Polarized light scattering measurement system and method based on magneto-optic modulation

A scattering measurement and magneto-optical modulation technology, applied in the field of measurement, can solve the problem of demanding measurement conditions and achieve the effects of wide applicability, high measurement accuracy, and high signal-to-noise improvement ratio

Inactive Publication Date: 2015-05-20
UNIV OF SHANGHAI FOR SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present invention aims at the problem that the current real-time measurement of light scattering requires high measurement conditions, and proposes a polarized light scattering measurement system and method based on magneto-optical modulation. The optical signal is measured through magneto-optical modulation, and then frequency-selective filtering is amplified to achieve Reduce, suppress or even eliminate noise, to suppress noise to the greatest extent, improve measurement accuracy, and adapt the system to use in various environments

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  • Polarized light scattering measurement system and method based on magneto-optic modulation
  • Polarized light scattering measurement system and method based on magneto-optic modulation
  • Polarized light scattering measurement system and method based on magneto-optic modulation

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Embodiment Construction

[0021] Such as figure 1 As shown, it includes the incident light path, the output modulation light path and the receiving demodulation part. The incident light path includes a laser 1, a polarizer 2, a focusing lens 3, and a sample matching cell 4 in turn; the output modulation light path includes a beam expander collimator lens in turn. 5. Faraday coil 7, analyzer 8, beam expander lens 9, aperture stop 10; the receiving demodulation part includes photomultiplier tube 11, lock-in amplifier 12, sampling integrator 13 and computer 14 in sequence. The laser 1 provides coherent light; the polarizer 2 converts the incident laser light into linearly polarized light; the focusing lens 3 focuses the polarized light to a point in the solution in the sample matching cell 4, and the beam expander collimating lens 5 reduces the divergence angle of scattered light And expand the diameter of the outgoing light beam; The frequency-adjustable AC power supply module 6 selects a specific freque...

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Abstract

The invention relates to a polarized light scattering measurement system and method based on magneto-optic modulation. Coherent light sent out by a laser is changed to linear polarized light through a polarizer, and the linear polarized light is focused into a sample matching tank through a focusing lens. Scattered light coming out from the sample matching tank passes through an expanded beam collimating lens to reduce a divergence angle of the scattered light and collimate the diameter of an outgoing beam, and then the scattered light passes through a Faraday coil, a polarization analyzer and an expanded beam lens in sequence to obtain linear polarized light with periodic changes which can be received by a photomultiplier tube after passing through an aperture diaphragm capable of limiting a photosensitive area, signals are sent into a phase-locked amplifier by the photomultiplier tube to filter and remove external noise and white noise inside equipment, and then sent into a sampling integrator and a computer for sampling integration and digital average to obtain the particle size distribution. Compared with the prior art, the polarized light scattering measurement system and method based on the magneto-optic modulation can be used for low-intensity laser measurement without interference or damage to a sample, can be used for quickly and accurately measuring the nanoparticle size, suppressing the noise to the maximum extent and improving the measurement accuracy to enable the system to be suitable to be used in various environments.

Description

Technical field [0001] The present invention involves a measurement technology, which specializes in a polarized light scattering measurement system and method based on magnetic light -based modulation. Background technique [0002] Optical scattering technology is an important means to detect the nature of the grade. The main application is to quickly determine the translation and diffusion coefficient of large molecules or particles in the solution, so as to determine the size or solubility of the particles.The law is fast and reliable, and has the advantages of the original state of non -interference and no destruction system.And the measurement range is wide (70 nanometer-2 microns), which can obtain accurate particle size distribution.In recent years, nano -granularity measurement in the fields of pharmaceuticals, aerospace, environment, and chemical industry involves this technology, and has become an important means of characterization of ultra -fine particles in the dilut...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N15/02G01N21/21G01N21/47
Inventor 贾宏志蔡清东方良刘佰滢曹江辉
Owner UNIV OF SHANGHAI FOR SCI & TECH
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