A Method for Panorama Display and Defect Location of Pipeline Inner Wall
A positioning method, panorama technology, used in measurement devices, material analysis by optical means, instruments, etc.
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[0052] The present invention is described in detail below in conjunction with accompanying drawing.
[0053] refer to figure 1 , a pipeline inner wall panorama display and defect location method, comprising the following steps:
[0054] Step 1: Translate and register the overlapping images of the inner wall obtained from the self-focusing lens array in various directions;
[0055] Image translation amount (x 0 ,y 0 ) is obtained as follows:
[0056] A. Read in two grayscale images I 1 and I 2 .
[0057] B. Image I respectively 1 and I 2 Do the Fourier transform, that is,
[0058] A=fft(I 1 ) B=fft(I2 )
[0059] C. Find the cross-power spectrum of the two images:
[0060] C=A.*conj(B) / norm(A.*conj(B))
[0061] Perform a two-dimensional Fourier inverse transform on the above formula, and find the peak value to get the translation amount (x 0 ,y 0 ).
[0062] diagram 2-1 is to estimate the translation parameter by the phase correlation method, Figure 2-2 By ...
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Abstract
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