Image measuring instrument and non-linear error correcting method and correcting plate thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- ZHUHAI EASSON MEASUREMENT TECH
- Publication Date
- 2012-05-09
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to an image measuring instrument, in particular to an image measuring instrument, a nonlinear error correction method and a correction plate thereof. Background technique
[0002] During the production and assembly process of the image measuring instrument, measurement errors will be caused by factors such as mechanical errors and microscope distortion. Therefore, in order to reduce the measurement error and improve the measurement accuracy of the image measuring instrument, nonlinear error correction will be performed. The entire nonlinear error correction process of the existing image measuring instrument is manually operated. A glass line ruler is placed on the workbench to measure the lines on the glass line ruler, and then the measurement results are input into the image measurement In the system, the image measurement system then corrects the nonlinear error of the measurement results. The specific method is to use a standa...