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A memory testing method and device

A memory test and memory technology, applied in the computer field, can solve the problems of low operating efficiency, slow test speed, and inability to achieve full coverage test of memory test, and achieve the effect of high operating efficiency and fast test speed

Active Publication Date: 2015-09-09
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a memory testing method and equipment, which are used to solve the problems that the existing memory test cannot realize full coverage test, the test speed is slow, and the operating efficiency is low.

Method used

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Embodiment Construction

[0027] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0028] In the prior art, the BIOS starts to run after the computer is turned on. At this time, the BIOS runs in the ROM. The BIOS will complete the basic hardware initialization according to the process and then complete the memory initialization. After the memory initialization is completed, the memory can be read and written by software. In order to avoid problems caused by the confusion of memory usage, there is a special memory manage...

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Abstract

The invention discloses a memory testing method and device. The memory testing method comprises the steps of: testing a first part memory by an executing memory testing program, and restarting the device after testing the first part memory, wherein the property of the first part memory is reserved on the BIOS (Basic Input Output System) program execution stage when the executing memory testing program is used for testing the first part memory, and the memory testing program operates in a second part memory; and after the device is restarted, executing testing of the second part memory to the memory testing program, wherein the property of the second part memory is reserved on the BIOS program execution stage when the executing memory testing program is used for testing the second part memory, and the memory testing program operates in the first part memory. The memory testing method and device can realize rapid and all-coverage memory testing.

Description

Technical field [0001] The invention relates to the field of computers, in particular to a memory testing method and equipment. Background technique [0002] Memory is one of the most important parts of a computer, and all programs in the computer run in the memory. In view of the importance of memory, memory must be guaranteed to be reliable during computer operation, so memory testing is essential. At present, there are mainly two common memory testing methods: [0003] One is to execute a memory test program to test the memory in the operating system (Operation system, OS). The memory test must rewrite the data in the memory. If the memory is already in use, modifying the used part of the memory during the test will lead to unpredictable consequences. Therefore, the memory test is generally performed before the memory is used. However, because the OS runs in memory, the OS itself occupies part of the memory, so even if the memory is tested before it is used, this test method ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22G11C29/56
Inventor 宋东匡李龙壮游相斌
Owner HUAWEI TECH CO LTD
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