Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Microlens array imaging anticounterfeiting coin or badge

A micro-lens array and lens array technology, applied in the field of stamps and anti-counterfeiting coins, can solve the problems of limited application of coin anti-counterfeiting technology, and achieve the effect of good anti-counterfeiting effect and convenient identification.

Inactive Publication Date: 2012-03-14
CHINA BANKNOTE PRINTING & MINTING
View PDF7 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, there are many kinds of anti-counterfeiting technologies applied to coins and chapters, including edge anti-counterfeiting, material, pattern anti-counterfeiting, etc., but compared with other fields, the application of coin anti-counterfeiting technology is relatively limited

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Microlens array imaging anticounterfeiting coin or badge
  • Microlens array imaging anticounterfeiting coin or badge
  • Microlens array imaging anticounterfeiting coin or badge

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The present invention will be described in further detail below through the description of specific embodiment, but this is not limitation to the present invention, those skilled in the art can make various modifications or improvements according to the basic idea of ​​the present invention, but as long as not departing from the principle of the present invention The basic ideas are all within the scope of the present invention.

[0022] Such as figure 1 As shown, it is a schematic cross-sectional structure diagram of micro-lens array imaging anti-counterfeiting coins and chapters. The present invention is composed of micro-pattern anti-counterfeiting patterns 4 and micro-lens signs, and micro-pattern anti-counterfeiting patterns 4 are directly printed on the surface of coins or chapters 2. A transparent medium 1 is coated on the pattern, and the transparent medium 1 is a thin layer of UV glue or other transparent medium to form a logo. The microlens array 3 structure i...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an anticounterfeiting coin or badge and particularly relates to a microlens array imaging anticounterfeiting coin or badge, which comprises a coin or badge and an anticounterfeiting structure arranged on the coin or badge. The characteristic structure is as follows: micro-texture anticounterfeiting patterns are directly printed on the surface of the coin or badge; a layer of transparent medium is coated on the micro-texture anticounterfeiting patterns; and a microlens array is formed under the surface of the transparent medium layer. In the invention, the trueness of a coin, badge or other artwork can be judged directly, namely when the anticounterfeiting micro patterns on the surface of the coin, badge or other metal artwork are observed by naked eyes, magnified patterns and a three-dimensional drifting effect can be seen. The anticounterfeiting is better and the identification is more convenient.

Description

technical field [0001] The invention relates to an anti-counterfeit coin and stamp, in particular to a microlens array imaging anti-counterfeit coin and stamp. Background technique [0002] At present, there are many kinds of anti-counterfeiting technologies applied to coins and chapters, including edge anti-counterfeiting, material, pattern anti-counterfeiting, etc. However, compared with other fields, the application of coin anti-counterfeiting technology is relatively limited. In recent years, many image anti-counterfeiting technologies have been successfully applied to coins, and have achieved good anti-counterfeiting effects, such as invisible engraving, laser holography, color pad printing and other technologies, which have greatly improved the anti-counterfeiting technical content of coins. [0003] Coin designers are more willing to adopt anti-counterfeiting technology that intuitively expresses design ideas. The optical anti-counterfeiting technology that can be se...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): A44C21/00A44C3/00B44F1/12B42D25/30
Inventor 勾久斌赖茂明张波刘志刚张吉刚康今哲
Owner CHINA BANKNOTE PRINTING & MINTING
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products