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Method of testing electrical small size scatterer backscatter cross section through giagahertz transverse electromagnetic (GTEM) cell

A technology of backscattering and electric small size, applied in the direction of electromagnetic field characteristics, etc., can solve the problems of complex test method, large measurement error, time-consuming and labor-intensive, etc., and achieve the effect of low equipment cost and simple operation.

Inactive Publication Date: 2012-07-11
BEIJING UNIV OF POSTS & TELECOMM
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  • Claims
  • Application Information

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Problems solved by technology

[0002] In the traditional backscatter cross-section test method, the measured scatterer needs to be placed in a free space or a special dark room, and a calibrated reference scatterer and other auxiliary equipment are required. The test method is complicated.
These test environments and test methods are either inevitably subject to electromagnetic interference, which makes the measurement error relatively large; or it is time-consuming, labor-intensive, costly, and occupies a large area

Method used

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  • Method of testing electrical small size scatterer backscatter cross section through giagahertz transverse electromagnetic (GTEM) cell
  • Method of testing electrical small size scatterer backscatter cross section through giagahertz transverse electromagnetic (GTEM) cell
  • Method of testing electrical small size scatterer backscatter cross section through giagahertz transverse electromagnetic (GTEM) cell

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Embodiment Construction

[0017] The method for testing the backscattering cross-section of electric small-size scatterers with a GTEM cell of the present invention, its preferred specific implementation is as follows figure 1 , figure 2 , image 3 shown, including steps:

[0018] A. If image 3 As shown, connect the front port of the GTEM cell to the vector network analyzer 7;

[0019] B. At the selected frequency, measure the S of the GTEM cell when there is no scatterer to be measured 11 value;

[0020] C. If figure 1 As shown, the scatterer 6 to be measured is placed on the special non-metallic turntable in the GTEM cell, the position is as follows figure 2 shown;

[0021] D. At the selected frequency, measure the S' of the GTEM cell when the scatterer to be measured is placed 11 value;

[0022] E. Calculate the backscattering cross-section of the electrically small-sized scatterer to be measured by using the formula 1 proposed by the method.

[0023] The scatterer to be measured meets ...

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Abstract

The invention discloses a method of testing electrical small size scatterer backscatter cross section through a GTEM cell, which includes steps of firstly placing an electrical small size scatterer 6 to be tested on a special nonmetal rotary table 5 of the GTEM cell; connecting a front port 4 of the GTEM cell to a vector network analyzer 7; obtaining return voltage and incident voltage of the front port of the GTEM cell and the ratio of the return voltage and the incident voltage through the vector network analyzer; and finally calculating a backscatter cross section of a scatterer through a formula proposed by the method. The method is simple in operation and low in cost.

Description

technical field [0001] The invention relates to the application of a GTEM cell, in particular to a method for testing the backscattering section of an electrically small-sized scatterer with the GTEM cell. Background technique [0002] In the traditional backscatter cross-section test method, the measured scatterer needs to be placed in a free space or a special dark room, and a calibrated reference scatterer and other auxiliary equipment are required, and the test method is complicated. These test environments and test methods are either inevitably subject to electromagnetic interference, resulting in relatively large measurement errors; or they are time-consuming, labor-intensive, costly, and occupy a large area. [0003] Therefore, a relatively simple and cheap test equipment is needed, and it is a very suitable choice to use a GTEM cell to test the maximum backscattering cross-section of electrically small-sized scatterers. Compared with free space, anechoic chamber, an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/08
Inventor 李书芳洪卫军陈志雨邢曙光刘晓阳王明阳陈乔
Owner BEIJING UNIV OF POSTS & TELECOMM
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