Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Roundness error evaluation method based on variable-metric chaotic simulated annealing algorithm

A simulated annealing algorithm, roundness error technology, applied in computing, special data processing applications, instruments, etc., can solve problems such as low computing efficiency

Active Publication Date: 2013-03-20
HUAQIAO UNIVERSITY
View PDF2 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0020] The purpose of the present invention is to provide a roundness error evaluation method based on variable-scale chaotic simulated annealing algorithm, which overcomes the shortcomings of traditional algorithms that tend to converge to local minimum points and low operational efficiency, and has strong robustness

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Roundness error evaluation method based on variable-metric chaotic simulated annealing algorithm
  • Roundness error evaluation method based on variable-metric chaotic simulated annealing algorithm
  • Roundness error evaluation method based on variable-metric chaotic simulated annealing algorithm

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The present invention adopts the minimum area circle method to evaluate the roundness error, the reason has the following two points: (1) The minimum area circle method is an international general roundness error evaluation method, and it is also the only method approved by our country; (2) Compared with Compared with the other three commonly used roundness error evaluation methods, the minimum area circle method can achieve the highest error measurement accuracy and the global characteristics of the measurement. The minimum area circle method is actually to find the minimum value of the radius of two concentric circles. The process of evaluating the roundness error is the process of comparing the ideal circle with the actual shape of the measured workpiece section. The research object of the minimum area circle method is the maximum and minimum area of ​​the actual workpiece containing the workpiece. The traditional algorithm is not sensitive to small changes in the c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a roundness error evaluation method based on a variable-metric chaotic simulated annealing algorithm. The roundness error evaluation method comprises the following steps of: taking the simulated annealing algorithm as optimizing coarse searching first, and then taking the high efficiency of a chaos optimization algorithm as optimizing fine searching to ensure that the optimizing process is concise and efficient. Because the optimizing result of the simulated annealing algorithm is independent of an initial value, an actual globally optimal area is searched by adopting the simulated annealing algorithm, and the chaos optimization algorithm is excellent in execution efficiency and is suitable for carrying out fine searching in the globally optimal area, thereby searching a globally optimal solution, and therefore fewer iterations are obtained in the optimization process; and meanwhile, the chaotic mapping xtin=cos (1 / xtin2) provided by the invention can better realize chaotic optimizing, the [a1, i+1, b1, i+1] and [a2, i+1, b2, i+1] are ceaselessly decreased according to the solution space variation in the execution process, and therefore the optimizing process ceaselessly approaches to the globally optimal solution.

Description

technical field [0001] The invention relates to a roundness error evaluation method based on variable-scale chaotic simulated annealing algorithm. Background technique [0002] The roundness error is an important indicator to measure whether the processed part is an ideal circle. The process of evaluating the roundness error is the process of comparing the ideal circle with the actual shape of the measured workpiece section. The parameters for measuring workpieces include roundness, diameter, runout, coaxiality, etc. The shape and position parameters, eccentricity error, workpiece rotation error and roundness error during measurement will make the measurement results and the measurement room test results quite different. Among them, the roundness error has the greatest influence, so the measurement and evaluation of the roundness error determines the rotation accuracy, machining accuracy and assembly accuracy of the machined parts. [0003] The commonly used methods to ca...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
Inventor 傅文渊凌朝东李国刚莫冰黄瑞敏
Owner HUAQIAO UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com