Rapid microscopic section scanning method with image space compensation motion and apparatus thereof

Abstract

The invention discloses a rapid microscopic section scanning method with image space compensation motion and an apparatus thereof. The method comprises the following steps that: a section is divided into several continuous scanning strips longitudinally; a width of the each scanning strip is set as a dimension of corresponding object space field of an area array image sensor at a longitudinal direction; the each scanning strip is divided into several continuous scanning fields transversely; the length of the each scanning field is set as the dimension of the corresponding object space field of the area array image sensor at a transverse direction. During working, the each scanning strip of the section is controlled to successively pass through the object space field corresponding to the area array image sensor at a uniform speed. And when passing through one scanning field, the area array image sensor is exposed once. While exposing, the area array image sensor moves at an imaging movement speed (including the direction and magnitude) of the section on the area array image sensor so as to eliminate influence of image motion. The scanning speed can be effectively increased without resolution reduction.

Description

technical field [0001] The invention relates to a microscope capable of simultaneously obtaining a large field of view and a high-resolution image, in particular to a fast microsection scanning method and device with image-side compensation motion. Background technique [0002] Virtual microscopes can obtain high-resolution images while obtaining a large field of view, and are widely used. At present, there are three main technologies: [0003] The first is the area array image sensor combined with the scanning of slices, which needs to stop and go. Although better image quality can be obtained, the speed is slow, such as DotSlide (Olympus) and Mirax Scan (Zeiss). [0004] The second is the uniform motion of the linear array image sensor with the slice, generally called the line scan method, such as SCN400 (Leica), ScanScope (Aperio), the speed is very fast, but because it is exposed during the movement, it is affected by image motion. Image quality is reduced in the direct...

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Problems solved by technology

[0003] The first is the area array image sensor combined with slice scanning, which needs to stop and go. Although it can obtain better image quality, but the speed is slow, such as DotSlide (Olympus), Mirax Scan (Zeiss)

[0004] The second is the uniform motion of the linear array image sensor with the slice, generally called the line scan method, such as SCN400 (Leica), ScanScope (Aperio), the speed is very f...

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