Method and device for realizing quick stress screen of product

Abstract

The invention relates to electronic equipment detection technology, and discloses a method and device for realizing quick stress screen of a product. The method comprises the following steps of: theoretically deducing to obtain theoretical reliability limit of the product; actually measuring whether the product meets a theoretical value through a test; finding out a weak point (potential failure) of the product in the actual measurement and gradually improving and eliminating to reach the theoretical design limit; and derating the theoretical design limit as the quick stress screen condition for the product. The embodiment of the invention provides the method for realizing quick stress screen of the product. The product is verified and improved to reach the theoretical stress limit by designing and calculating the theoretical stress limit of the product and then gradually applying step stressing actual test; the design limit is tested and verified according to theoretical calculation and is derated and screened; and thus, a part of failure can be screened without damaging more reliability of the product.

Description

technical field [0001] The invention relates to electronic equipment detection technology, in particular to a method and device for realizing rapid stress screening of products. Background technique [0002] Environmental Stress Screening (Environment Stress Screen, ESS) is a process method that accelerates potential internal defects into failures by applying reasonable environmental stress (such as temperature stress or vibration stress) to electronic products, and detects them through inspection. and troubleshooting procedures. [0003] Please refer to figure 1 , figure 1 It is a flow chart of an existing method for realizing rapid stress screening of products. As shown in the figure, the method includes steps: S1. Perform a reliability test on the product under test to obtain a reliability limit; S2. Set the initial test value within; S3, gradually change the current test value within the reliability limit, and perform a functional reliability test on the product that ...

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Problems solved by technology

[0004] In the above scheme, in step S1, the reliability limit is obtained from the environmental reliability test of the tested product, which is only the reliability limit of the tested sample and does not represent the theoretical design limit of the product. If the reliability performance of the incoming material is higher or lower than the manufacturer's promise, the reliability limit of the product tested will be higher or lower than the product reliability under the manufacturer's promise of the incoming material; moreover, in step S3, set a fault trap The method is difficult to realize, if it is not sufficient or does not conform to the actual situation, it will directly cause insufficient screening conditions or errors; in addition, in steps S6 and S7, it is difficult to judge whether the sampled product is a qualified product, if the sampled product The performance of the product is higher or lower than the control specification, which will cause the screening conditions to be misjudged. It is only tested whether the product is normal under the screening conditions, and it is not known how much the reliability of the product has been lost. It is likely that the product has reached the limit after screening. edge, damaged shortly after leaving the factory

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