Integration metrological verification device formed by multi-class standard instrument

A technology for measurement verification and standard instruments, applied in the direction of instruments, etc., can solve the problems of poor matching of communication interfaces and achieve the effect of improving the compatibility of communication interfaces

Inactive Publication Date: 2015-07-15
中国人民解放军91663部队
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the shortcomings of the poor matching of the communication interface of the metrological verification device of the existing automatic test system, the present invention provides an integrated metrological verification device composed of multiple types of standard instruments

Method used

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  • Integration metrological verification device formed by multi-class standard instrument
  • Integration metrological verification device formed by multi-class standard instrument

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Embodiment Construction

[0013] refer to figure 1 . The integrated measurement verification device composed of multiple types of standard instruments includes a control computer, an adapter, a signal generator, a digital multimeter, a digital oscilloscope and a multi-way switch control module. The adapter is a multi-protocol interface adapter, the control computer is configured with a USB communication interface, and the control computer is electrically connected to the multi-protocol interface adapter through a USB interface cable; the multi-protocol interface adapter is connected to the signal via a LAN interface cable or a USB interface cable. The generator, digital multimeter or digital oscilloscope are electrically connected, and at the same time, the multi-protocol interface adapter is electrically connected to the multi-way switch control module through the RS232 interface cable; the multi-way switch control module is respectively connected to the signal output terminal of the signal generator...

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Abstract

The invention discloses an integration metrological verification device formed by a multi-class standard instrument. The integration metrological verification device formed by the multi-class standard instrument is used for solving the technical problem that a metrological verification device of an existing automatic test system is poor in matching performance of a communication interface. The technical scheme includes that a control computer is provided with a universal serial bus (USB) communication interface and electrically connected with a multi-protocol interface adapter through a USB interface cable, the multi-protocol interface adapter is electrically connected with a signal generator, a digital multimeter and a digital oscilloscope or a multi-way switch control module through a local area network (LAN) interface cable, a USB interface cable or an RS232 interface cable, and the multi-way switch control module is respectively and electrically connected with a signal output end of the signal generator, a measurement input end of the digital multimeter, a measurement input end of the digital oscilloscope and a serial equipment signal interface which is metrologically measured. Due to the fact that the multi-protocol interface adapter is arranged, the control computer automatically achieves signal switching connection between the multi-class standard instrument and the serial equipment signal interface through the multi-way switch control module. The matching performance of the metrological verification device signal interface of the automatic test system is improved.

Description

technical field [0001] The invention relates to an integrated metrological verification device, in particular to an integrated metrological verification device composed of multiple types of standard instruments. Background technique [0002] When performing metrological verification on some high-performance series equipment with the same signal type, it is often necessary to form an integrated metrological verification device composed of many types of high-performance standard instruments from different manufacturers, and its performance indicators are generally better than the metrological detection device composed of VXI and PCI buses. . Although the signal types of these series of devices are basically the same, there are differences in the interface signal definitions of different devices, which brings difficulties to the interface interconnection and signal matching between the metrology verification device and the series of devices. [0003] refer to figure 2 , the d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D18/00
Inventor 王卫华何勇陈文须于一谢海营
Owner 中国人民解放军91663部队
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