Trace model based abnormal degradation data inspection and analysis method
A technology of degradation data and analysis methods, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as inability to evaluate product reliability, randomness of product performance degradation data, and inability to reflect the law of product degradation
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[0082] The following will be combined with the accompanying drawings figure 1 The flow chart and examples further illustrate the present invention in detail.
[0083] In the evaluation study of the storage period of a coated flat glass, 4 samples were put into the degradation test under normal temperature storage conditions. figure 2 The relative increment of total resistance is given RVR(t)=[R(t)-R(0)]R(0). The change curve with the test time t, where R(t) is the observed value of the total resistance at time t. According to engineering experience, the variation law of RVR(t) can be described by a power function model, namely:
[0084] RVR=dt b (twenty three)
[0085] according to figure 2 , the total resistance value of all samples has a relatively large change in the period from 40h to 148h. Next, the method in this paper is used to test whether the observed data in this period is abnormal.
[0086] Let y=lnRVR, x=lnt, a=lnd, establish a linear statistical m...
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