Testing method and device for non-periodically triggering parallel capacitors by thyristor
A non-periodic triggering and capacitance test technology, applied in the field of power electronics, can solve the problems that a single thyristor cannot withstand aperiodic triggering voltage and current assessment, damage the test device, hidden dangers, etc., so as to improve long-term operation reliability and low device cost. , the effect of small equipment capacity
Active Publication Date: 2013-04-17
GLOBAL ENERGY INTERCONNECTION RES INST CO LTD +3
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However, the test object of this method is a complete single valve, and the ability of a single thyristor to withstand non-periodic trigger voltage and current cannot be directly assessed. If a thyristor fails or burns out during the test, the entire tested valve and the test device may be damaged. , bring greater economic losses and even cause safety hazards
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[0026] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0027] Such as Figure 1-Figure 3 , providing a thyristor non-periodically triggered shunt capacitor test method, said method comprising the following steps:
[0028] Step 1: Heat the test thyristor to the equivalent junction temperature under the operating condition of the converter valve;
[0029] Step 2: To test capacitor C G and stray capacitor C st Carry out charging, and charge to the test voltage constant current source G to automatically lock;
[0030] Step 3: Trigger the test thyristor to make the test capacitor C G and stray capacitor C st Release the energy and complete the one-time turn-on stress test of the thyristor of the test product;
[0031] Step 4: Repeat steps 2 and 3 for the next opening stress test until the end of the test.
[0032] In the step 1, the switch Kr is closed, the DC voltage source E is controlled, and the thyristor o...
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The invention provides a testing method and a testing device for non-periodically triggering parallel capacitors by thyristor, which is simple and easy to realize, the required equipment capacity is small, and the device cost is low. The non-periodically triggering test for a single thyristor is directly carried out by the method, the capability of each thyristor inside for enduring non-periodically triggering voltage and current can be checked before the converter valve is assembled, and therefore the producing and manufacturing safety and economical property of the converter valve are improved. Moreover, the influence of the dispersity of a cascaded valve structure on the non-periodically triggering stress of the thyristor can be fully checked by the method by improving testing parameters, so that the long-term operating reliability of the converter valve can be improved.
Description
technical field [0001] The invention belongs to the technical field of power electronics, and in particular relates to a thyristor aperiodically triggered parallel capacitance test method and device. Background technique [0002] The non-periodic trigger test is an important test content in the insulation test of the thyristor converter valve. The purpose of this test is to verify that the thyristor and its auxiliary circuit have sufficient current and voltage withstand capability. According to the IEC60700 standard, the non-periodic trigger test includes the arrester method and the parallel capacitor method. In the parallel capacitor method, capacitors are connected in parallel at both ends of the valve. And a resistor to replace the lightning arrester and commutation inductance, to ensure that the current stress in the initial stage of thyristor opening is similar to the opening stress of the converter valve under non-periodical triggering conditions. The parallel capaci...
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Inventor 王高勇曹均正刘杰雷小舟
Owner GLOBAL ENERGY INTERCONNECTION RES INST CO LTD