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Method and apparatus for array graphic detection

A graphic detection and graphic technology, applied in the direction of optical testing flaws/defects, etc., can solve the problems of high requirements for image acquisition consistency and single template, and achieve the effect of reducing the occurrence of misjudgment and high detection efficiency.

Active Publication Date: 2015-04-22
深圳市纳研科技有限公司
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Problems solved by technology

However, with this method, since the template is single, it is sensitive to changes such as subtle changes in the product, especially in the case of changes in lighting conditions and slight deformation of the product, which requires high consistency in image acquisition; and the template needs to be consistent with the captured image Accurate registration to get the correct result

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  • Method and apparatus for array graphic detection
  • Method and apparatus for array graphic detection
  • Method and apparatus for array graphic detection

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Embodiment Construction

[0040] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0041] The invention provides an array pattern defect detection method.

[0042] refer to figure 1 , figure 1 It is a schematic flowchart of an embodiment of the method for array pattern detection of the present invention.

[0043] The array pattern defect detection method provided in this embodiment includes:

[0044] Step S10, extracting the actual graphic geometric features of the array graphics in the current frame according to the preset graphic geometric parameters;

[0045] In this embodiment, when it is necessary to perform defect detection on the array graphics in the current frame, the actual graphic geometric features corresponding to the graphic geometric parameters are first extracted from the array graphics in the current frame according to the preset graphic geometric parameters .

[0046] Step S20...

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Abstract

The invention discloses an array graphic detection method comprising the steps that: geometric characteristics of actual graphics in current frame array graphics are extracted according to preset graphic geometric parameters; it is determined that whether the actual graphic geometric characteristics are consistent with the characteristics of the preset graphic geometric parameters; if the characteristics are consistent, array graphics in the current frame are stored; if not, the array graphics in the current frame are compared with previously stored comparison graphics, and a defect position is outputted according to a comparison result. The invention also provides a corresponding apparatus. With the scheme provided by the invention, array graphic defect extraction can be realized with no template and no array graphic precise matching; phenomenon of determination error in array graphic detection can be reduced; and therefore detection efficiency is improved. The method and the apparatus satisfy on-line detection requirements.

Description

technical field [0001] The invention relates to the field of pattern detection, in particular to a method and device for array pattern detection. Background technique [0002] With the development of large-scale industrial production, the requirements for product quality control are getting higher and higher. The traditional method of using human eyes to detect products is far from meeting the needs of modern industrial production. Machine vision is used to replace human eyes to inspect products. Defect detection and quality control have become the general trend, and among various types of industrial products, products with a large number of repetitive array patterns account for a considerable proportion (such as exposed liquid crystal panels). [0003] There are two commonly used methods for array pattern defect detection: [0004] Method 1: Array graphics unit template matching method: use the intact image or CAD graphics of a single array graphics unit as a standard temp...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88
Inventor 许杰
Owner 深圳市纳研科技有限公司
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