Comprehensive test sample rod for double-shaft tilting in-situ force and electric property of transmission electron microscope

Abstract

A double tilt sample holder for in-situ measuring mechanical and electrical properties of microstructures in transmission electron microscope (TEM) is provided. The sample holder includes a home-made hollow sample holder body, a sensor for measuring mechanical / electrical properties, a pressing piece, a sample holder head, a sensor carrier. The sensor for measuring mechanical / electrical properties is fixed on the sensor carrier on the sample holder head by the pressing piece, while the sensor carrier is connected to the sample holder head through a pair of supporting shafts located on sides of the sample holder head. The sensor carrier can tilt within the plane perpendicular to the ample holder head by revolving around the supporting shafts (i.e. tilting along Y axis at an angle of ±30°). The sample holder also allows obtaining mechanical / electrical parameters concurrently.

Description

Technical field: [0001] The invention relates to a comprehensive performance testing sample rod for a transmission electron microscope. The sample rod realizes the comprehensive performance of the material while realizing the loading of the stress in the plane where the sample is located while realizing a large-angle tilt along a pair of orthogonal axes. Testing, real-time research on the in-situ dynamics of material micro-region deformation from the atomic scale. The invention belongs to the research field of transmission electron microscope accessories and in-situ measurement of nanomaterials. Background technique: [0002] Since the invention of the transmission electron microscope in the 1930s (1932), especially in the past two decades, the transmission electron microscopy technology has improved in spatial resolution represented by spherical aberration correction technology and energy resolution represented by monochromatic light source. Great progress has been made in...

AI Technical Summary

Problems solved by technology

Although the above-mentioned commercial TEM deformation device provides a favorable tool for in situ research on the microstructure changes during the deformation process of nanomaterials, there is a technical bottleneck obstacle: the in situ mechanical behavior of the commercial TEM sample stretching table is basically Single-axis tilting, unable to achieve tilting along the Y-axis

In addition, although the commercial dual-axis tilting sample holder technology is very mature, these sample holders can only realize the observation of the sample but cannot realize the stress loading on the sample in the sample plane under the condition of dual-axis tilting, which limits the researcher. In-situ study of deformation, fracture, phase transition and other mechanisms of materials at the atomic scale

[0004] It should be pointed out that the above methods are mainly to load the sample stress by installing complex mechanical transmission devices on the sample rod of the transmission electron microscope. Since these devices are installed on the sample rod of the transmission electron microscope, the sample rod will In the transmission electron microscope, the stress can only be loaded on the sample under the uniaxial tilt (X axis). For the situation where the related properties of the material need to be studied in situ under the positive band axis of the atomic scale, the tilting premise of the Y axis cannot be realized. In order to realize the stress loading in the plane of the sample, it is difficult to have the opportunity to conduct in-situ deformation dynamic research at the high-resolution state or atomic level, which poses a huge challenge to people's correct understanding of the properties of materials.

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