A patent hotspot discovery and trend analysis method
A trend analysis and patent hotspot technology, applied in instruments, computing, electrical and digital data processing, etc., can solve problems such as high cost, lack of consideration for technological development and innovation, and labor consumption
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[0090] The technical solutions of the present invention will be further specifically described below through the embodiments and in conjunction with the accompanying drawings.
[0091] A patent hotspot discovery and trend analysis method based on the present invention can dig out research topics and technologies that are focused on under each topic from a collection of patent documents, and can make effective predictions on the development trend of each technology . It is based on the definition: a collection of patent documents D = {d 1 , d 2 ,...,d n}, the corresponding patent publication time set T={T 1 , T 2 ,...,T n}. Among them, 1≤i≤n, d i Indicates the document content of patent i; T i Indicates the application time of patent i.
[0092] The present invention intends to dig out what are the main research objects and what are the hot research technologies in the patent document collection by means of clustering. Firstly, it is necessary to perform similarity calc...
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