Turret test selector

Abstract

The invention provides a turret test selector which is used for testing, marking, selecting and taping the minimal type semiconductor devices. The turret test selector consist of a rack, an inverted DDR (double data rate) servo motor, a vertically-arranged rotating shaft, an aluminum alloy rotating platform installed on the rotating shaft, a rack, a blanking taping mechanism, a computer for controlling other components and the like. The circumference of the rotating platform is uniformly distributed with a plurality of flexible mechanical hands capable of being elevated, a plurality of working positions are arranged under the rotating platform and on the rack, the upper part of each working is provided with a cavity suitable for accommodating the semiconductor device in the size of 0.5mm*0.7mm to 15mm*15mm. The working position is provided with a feeding position, a plurality of testing positions, a rotary posture correcting position, a waste classifying position, a marking position, an extensible position and a blanking position. The turret test selector is high in process speed and test and selection efficiency and small in damage to the semiconductor device, and can be widely used for the test and selection of the minimal type semiconductor devices.

Description

technical field [0001] The invention relates to a testing and sorting device for semiconductor devices, in particular to a testing and sorting machine for semiconductor devices with a rotary table. Background technique [0002] After the semiconductor devices widely used in the microelectronics industry are manufactured, they need to be inspected, sorted, or marked on their upper and lower surfaces (marking, trademark or Mark), packaging (such as tape) and other processing procedures. In existing industrial applications, the above-mentioned working processes are carried out independently, the detection and sorting speed is slow, the equipment types are many and complicated, the labor load is large, and the production efficiency is low. [0003] The patent application document with the application number 200810019777.7 discloses a "new QFN integrated circuit test and sorting machine test unit device", including a push cylinder assembly, a test main seat assembly, a test nozzl...

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