Test sorting machine

A technology for testing sorting machines and testers, which can be used in electronic circuit testing, integrated circuit testing, single semiconductor device testing, etc., and can solve problems such as damage to inserts

Active Publication Date: 2013-07-03
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0026] If the test tray 110 is fed to a position deviated from the allowable error in this way, the insert 111 is damaged, and the pusher 51a, the guide pin 51c, and the test sl...

Method used

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Examples

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Embodiment Construction

[0046] Hereinafter, exemplary embodiments of the present invention will be described with reference to the accompanying drawings, in which repeated descriptions will be omitted or compressed if possible for the purpose of clarity.

[0047] refer to Figure 5 , the test sorter 500 includes a test tray 510 , a loading unit 520 , a soaking chamber 530 , a testing chamber 540 , a pushing device 550 , a de-soaking chamber 560 , an unloading unit 570 , a first detector 580 and a second detector 590 .

[0048] Among the constituent elements, the loading unit 520 , the soaking chamber 530 , the testing chamber 540 , the desoaking chamber 560 , and the unloading unit 570 have been described in the Background Art section, and their descriptions will be omitted.

[0049] refer to Figure 6 , the test tray 510 includes a plurality of inserts 511 and a frame 512 .

[0050] The semiconductor device may be located on a plurality of interposers, and the guide holes 511a are formed in the in...

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PUM

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Abstract

The invention discloses a test sorting machine. In the test sorting machine, a matching plate of a pushing unit is provided with a position correction pin which has a position correction function. The position correction pin can move test trays which deviate from correct positions, so that the test trays get back to the correct positions, thereby improving reliability of the test sorting machine.

Description

technical field [0001] The present invention relates to a test handler that supports testing of produced semiconductor devices performed before the semiconductor devices are shipped. Background technique [0002] The test sorter is a device that supports testing such that the tester can test semiconductor devices manufactured through a predetermined manufacturing process and classify the semiconductor devices according to test results before loading the semiconductor devices into object trays. [0003] figure 1 is a conceptual view looking down from above of a universal test handler 100 including a test handler according to the present invention. refer to figure 1 , the test sorter 100 includes a test tray 110 , a loading unit 120 , a soaking chamber 130 , a testing chamber 140 , a pushing device 150 , a de-soaking chamber 160 and an unloading unit 170 . [0004] refer to figure 2 , in the test tray 110 , a plurality of inserts 111 on which the semiconductor D can be mo...

Claims

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Application Information

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IPC IPC(8): G01R31/28B07C5/00B07C5/02G01R31/26
CPCG01R31/286
Inventor 吕东铉崔宪植
Owner TECHWING CO LTD
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