Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

TDI (Time Delay Integration) scan imaging method for Snapshot type area array infrared detector

An infrared detector, scanning imaging technology, applied in image communication, TV, color TV components and other directions, can solve the problems of image smearing, blurred scanning direction of point targets, influence of linear targets on target detection, etc. The effect of the signal-to-noise ratio

Inactive Publication Date: 2013-12-04
NANJING UNIV OF SCI & TECH
View PDF4 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, infrared search and track (IRST) systems generally use infrared focal plane sensors. Linear array FPA enables the system to achieve higher sensitivity and resolution. However, due to the inherent limitations of linear array FPA scanning systems, IRST systems cannot realize potential targets in any orientation. Tracking, and the IRST system using the area array FPA can better solve these problems, but the scanning motion of the detector within the frame integration time will cause serious smearing in the image, causing the point target to be blurred into a line target in the scanning direction for target detection had an impact

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • TDI (Time Delay Integration) scan imaging method for Snapshot type area array infrared detector
  • TDI (Time Delay Integration) scan imaging method for Snapshot type area array infrared detector
  • TDI (Time Delay Integration) scan imaging method for Snapshot type area array infrared detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0043] The TDI scanning imaging method of the Snapshot type area array infrared detector of the present invention is realized by an optical-mechanical scanning structure, an area array type infrared focal plane array, a driving circuit, a time-delay integration circuit and a power management circuit, and finally outputs a required video image. The optical-mechanical scanning structure, driving circuit, delay integration circuit and power management circuit are prior art. The delay integration circuit is composed of a sampling circuit and a digital processing circuit. Figure 4 It is a block diagram of the structure of the present invention. The sampling circuit is composed of TI's analog-to-digital conversion device AD9240 and peripheral circuits, which are controlled by FPGA to complete the sampling. The digital processing circuit is mainly composed of FPGA model EP2S60F1020I4, two static memories model IS61WV102416BLL and peripheral circuits. Figure 5 It is the block diag...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a TDI (Time Delay Integration) scan imaging method for a Snapshot type area array infrared detector. An optical mechanical scanning mechanism is arranged in front of an area array type infrared focal plane array, and the movement of an image is controlled by optical mechanical scanning. The shifted image obtained by the infrared focal plane array is input to a data accumulation processing circuit, and the image shifting accumulation processing is carried out to obtain the required image. The data accumulation processing circuit is mainly composed of a sampling circuit and a digital processing circuit. An AD (Analog-to-Digital) device is controlled by an FPGA (Field Programmable Gate Array) to perform sampling to finish the analog-to-digital conversion. After the analog-to-digital conversion is finished, a digital image signal is input to the digital processing circuit, the digital processing circuit performs image shifting accumulation, and finally the required image is output. The TDI scan imaging method for the Snapshot type area array infrared detector eliminates the trailing phenomenon caused due to the rotation of the detector when the area array detector is used in a search system, increases the signal-to-noise ratio of the image and is favorable for timely discovering a small dim target in a target searching and tracking system.

Description

technical field [0001] The invention belongs to the image enhancement technology in an infrared search system, in particular to a TDI scanning imaging method of a Snapshot type area array infrared detector. Background technique [0002] Infrared search and track (IRST) systems rely on receiving infrared radiation from targets to automatically search, detect, acquire and track potential targets. The first-generation IRST system mainly uses a multi-element detector with a preamplifier circuit to complete the search through optical-mechanical scanning. Due to the lack of stability, it leads to an unacceptable false alarm rate and a limited detection distance. The second-generation IRST system generally uses focal plane detectors, which can identify targets from clutter under a certain false alarm rate, and the detection distance is also greatly improved. [0003] At present, infrared search and track (IRST) systems generally use infrared focal plane sensors. Linear array FPA e...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/351H04N5/341H04N1/409
Inventor 顾国华季尔优柏连发陈钱隋修宝钱惟贤何伟基毛义伟杨蔚
Owner NANJING UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products