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Method and device of non-uniformed correction for short wave infrared detector

A non-uniform correction and short-wave infrared technology, which is applied in the field of image processing, can solve problems such as the non-uniformity of short-wave infrared detectors, and achieve the effect of improving non-uniform correction, good effect, and easy implementation

Inactive Publication Date: 2013-04-24
LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
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Problems solved by technology

[0003] The object of the present invention is to provide a short-wave infrared detector non-uniform correction method and device to solve the problem of short-wave infrared detector non-uniformity

Method used

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  • Method and device of non-uniformed correction for short wave infrared detector
  • Method and device of non-uniformed correction for short wave infrared detector
  • Method and device of non-uniformed correction for short wave infrared detector

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Embodiment Construction

[0026] The specific implementation manners of the present invention will be further described below in conjunction with the accompanying drawings.

[0027] Embodiment of a Shortwave Infrared Detector Nonuniform Correction Method of the Present Invention

[0028] A kind of short-wave infrared detector non-uniform correction method of the present invention, the steps of this method are as follows image 3 As shown, the specific process is as follows:

[0029] 1. Provide a non-uniform correction standard radiation source input for the SWIR detector, for example, use an integrating sphere as the radiation source of the SWIR detector.

[0030] 2. Use the short-wave infrared optical lens to gather the standard surface element radiation output by the integrating sphere to the focal plane of the short-wave infrared detector, and control the radiation flux converging to the focal plane of the short-wave infrared detector by changing the size of the diaphragm in the short-wave infrared...

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Abstract

The invention relates to a method and a device of non-uniformed correction for a short wave infrared detector, and belongs to the field of the technical field of image processing. The method of non-uniformed correction for the short wave infrared detector make the non-uniformed correction standard radiation as a source of radiation of the short wave infrared detector, and control the radiation flux received by the short wave infrared detector by adopting a diaphragm, provide standard input for the non-uniformed correction, calculate and correct the non-uniformed correction coefficient through a stream-lined module mode. Thus non-uniformed correction effect of the short wave infrared detector is improved. The device for non-uniformed correction of short wave infrared detector is simple in structure, easy to realize and good in effect.

Description

technical field [0001] The invention relates to a non-uniform correction method and device for a short-wave infrared detector, belonging to the technical field of image processing. Background technique [0002] In recent years, infrared imaging systems have been widely used in many fields such as infrared forward vision and infrared search and tracking. Short-wave infrared refers to the infrared band of 1.0-2.5 μm. Different from medium-wave and long-wave infrared imaging, short-wave infrared imaging mainly uses the characteristics of short-wave infrared radiation in the reflection environment of room temperature scenery to realize detection. Green plants are more reflective of short-wave infrared than visible light. Some minerals have strong absorption peaks in the short-wave infrared band. Due to its characteristics, short-wave infrared plays an important role in the detection of vegetation, rocks, and clouds. Short-wave infrared detection also has unique advantages in ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00
Inventor 赵凯生汪江华潘晓东
Owner LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
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