Mechanical and electrical service life testing system

Abstract

The invention provides a mechanical and electrical service life testing system, which is characterized by comprising a power supply device composed of at least 20 sets of testing loops, wherein the power supply device is connected with a distributed measurement control device which is linked with a centralized monitoring device through a communication bus, the centralized monitoring device is linked with a remote monitoring device through Ethernet, the distributed measurement control device and the centralized monitoring device are connected with a data storage device through the communication bus. The control system can simultaneously finish a laboratory measurement of up to 20 different testing parameters and 120 different testing samples of mechanical and electrical service lives, and not only is stable in operation, accurate in control and capable of achieving real-time analysis and judgments, but also completely meets the requirements of the national relevant specifications.

Description

technical field [0001] The present invention relates to a mechanical and electrical life test system for circuit breakers, contactors and isolating switches, more specifically to a mechanical and electrical life test system capable of simultaneously completing up to 20 different test parameters and 120 different test items . Background technique [0002] The life test of low-voltage switching devices such as circuit breakers, contactors and isolating switches is a long-term and destructive test. On the one hand, from the perspective of meeting national standards, it is impossible to find alternative test methods to overcome the two main problems of "long time and destructiveness"; on the other hand, from the perspective of development trends, the growing demand for tests and the types of low-voltage switches The rapid development of the industry has made it difficult for the traditional test circuit, monitoring, measurement and control methods to adapt to the various types...

AI Technical Summary

Problems solved by technology

In this system, on the one hand, once the centralized control point fails, the entire system will be paralyzed, affecting the normal tests of all test circuits; on the other hand, if 20 test circuits perform different tests at the same time, one centralized control point polls all Equipment status and collect analog signals of 20 loops. If the test cycle of each loop is less than 1s, within one test cycle, each test loop needs to complete a series of on and off operations, which is difficult to achieve stable operation and accurate Control, real-time analysis and judgment

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