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Probability method of electronic product service life model based on Bayesian theory

A Bayesian theory, a technology of electronic products, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., to achieve the effect of saving time and cost

Active Publication Date: 2012-08-29
BEIJING LANWEI TECH CO LTD
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Problems solved by technology

Through the search and novelty of existing technologies, no scholars at home and abroad have given a clear definition and specific implementation steps of probabilistic failure physics, and there is no calculation method for the probabilization of electronic product failure physics models based on Bayesian theory.

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  • Probability method of electronic product service life model based on Bayesian theory
  • Probability method of electronic product service life model based on Bayesian theory
  • Probability method of electronic product service life model based on Bayesian theory

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Embodiment Construction

[0037] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0038] The following embodiment is a probabilistic analysis of the thermal fatigue failure mechanism of the surface mount solder joint of the chip component 0805, according to the following figure 1 The implementation of the flow shown mainly includes determining the failure mechanism and failure physical model, determining the source of dispersion in the failure mechanism and its characterization method, determining the prior distribution of life, using Bayesian theory to update parameter distribution, using Monte Carlo The simulation realizes the numerical solution of the probabilistic physical model.

[0039] See figure 1 , the present invention is a probabilistic method for electronic product life model based on Bayesian theory, the specific steps are as follows:

[0040] Step 1: Determination of failure mechanism and physical model. Th...

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Abstract

The invention discloses a probability method of an electronic product service life model based on a Bayesian theory. The probability method comprises four steps of: step 1, determining a main failure mechanism and a physical model; step 2, determining the source and a characterization method of each dispersibility in the main failure mechanism; step 3, determining the service life distribution obeyed by the main failure mechanism; and step 4, updating the parameter distribution according to the Bayesian theory, and obtaining the numerical solution of a probability service life model by combining a failure physical model and utilizing a Monte Carlo sampling method. The method disclosed by the invention is used for calculating the failure probability of a highly-reliable and long-service-life electronic product based on a stress damage model; and by analyzing diepersibility and a description method of factors such as the attribute, the size and the stress of each material causing the electronic product failure and considering the dispersibility factors on the basis of the traditional failure physical model, the probability of the failure physical model is realized, and a new approach is provided for describing the failure more accurately and forecasting the product storage life.

Description

technical field [0001] The present invention provides a probabilistic method (PPoF) of life model of electronic products based on Bayesian theory, especially relates to the calculation method of failure probability of stress damage model of high-reliability and long-life electronic products, which belongs to reliability evaluation technology based on failure physics field. Background technique [0002] High-reliability and long-life electronic products generally have the characteristics of high performance indicators, high reliability, long service life, and high development costs. These characteristics make the traditional reliability engineering technology gradually unable to meet its development needs. Therefore, only on the basis of a deep understanding of the occurrence and manifestation of product failures, correct description of product failure behaviors, in-depth analysis of product failure mechanisms, and tracing the root causes of failures can the requirements of ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
Inventor 陈颖谢丽梅康锐
Owner BEIJING LANWEI TECH CO LTD
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