Patent hotspot discovery and trend analysis method
A technology of trend analysis and patent hotspots, which is applied in the fields of instruments, computing, and electrical digital data processing, etc., and can solve the problems of less quantitative analysis, high cost, and labor consumption
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[0090] The technical solutions of the present invention will be further specifically described below through the embodiments and in conjunction with the accompanying drawings.
[0091] A patent hotspot discovery and trend analysis method based on the present invention can dig out research topics and technologies that are focused on under each topic from a collection of patent documents, and can make effective predictions on the development trend of each technology . It is based on the definition: a collection of patent documents D={d 1 , d 2 ,...,d n}, the corresponding patent publication time set T={T 1 , T 2 ,...,T n}. Among them, 1≤i≤n, d i Indicates the document content of patent i; T i Indicates the application time of patent i.
[0092]The present invention intends to dig out what are the main research objects and what are the hot research technologies in the patent document collection by means of clustering. Firstly, it is necessary to perform similarity calcu...
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