Patent hotspot discovery and trend analysis method

A technology of trend analysis and patent hotspots, which is applied in the fields of instruments, computing, and electrical digital data processing, etc., and can solve the problems of less quantitative analysis, high cost, and labor consumption

Active Publication Date: 2013-06-19
WUHAN UNIV
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Problems solved by technology

[0008] (1) Qualitative analysis is mainly, quantitative analysis is less;
[0009] (2) Lack of consideration for the development and innovation of technology itself;
[0010] (3) The process is time-consuming, labor-intensive and expensive
[0011] Currently

Method used

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  • Patent hotspot discovery and trend analysis method
  • Patent hotspot discovery and trend analysis method

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Embodiment Construction

[0090] The technical solutions of the present invention will be further specifically described below through the embodiments and in conjunction with the accompanying drawings.

[0091] A patent hotspot discovery and trend analysis method based on the present invention can dig out research topics and technologies that are focused on under each topic from a collection of patent documents, and can make effective predictions on the development trend of each technology . It is based on the definition: a collection of patent documents D={d 1 , d 2 ,...,d n}, the corresponding patent publication time set T={T 1 , T 2 ,...,T n}. Among them, 1≤i≤n, d i Indicates the document content of patent i; T i Indicates the application time of patent i.

[0092]The present invention intends to dig out what are the main research objects and what are the hot research technologies in the patent document collection by means of clustering. Firstly, it is necessary to perform similarity calcu...

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Abstract

The invention discloses a patent hotspot discovery and trend analysis method. During the discovery process of patent hotspots, firstly, word classification is carried out, similarity among patent documents is calculated, and the patent documents are classified according to the similarity; then phrases of each cluster are combined so that results are more concise and visual; then hotspot techniques are discovered through the hotspot calculation method, and the hotpot degree of each hotspot technique is analyzed; and lastly, curve fitting is carried out according to historical data, a current technical life cycle of one technique is judged by means of a logistic regression curve, and development conditions and potential research value of the technique are further analyzed. Meanwhile, effective trend analysis is carried out on the hotspot techniques, and a development trend of each technique is presented. According to the patent hotspot discovery and trend analysis method, effective information can be discovered from a large amount of precious patent data, and wide practicality and high market value are achieved.

Description

technical field [0001] The invention relates to a method for discovering and trend analyzing patent hotspots, in particular to a method for discovering hotspot technologies from patent collections and performing trend analysis on the hotspot technologies. Background technique [0002] Patent documents involve the latest and most active innovative technical information in all technical fields. Reports on patent documents are 1-3 years earlier than other documents, and there is a "time lag" between the birth of a new technology and its popularization and application, ranging from a few months to decades. Therefore, we can understand the latest developments in scientific and technological development from patent documents. [0003] Studies have shown that using patent documents to guide technological innovation can effectively save 40% of research funds and 60% of research time. A study by the European Patent Office shows that in more than a dozen European Patent Treaty membe...

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Application Information

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IPC IPC(8): G06F17/30
Inventor 彭智勇陈旭万鹏
Owner WUHAN UNIV
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