Trace model based abnormal degradation data inspection and analysis method
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- BEIHANG UNIV
- Publication Date
- 2013-09-11
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention proposes a trajectory model-based inspection and analysis method for abnormal degraded data, which belongs to the technical field of reliability for abnormality inspection of degraded data. Background technique
[0002] With the improvement of product reliability and service life, a large number of non-failure data appear, and the traditional reliability evaluation method based on failure data has been difficult to meet the requirements of engineering evaluation accuracy. In this regard, degradation data has been introduced into the field of reliability assessment and has been widely used, becoming an important technical approach to solve the reliability assessment problems of high reliability and long-life products.
[0003] However, factors such as test errors, differences in manufacturing status or testing status will cause changes in product performance degradation characteristics, resulting in abnormal points, abnormal segments or ab...