Test sorting machine

Abstract

The invention discloses a test sorting machine. In the test sorting machine, a matching plate of a pushing unit is provided with a position correction pin which has a position correction function. The position correction pin can move test trays which deviate from correct positions, so that the test trays get back to the correct positions, thereby improving reliability of the test sorting machine.

Description

technical field [0001] The present invention relates to a test handler that supports testing of produced semiconductor devices performed before the semiconductor devices are shipped. Background technique [0002] The test sorter is a device that supports testing such that the tester can test semiconductor devices manufactured through a predetermined manufacturing process and classify the semiconductor devices according to test results before loading the semiconductor devices into object trays. [0003] figure 1 is a conceptual view looking down from above of a universal test handler 100 including a test handler according to the present invention. refer to figure 1 , the test sorter 100 includes a test tray 110 , a loading unit 120 , a soaking chamber 130 , a testing chamber 140 , a pushing device 150 , a de-soaking chamber 160 and an unloading unit 170 . [0004] refer to figure 2 , in the test tray 110 , a plurality of inserts 111 on which the semiconductor D can be mo...

AI Technical Summary

Problems solved by technology

[0026] If the test tray 110 is fed to a position deviated from the allowable error in this way, the insert 111 is damaged, and the pusher 51a, the guide pin 51c, and the test slot provided in the tester are damaged during the operation of the pusher 150. Socket pins (the pins used to guide the mating between the insert and the test socket) can cause defects

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