Realization method of nonlinear ultrasonic test instrument analog amplifying circuit and realization device thereof

A technology for simulating amplifying circuits and nonlinear ultrasound, applied to power amplifiers, using sound waves/ultrasonic waves/infrasonic waves to analyze solids, electrical components, etc.

Active Publication Date: 2013-03-13
EDDYSUN (XIAMEN) ELECTRONICS CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

But up to now, in view of the status quo of electronic technology, it is difficult to solve such a wide (for example, from 100k to 50MHz) analog s

Method used

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  • Realization method of nonlinear ultrasonic test instrument analog amplifying circuit and realization device thereof
  • Realization method of nonlinear ultrasonic test instrument analog amplifying circuit and realization device thereof
  • Realization method of nonlinear ultrasonic test instrument analog amplifying circuit and realization device thereof

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Embodiment Construction

[0023] figure 1 , figure 2 In the first embodiment shown, the implementation method and device of the analog amplifier circuit of the nonlinear ultrasonic detector, the device includes an arbitrary waveform generator (①), a variable power amplifier (②), a broadband ultrasonic sensor (③), Two sets of multi-channel switches (④), two band-pass filter amplifiers (⑤), A / D converter and FPGA signal integration processing unit (⑥), micro-processing system (⑦), display (⑧); the band-pass The filter amplifier (⑤) contains a high-frequency compensation circuit; the multi-channel switch (④) is placed at the front and rear ends of two band-pass filter amplifiers (BW), and the number of channel switches in each group of multi-channel switches (④) is related to the band-pass The number of pass filter amplifiers (⑤) is the same, and each band-pass filter amplifier (⑤) has a channel switch at the front and rear ends; the implementation method is as follows:

[0024] a. The micro-processin...

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Abstract

The invention discloses a realization method of a nonlinear ultrasonic test instrument analog amplifying circuit and a realization device of the nonlinear ultrasonic test instrument analog amplifying circuit. The device comprises an arbitrary waveform generator, a variable power amplifier, a broadband ultrasonic sensor, two sets of multi-channel switches, at least two band-pass filter amplifiers, at least one A/D (analog to digital) convertor, an FPGA (field programmable gata array) signal integration processing unit, a microprocessing system and a displayer. The adopted method comprises the following steps of: stimulating and receiving samples at different frequency ranges repeatedly or for once, carrying out hardware compensation, and carrying out integration processing in a concentrated way. The disadvantages of the existing instrument can be overcome, the required ultra-broadband amplifying power of the ultrasonic instrument can be obtained, and each hardware requirement of a nonlinear ultrasonic nondestructive testing technology can be met.

Description

technical field [0001] The invention relates to a method and a device for realizing a non-destructive testing technology, in particular to a method and a device for realizing an analog amplifier circuit of a nonlinear ultrasonic detector. Background technique [0002] Conventional pulse emission-reception ultrasonic detectors are widely used, and the frequency is usually between 1MHz and 15MHz. For some occasions with high requirements, this frequency range cannot meet the detection requirements. For example, non-linear ultrasonic non-destructive testing technology, which can find material damage and defects that cannot be detected by linear ultrasonic, such as fatigue, stress concentration, weak bonding, etc. It is required to have a wide-band receiving amplification capability to obtain information such as high-order harmonics. But up to now, in view of the status quo of electronic technology, it is difficult to solve such a wide (for example, from 100k to 50MHz) analog s...

Claims

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Application Information

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IPC IPC(8): H03H7/01H03F3/20G01N29/04
Inventor 林俊明孙金立袁英民杨宏程吴晓瑜赵晋成
Owner EDDYSUN (XIAMEN) ELECTRONICS CO LTD
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