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Memory testing method and device, readable storage medium and electronic equipment

A memory test and memory technology, applied in the computer field, can solve problems such as the inability to realize full memory coverage test, and achieve the effects of fast test speed, reduced test time, and high operating efficiency

Pending Publication Date: 2022-07-19
CHANGXIN MEMORY TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The purpose of the present disclosure is to provide a memory testing method and device, a computer-readable storage medium, and an electronic device, so as to overcome at least to a certain extent the problem that the full coverage test of the memory cannot be realized

Method used

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  • Memory testing method and device, readable storage medium and electronic equipment
  • Memory testing method and device, readable storage medium and electronic equipment
  • Memory testing method and device, readable storage medium and electronic equipment

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Embodiment Construction

[0052] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments, however, can be embodied in various forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals in the drawings denote the same or similar parts, and thus their repeated descriptions will be omitted.

[0053] Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of the embodiments of the present disclosure. However, those skilled in the art will appreciate that the technical solutions of the present disclosure may be practiced without on...

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Abstract

The invention relates to a memory testing method and device, a computer readable storage medium and electronic equipment, a first area of a memory is tested by executing a memory testing program, and the first area is an area not occupied by the memory testing program; writing address information of a second area into an external memory of the equipment, wherein the second area is an area occupied by the memory test program; after the memory test of the first area is completed, transferring the memory test program to a partial area of the first area according to address information, recorded in the external memory, of the second area; and executing the memory test program to test the second area. According to the invention, full-coverage testing of the memory can be realized.

Description

technical field [0001] The present disclosure relates to the field of computers, and in particular, to a memory testing method and device, a computer-readable storage medium, and an electronic device. Background technique [0002] Memory is one of the most important parts of a computer, and all programs in the computer run in memory. In view of the importance of memory, the memory must be reliable during the operation of the computer, so memory testing is essential. [0003] The memory test program usually needs to rewrite the data in the memory during the memory test process. If the memory is already in use, modifying the used part of the memory during the test process will lead to unpredictable consequences. Therefore, the memory test is generally performed before the memory is used. . [0004] However, since the memory test program itself occupies part of the memory, even if the test is performed before the memory is used, this test method cannot realize the full covera...

Claims

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Application Information

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IPC IPC(8): G11C29/18G11C29/56
CPCG11C29/18G11C29/56G06F11/22
Inventor 瞿振林张文喜
Owner CHANGXIN MEMORY TECH INC
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