the echelle grating spectrometer.

Description

technical field [0001] The invention belongs to the field of spectrum technology, and relates to a method for installing and adjusting a small-sized echelle grating spectrometer. Background technique [0002] The echelle spectrometer uses the echelle grating as the main dispersive element. After the prism is laterally dispersed, a two-dimensional overlapping spectrum is formed on the image plane. This structure enables the echelle spectrometer to simultaneously realize high-resolution and wide-band transient measurement. . At present, the échelle grating spectrometer has been widely used in petroleum, chemical industry, metallurgy, biomedicine and other fields. Generally, the wavelength range of the echelle spectrometer is 200nm-900nm, and the spectral resolution can reach 20,000. After precise calibration, the wavelength calibration accuracy of the echelle spectrometer can reach 0.01nm. Accurate adjustment is one of the important links to ensure the high resolution and wa...

Claims

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Application Information

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IPC IPC(8): G01J3/28
Inventor 陈少杰宁春丽崔继承巴音贺希格齐向东唐玉国
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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