Switching test device for electronic component

A technology for testing equipment and electronic parts, which is applied in electronic circuit testing, components of electrical measuring instruments, and measuring electricity. Effect

Inactive Publication Date: 2014-11-05
WELL HANDLE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Although the integrated circuit can be inserted and removed by the robot arm, the integrated circuit test circuit board must be placed horizontally so that the robot arm can insert the integrated circuit into the slot on the integrated circuit test circuit board
However, the integrated circuit test circuit board needs to have modules such as a central processing unit, a heat dissipation module, and a display module, so it occupies a considerable horizontal area.
If many integrated circuits are to be tested, numerous integrated circuit test circuit boards must be used, and these integrated circuit test circuit boards can only be placed horizontally, which takes up a considerable space and is unfavorable for the miniaturization of the test site, thus increasing cost of testing

Method used

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  • Switching test device for electronic component
  • Switching test device for electronic component
  • Switching test device for electronic component

Examples

Experimental program
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Embodiment Construction

[0054] In order to make the object, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings. Here, the exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not to limit the present invention.

[0055] figure 1 An overall schematic diagram of the switch-on testing device according to the first embodiment of the present invention is shown. figure 2 show figure 1 A partial schematic diagram of the transfer test equipment. image 3 show figure 1 A partial perspective view of the transfer test equipment.

[0056] Such as Figure 1 to Figure 3 As shown, the switch-on testing device 1 for electronic components of this embodiment includes a case assembly 10 , a plurality of first motherboard assemblies 20 and a handler 30 . Of course, the switchable testing device 1 for electronic c...

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PUM

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Abstract

The invention discloses a switching test device for an electronic component. The device comprises a box assembly, a plurality of first mainboard assemblies and a processor, wherein the first mainboard assemblies are arranged in the box assembly; each first mainboard assembly comprises a mainboard, a first main socket, a switching plate, a plurality of testing sockets and a center processor; the mainboard is arranged in the box assembly vertically; the first main socket is arranged on the mainboard and is electrically connected with the mainboard; the switching plate is electrically connected with the first main socket and is vertical to the mainboard plate in essence; the testing socket is arranged on the switching plate; the center processor is arranged on the mainboard and is electrically connected with the mainboard; and the processor inserts the plurality of electronic components into the testing sockets along the vertical direction so as to perform a test and pulls out the electronic components after the test is finished. By using the switching test device, more testing capacity can be created in a limited space, and the test cost can be reduced effectively.

Description

technical field [0001] The invention relates to a test device, in particular to a switch-type test device for electronic parts. Background technique [0002] Traditional testing methods for integrated circuits of memory modules use professional testing equipment to perform testing manually. For example, the integrated circuit can be inserted into a dedicated integrated circuit test circuit board, and then the test circuit board can be used to conduct a power-on test, and the test results can be viewed manually, and then the tested memory modules can be classified according to the test results. [0003] Although the integrated circuit can be inserted and removed by the robotic arm, the integrated circuit test circuit board must be placed horizontally so that the robotic arm can insert the integrated circuit into the slot on the integrated circuit test circuit board. However, the integrated circuit test circuit board needs modules such as a central processing unit, a heat dis...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R1/02
Inventor 罗文贤
Owner WELL HANDLE TECH
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