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Testing logic generation method and testing logic generation device

A technology for testing logic and testing software, applied in the field of measurement and control, can solve the problems of low applicability of automatic test platforms and high professional requirements of users, and achieve the effect of low professional level requirements and strong applicability

Active Publication Date: 2013-06-19
BEIJING RUNKE GENERAL TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the present invention provides a method and device for generating test logic to overcome the problems in the prior art due to the use of scripts and the replacement of different interface programs to perform tests on electronic products with different functions. As a result, the problems of high professional requirements for users and low applicability of automatic test platforms

Method used

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  • Testing logic generation method and testing logic generation device
  • Testing logic generation method and testing logic generation device
  • Testing logic generation method and testing logic generation device

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Embodiment 1

[0049] figure 1 It is a flow chart of the test logic generation method disclosed in the embodiment of the present invention, figure 2 For the structural flow diagram of the test software disclosed by the embodiment of the present invention, see figure 1 and figure 2 As shown, the method may include:

[0050] Step 101: Obtain the structure of the configuration file;

[0051] The structure of the configuration file can include two parts, one is the relevant parameter settings of the execution unit, which indicates how to execute the action; the other is the logic control setting of the execution unit, which indicates the direction of the action such as jump, condition and whether to block. content. Since each configuration file has a specific format, which must be able to be parsed by the test software, the structure of the configuration file needs to be determined in advance.

[0052]In the embodiment of the present invention, the configuration file may be one of an exte...

Embodiment 2

[0086] Figure 5 For a flow chart of another method for generating test logic disclosed in an embodiment of the present invention, see Figure 5 As shown, the method can pre-acquire the structure of the configuration file, and can include steps:

[0087] Step 501: Generate an analysis engine and an execution engine according to the structure of the configuration file, and separate the logic control part and the function module part in the test software.

[0088] In the embodiment of the present invention, the configuration file may be one of an extensible markup language file, an initialization file, and a binary file, or may be other configuration languages ​​in the prior art.

[0089] The separation of the logic control part and the functional module part in the test software may specifically include: dividing the test software into an application program, a logic management module, a module set and a basic library; Interface, and control the start and stop of test actions...

Embodiment 3

[0098] Image 6 For the structural block diagram of the test logic generation device disclosed in the embodiment of the present invention, see Image 6 As shown, the test logic generation device 60 may include:

[0099] The structure acquisition module 601 is configured to acquire the structure of the configuration file in advance.

[0100] The software division module 602 is configured to generate an analysis engine and an execution engine according to the structure of the configuration file, and separate the logic control part and the function module part in the test software.

[0101] The device will obtain the structure of the configuration file in advance, and the structure of the configuration file can include two parts, one is the relevant parameter setting of the execution unit, which indicates how to execute the action; the other is the logic control setting of the execution unit, which indicates the jump Relevant content of action direction such as transfer, condit...

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Abstract

The invention discloses a testing logic generation method. According to the testing logic generation method, a parsing engine and an execution engine are designed based on configure languages, logic control content and module configuration content are separated, modules executing specific motions in testing software and the entire testing logic are uniformly described by adopting the configure languages, and therefore a user can define motions and a motion sequence needed to be completed by target logic through an interface provided by an application program and according to the described and separated modules having specific testing functions in the testing software. When used for testing electronic products with different functions, the testing logic generation method enables the user to freely define test functions and a testing sequence conveniently, and the user does not need to specifically write a program with certain functions. Meanwhile, the invention further discloses a testing logic generation device. By means of the testing logic generation device, the user does not need to specifically write the testing program when facing the electric productions with different functions, and the testing logic generation device has low requirements for professional level of the user, and is strong in applicability.

Description

technical field [0001] The present invention relates to the technical field of measurement and control, and more specifically, relates to a method and device for generating test logic. Background technique [0002] With the improvement of people's living standards, various electronic products have also entered the daily life of more and more users. Faced with the increasingly high requirements of users, the reliability of electronic products has become a focus of attention of people in the industry. The automatic test technology is an effective technical means to detect the reliability of electronic products. [0003] The test logic of the automatic test depends on the functional characteristics of the electronic product under test. For example, if a mobile phone has a Bluetooth communication function, then the test logic of its automatic test must include the relevant program for testing the Bluetooth communication function and the execution conditions of the program; and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/25G06F11/36
CPCH04M3/30H04M2201/18
Inventor 杨冬苏淼
Owner BEIJING RUNKE GENERAL TECH
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