Testing method and device for non-periodically triggering parallel capacitors by thyristor
A non-periodic triggering and capacitance test technology, applied in the field of power electronics, can solve the problems that a single thyristor cannot withstand the non-periodic triggering voltage and current assessment, damage the test device, economic loss, etc., to improve long-term operation reliability and low device cost , the effect of small equipment capacity
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[0026] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0027] Such as Figure 1-Figure 3 , providing a thyristor non-periodically triggered shunt capacitor test method, said method comprising the following steps:
[0028] Step 1: Heat the test thyristor to the equivalent junction temperature under the operating condition of the converter valve;
[0029] Step 2: To test capacitor C G and stray capacitor C st Carry out charging, and charge to the test voltage constant current source G to automatically lock;
[0030] Step 3: Trigger the test thyristor to make the test capacitor C G and stray capacitor C st Release the energy and complete the one-time turn-on stress test of the thyristor of the test product;
[0031] Step 4: Repeat steps 2 and 3 for the next opening stress test until the end of the test.
[0032] In the step 1, the switch Kr is closed, the DC voltage source E is controlled, and the thyristor o...
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